Hybrid wafer scale microcircuit integration

Claim 2

A wafer scale integration multiple die integrated circuit structure comprising the combination of: a semiconductor wafer host member having top and bottom planar surfaces; a plurality of receptacle wells each having lateral and bottom surfaces received in selected top surface locations of said wafer; a plurality of integrated circuit die, each die including a planar top surface having a plurality of electrical connection bonding pads adjacent thereto, a bottom surface, and lateral surfaces joining said top and bottom surfaces, said die being uprightly received one in each of said wafer member receptacle wells with said die top surface and said wafer surface being disposed in substantial planar alignment by the die bottom surface to receptacle well bottom surface thickness of interstitial cured epoxy adhesive means; cured epoxy adhesive means, including a predetermined thermal coefficient of expansion selective particulate filler material uniformly dispersed therein, received in each of said receptacle wells intermediate each respective of said well and die bottom surfaces and said well and die lateral surfaces for physically connecting said die and wafer elements, said adhesive means also including an annularly disposed and planar surface aligned top surface portion bridging between the planar surfaces of said die and wafer.

Claim 3

The integrated circuit structure of claim 1 further including an organic dielectric material film layer received over said top surfaces of said wafer and die and adhesive means planar surface aligned top surface portion.

Claim 4

The integrated circuit structure of claim 1 wherein said adhesive means includes lithium beta eucryptite filler material.

Claim 5

The integrated circuit surface structure of claim 2 wherein respective of said circuit die are received in said receptacle wells in a varying spaced apart relationship with said receptacle well bottom surfaces and wherein the spaced apart interval between a die bottom surface and the adjacent receptacle well bottom surface is occupied by complementary dimensioned portions of said cured epoxy adhesive means.

Claim 6

The integrated circuit structure of claim 2 further including: a plurality of via apertures passing through said thin film dielectric material layer at locations coincident with said electrical connection bonding pads; an array of thin film metal conductors including both conductor portions extending through said via apertures to said die electrical bonding pads and individual conductor portions residing on said thin film dielectric layer in a predetermined pattern of electrical interconnection.

Claim 7

The integrated circuit structure of claim 5 wherein said cured epoxy adhesive means includes a thermal coefficient of expansion having the same algebraic sign as the thermal coefficients of expansion of silicon and aluminum.

Claim 8

The integrated circuit structure of claim 6 wherein said polymerized filled epoxy adhesive has a thermal coefficient of expansion that is numerically intermediate the thermal coefficients of expansion of silicon and aluminum.

Claim 9

The integrated circuit structure of claim 7 wherein said epoxy adhesive coefficient of expansion resides in the range of 2.3×10 -6 to 20×10 -6 per degree Celsius.

Claim 10

The integrated circuit structure of claim 8 wherein said thermal coefficient of expansion is substantially 2.5×10 -6 per degree Celsius.

Claim 11

The integrated circuit structure of claim 5 wherein said organic dielectric material layer is comprised of a photosensitive material.

Claim 12

The integrated circuit structure of claim 5 wherein said receptacle wells include sloping side surfaces with the slope of said side surfaces corresponding to the Miller index crystal orientation of said wafer member.

Claim 13

The integrated circuit structure of claim 5 wherein said thin film metal conductors are fabricated from aluminum.

Claim 14

The integrated circuit structure of claim 10 wherein said organic dielectric material is a polyimide material.

Claim 15

The integrated circuit structure of claim 13 wherein said organic dielectric material is a negative photoresist polyimide material.

Claim 16

The integrated circuit structure of claim 13 further including an adhesion promotion layer disposed intermediate said wafer member and said polyimide material.

Claim 17

The integrated circuit structure of claim 13 further including additional alternating layers of said polyimide dielectric and thin film metal conductor materials.

Claim 18

The integrated circuit structure of claim 3 wherein said adhesive means includes a polymerized high bond strength dielectric filled epoxy adhesive having a two hundred fifty degree curing temperature characteristic.

Claim 19

The integrated circuit structure of claim 17 wherein said semiconductor host wafer is comprises of silicon and integrated circuit die is comprised of one of the materials of silicon and gallium arsenide and includes a thermal oxide passivation layer.

