SRAM with local interconnect

Claim 2

A static random access memory cell at a semiconductor surface, comprising: first and second inverters, each said inverter comprising: a driver transistor having a first conductivity type semiconductor portion clad with titanium silicide; and a load element having a semiconductor portion doped with dopant of a second conductivity type; a first connection of a material comprising a substantial percentage of titanium nitride connecting the first conductivity type semiconductor portion of said driver transistor of said first inverter to the second conductivity type portion of said load element of said second inverter, wherein said material of said first connection is substantially a diffusion barrier to dopant of the first conductivity type semiconductor portion; and a second connection of a material comprising a substantial percentage of titanium nitride, connecting the first conductivity type portion of said driver transistor of said conductivity type portion of said driver transistor of said second inverter to the second conductivity type portion of said semiconductor load element of said first inverter, wherein said material of said second connection is substantially a diffusion barrier to dopant of the first conductivity type semiconductor portion.

Claim 3

A memory cell formed at a surface of a semiconductor body, comprising: a first pull-up transistor having a source and a drain of a first conductivity type, each formed in a doped portion of said surface clad with titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a first pull-down transistor having a source and a drain of a second conductivity type, each formed in a doped portion of said surface clad with titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a second pull-up transistor having a source and a drain of said first conductivity type, each formed in a portion of said surface clad with titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a second pull-down transistor having a source and a drain of said second conductivity type, each formed in a port of said surface clad with said titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; first connecting means, formed of a material comprising the metal of titanium silicide, for connecting the drains of said first pull-up and first pull-down transistors to the gates of said second pull-up and second pull-down transistors, said material of said first connecting means being substantially a diffusion barrier to dopant of said doped portion of said surface forming the drain of said first pull-down transistor; the first connecting means comprising: a first strap, comprised of titanium nitride, connected between the drain of the first pull-down transistor and the gate of the second pull-down transistor; and a second strap, comprised of titanium nitride, connected between the drain of the first pull-up transistor and the gate of the second pull-up transistor; second connecting means, formed of a material comprising the metal of titanium silicide, for connecting the drains of said second pull-up and second pull-down transistors to the gates of said first pull-up and first pull-down transistors, said material of said second connecting means being substantially a diffusion barrier to dopant of said doped portion of said surface forming the drain of said second pull-down transistor; wherein the second connecting means comprises: a first strap, comprised of titanium nitride, connected between the drain of the second pull-down transistor and the gate of the first pull-down transistor; and a second strap, comprised of titanium nitride, connected between the drain of the second pull-up transistor and the gate of the first pull-up transistor; and wherein the sources of the first and second pull-up transistors are coupled to a first reference voltage, and wherein the sources of the first and second pull-down transistors are coupled to a second reference voltage.

Claim 4

A memory cell formed at a surface of a semiconductor body, comprising: a first pull-up transistor having a source and a drain of a first conductivity type, each formed in a doped portion of said surface clad with titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a first pull-down transistor having a source and a drain of a second conductivity type, each formed in a doped portion of said surface clad with titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a second pull-up transistor having a source and a drain of said first conductivity type, each formed in a portion of said surface clad with titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a second pull-down transistor having a source and a drain of said second conductivity type, each formed in a port of said surface clad with said titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; first connecting means, formed of a material comprising the metal of titanium silicide, for connecting the drains of said first pull-up and first pull-down transistors to the gates of said second pull-up and second pull-down transistors, said material of said first connecting means being substantially a diffusion barrier to dopant of said doped portion of said surface forming the drain of said first pull-down transistor; the first connecting means comprising: a first strap, comprised of titanium nitride, connected between the drain of the first pull-down transistor and the gate of the second pull-down transistor; and a second strap, comprised of titanium nitride, connected between the drain of the first pull-up transistor and the gate of the second pull-up transistor; second connecting means, formed of a material comprising the metal of titanium silicide, for connecting the drains of said second pull-up and second pull-down transistors to the gates of said first pull-up and first pull-down transistors, said material of said second connecting means being substantially a diffusion barrier to dopant of said doped portion of said surface forming the drain of said second pull-down transistor; wherein the second connecting means comprises: a first strap, comprised of titanium nitride, connected between the drain of the second pull-down transistor and the gate of the first pull-down transistor; and a second strap, comprised of titanium nitride, connected between the drain of the second pull-up transistor and the gate of the first pull-up transistor; and wherein the sources of the first and second pull-up transistors are coupled to a first reference voltage, and wherein the sources of the first and second pull-down transistors are coupled to a second reference voltage.

Claim 5

A memory cell formed