Claim 20

An integrated circuit assembly comprising the combination of: a planar disposed semiconductor substrate member; means including a predetermined number of sloping sided receptacle wells, one for each assembly received circuit die, disposed over a planar surface of and extending into said substrate member for receiving said circuit die in said substrate member; integrated circuit die members of said predetermined number count and each having a top planar, bottom, and lateral surfaces received one in each said receptacle well; means including a mass of dielectric filled cured adhesive received in each said receptacle well in contact with both said receptacle well sloping sides and said die lateral and bottom surfaces, and disposed in coplanar connection between said die top surface and substrate member planar surface for retaining each said circuit die captive in a predetermined physical relationship with said receiving receptacle well and said substrate member and for contributing to the heat transfer between said die and said substrate member; means including an electrically insulating light sensitive polyimide precursored thin film organic coating intimately disposed over said die top surface, said die top surface to substrate member connecting adhesive coplanar surface, and said substrate planar surface of said assembly for isolating said die and substrate members from external influence; and, electrical interconnection means including an array of electrical interconnection conductors disposed over said thin film organic coating and including conductor portions extending through vias in said thin film organic coating to each of said circuit die members for conducting signals and operating energy in communication with each said die member.

Claim 21

An integrated circuit assembly comprising the combination of: a planar disposed semiconductor substrate member; means including a predetermined number of sloping sided receptacle wells, one for each assembly received circuit die, disposed over a planar surface of and extending into said substrate member for receiving said circuit die in said substrate member; integrated circuit die members of said predetermined number count and each having a top planar, bottom, and lateral surfaces received one in each said receptacle well; means including a mass of dielectric filled cured adhesive received in each said receptacle well in contact with both said receptacle well sloping sides and said die lateral and bottom surfaces, and disposed in coplanar connection between said die top surface and substrate member planar surface for retaining each said circuit die captive in a predetermined physical relationship with said receiving receptacle well and said substrate member and for contributing to the heat transfer between said die and said substrate member; means including an electrically insulating light sensitive polyimide precursored thin film organic coating intimately disposed over said die top surface, said die top surface to substrate member connecting adhesive coplanar surface, and said substrate planar surface of said assembly for isolating said die and substrate members from external influence; and, electrical interconnection means including an array of electrical interconnection conductors disposed over said thin film organic coating and including conductor portions extending through vias in said thin film organic coating to each of said circuit die members for conducting signals and operating energy in communication with each said die member.

Claim 22

The integrated circuit assembly of claim 19 wherein said cured adhesive material is comprised of a selected thermal coefficient of expansion dielectric material particle-filled epoxy resin.

Claim 23

The integrated circuit assembly of claim 20 wherein said dielectric material particles are comprised of lithium beta eucryptite.

Claim 24

A wafer scale integration multiple die integrated circuit structure comprising the combination of: a semiconductor wafer host member having top and bottom planar surfaces; a plurality of receptacle wells each having lateral and bottom surfaces received in selected top surface locations of said wafer; a plurality of integrated circuit die, each die including a planar top surface having a plurality of electrical connection bonding pads adjacent thereto, a bottom surface, and lateral surfaces joining said top and bottom surfaces, said die being uprightly received one in each of said wafer member receptacle wells with said die top surface and said wafer top surface being disposed in substantial planar alignment by the die bottom surface to receptacle well bottom surface thickness of interstitial cured epoxy adhesive means; and cured epoxy adhesive means, including a predetermined thermal coefficient of expansion selective particulate filler material uniformly dispersed therein, received in each of said receptacle wells intermediate each respective of said well and die bottom surface and said well and die lateral surfaces for physically connecting said die and wafer elements, said adhesive means also including an annularly disposed and planar surface aligned top surface portion bridging between the planar surfaces of said die and wafer; said receptacle wells each including canal means connecting said receptacle well bottom surface with the bottom surface of said wafer member for venting volatile products attending the curing of said epoxy adhesive means out of said receptacle wells, reservoiring excessive quantities of said epoxy adhesive means before and during said curing, and for assisting retention of said epoxy adhesive means and circuit die captive within said receptacle wells.

Claim 25

A wafer scale integration multiple die integrated circuit structure comprising the combination of: a semiconductor wafer host member having top and bottom planar surfaces; a plurality of receptacle wells each having lateral and bottom surfaces received in selected top surface locations of said wafer; a plurality of integrated circuit die, each die including a planar top surface having a plurality of electrical connection bonding pads adjacent thereto, a bottom surface, and lateral surfaces joining said top and bottom surfaces, said die being uprightly received one in each of said wafer member receptacle wells with said die top surface and said wafer top surface being disposed in substantial planar alignment by the die bottom surface to receptacle well bottom surface thickness of interstitial cured epoxy adhesive means; and cured epoxy adhesive means, including a predetermined thermal coefficient of expansion selective particulate filler material uniformly dispersed therein, received in each of said receptacle wells intermediate each respective of said well and die bottom surface and said well and die lateral surfaces for physically connecting said die and wafer elements, said adhesive means also including an annularly disposed and planar surface aligned top surface portion bridging between the planar surfaces of said die and wafer; said receptacle wells each including canal means connecting said receptacle well bottom surface with the bottom surface of said wafer member for venting volatile products attending the curing of said epoxy adhesive means out of said receptacle wells, reservoiring excessive quantities of said epoxy adhesive means before and during said curing, and for assisting retention of said epoxy adhesive means and circuit die captive within said receptacle wells.

Claim 26

A multiple die wafer scale integration electrical circuit structure comprising the combination of: a silicon dioxide covered silicon semiconductor wafer host member having substantially planar top and bottom surfaces; a plurality of sloping side surface anisotropic etched receptacle wells received in selected top surface locations of said oxide covered wafer, said wells each including a canal portion communicating between the receptacle well bottom and the wafer bottom surface; a plurality of prefabricated integrated circuit die members each having top, bottom and side body surface regions, and selectively including die of differing top to bottom thicknesses, received one in each of said wafer member receptacle wells with said die members and receptacle wells having space separated rectangular shapes in the wafer surface plane and with each of said die including a plurality of upward facing electrical bonding pads; a mass of polymerized dielectric filled epoxy adhesive, of thermal expansion properties substantially similar to said silicon semiconductor wafer, disposed surrounding the side and bottom body regions of each said die member in the space intermediate said die member body and said wafer member receptacle well side surfaces, said adhesive mass including solidified liquid bonds with said circuit die body surface regions and with said receptacle well surfaces, and including a planar surface portion filling said surface plane separation space and smoothly bridging between said die member surface and said wafer member surface to integrate said die members and wafer member into a unified wafer assembly; a conformal dielectric negative photoresist polyimide thin film coating of between five and thirty microns thickness received together with an adhesion promotion intermediate film layer over the surface of said wafer and integrated circuit die assembly; a plurality of etched sloping wall via apertures opening through said polyimide thin film coating to said integrated circuit die electrical bonding pads; and an array of metallic aluminum thin film conductors extending through said via apertures in connection with said electrical bonding pads and dispersed across the bridged separation space between said die member and wafer member and across the surface of said wafer member in predetermined electrical circuit interconnection; said conformal dielectric negative photoresist polyimide thin film coating and array of metallic aluminum conductors being disposed in a 2×N stacked and alternating layers over the surface of said wafer assembly where N is a number between one and ten.

Claim 27

A multiple die wafer scale integration electrical circuit structure comprising the combination of: a silicon dioxide covered silicon semiconductor wafer host member having substantially planar top and bottom surfaces; a plurality of sloping side surface anisotropic etched receptacle wells received in selected top surface locations of said oxide covered wafer, said wells each including a canal portion communicating between the receptacle well bottom and the wafer bottom surface; a plurality of prefabricated integrated circuit die members each having top, bottom and side body surface regions, and selectively including die of differing top to bottom thicknesses, received one in each of said wafer member receptacle wells with said die members and receptacle wells having space separated rectangular shapes in the wafer surface plane and with each of said die including a plurality of upward facing electrical bonding pads; a mass of polymerized dielectric filled epoxy adhesive, of thermal expansion properties substantially similar to said silicon semiconductor wafer, disposed surrounding the side and bottom body regions of each said die member in the space intermediate said die member body and said wafer member receptacle well side surfaces, said adhesive mass including solidified liquid bonds with said circuit die body surface regions and with said receptacle well surfaces, and including a planar surface portion filling said surface plane separation space and smoothly bridging between said die member surface and said wafer member surface to integrate said die members and wafer member into a unified wafer assembly; a conformal dielectric negative photoresist polyimide thin film coating of between five and thirty microns thickness received together with an adhesion promotion intermediate film layer over the surface of said wafer and integrated circuit die assembly; a plurality of etched sloping wall via apertures opening through said polyimide thin film coating to said integrated circuit die electrical bonding pads; and an array of metallic aluminum thin film conductors extending through said via apertures in connection with said electrical bonding pads and dispersed across the bridged separation space between said die member and wafer member and across the surface of said wafer member in predetermined electrical circuit interconnection; said conformal dielectric negative photoresist polyimide thin film coating and array of metallic aluminum conductors being disposed in a 2×N stacked and alternating layers over the surface of said wafer assembly where N is a number between one and ten.

Claim 28

An integrated circuit assembly comprising the combination of: a planar disposed semiconductor substrate member; means including a predetermined number of sloping sided receptacle wells, one for each assembly received circuit die, disposed over a planar surface of and extending into said substrate member for receiving said circuit die in said substrate member; integrated circuit die members of said predetermined number count and each having a top planar, bottom, and lateral surfaces received one in each said receptacle well; means including a mass of lithium beta eucryptite dielectric filled cured adhesive received in each said receptacle well in contact with both said receptacle well sloping sides and said die lateral and bottom surfaces, and disposed in coplanar connection between said die top surface and said substrate member planar surface for retaining each said circuit die captive in a predetermined physical relationship with said receiving receptacle well and said substrate member and for contributing to heat transfer between said die and said substrate member; means including an electrically insulating light sensitive polyimide precursored thin film organic coating intimately disposed over said die top surface, said die top surface to substrate member connecting adhesive coplanar surface and said substrate planar surface portions of said assembly for isolating said die and substrate members from external influence; and, electrical interconnection means including an array of electrical interconnection conductors disposed over said thin film organic coating and including conductor portions extending through vias in said thin film organic coating to each of said circuit die members for conducting signals and operating energy in communication with each said die member.

Claim 29

An integrated circuit assembly comprising the combination of: a planar disposed semiconductor substrate member; means including a predetermined number of sloping sided receptacle wells, one for each assembly received circuit die, disposed over a planar surface of and extending into said substrate member for receiving said circuit die in said substrate member; integrated circuit die members of said predetermined number count and each having a top planar, bottom, and lateral surfaces received one in each said receptacle well; means including a mass of lithium beta eucryptite dielectric filled cured adhesive received in each said receptacle well in contact with both said receptacle well sloping sides and said die lateral and bottom surfaces, and disposed in coplanar connection between said die top surface and said substrate member planar surface for retaining each said circuit die captive in a predetermined physical relationship with said receiving receptacle well and said substrate member and for contributing to heat transfer between said die and said substrate member; means including an electrically insulating light sensitive polyimide precursored thin film organic coating intimately disposed over said die top surface, said die top surface to substrate member connecting adhesive coplanar surface and said substrate planar surface portions of said assembly for isolating said die and substrate members from external influence; and, electrical interconnection means including an array of electrical interconnection conductors disposed over said thin film organic coating and including conductor portions extending through vias in said thin film organic coating to each of said circuit die members for conducting signals and operating energy in communication with each said die member.

Claim 30

The integrated circuit assembly of claim 24 wherein said lithium beta eucryptite comprises fifty percent by weight of said cured adhesive.

Claim 31

A wafer scale integration multiple die integrated circuit structure comprising the combination of: a semiconductor wafer host member having top and bottom planar surfaces; a plurality of receptacle wells each having lateral and bottom surfaces received in selected top surface location of said wafer; a plurality of integrated circuit die, each die including a planar top surface having a plurality of electrical connection bonding pads adjacent thereto, a bottom surface, and lateral surfaces joining said top and bottom surfaces, said die being uprightly received one in each of said wafer member receptacle wells with said die top surface and said wafer top surface being disposed in substantial planar alignment by the die bottom surface to receptacle well bottom surface thickness of said cured epoxy adhesive means; and cured epoxy adhesive means, including a predetermined thermal coefficient of expansion selective lithium beta eucryptite particulate filler material uniformly dispersed therein, received in each of said receptacle wells intermediate each respective of said well and die bottom surface and said well and die lateral surfaces for physically connecting said die and wafer elements, said adhesive means also including an annularly disposed and planar surface aligned top surface portion bridging between the planar surfaces of said die and wafer.

Claim 32

A wafer scale integration multiple die integrated circuit structure comprising the combination of: a semiconductor wafer host member having top and bottom planar surfaces; a plurality of receptacle wells each having lateral and bottom surfaces received in selected top surface location of said wafer; a plurality of integrated circuit die, each die including a planar top surface having a plurality of electrical connection bonding pads adjacent thereto, a bottom surface, and lateral surfaces joining said top and bottom surfaces, said die being uprightly received one in each of said wafer member receptacle wells with said die top surface and said wafer top surface being disposed in substantial planar alignment by the die bottom surface to receptacle well bottom surface thickness of said cured epoxy adhesive means; and cured epoxy adhesive means, including a predetermined thermal coefficient of expansion selective lithium beta eucryptite particulate filler material uniformly dispersed therein, received in each of said receptacle wells intermediate each respective of said well and die bottom surface and said well and die lateral surfaces for physically connecting said die and wafer elements, said adhesive means also including an annularly disposed and planar surface aligned top surface portion bridging between the planar surfaces of said die and wafer.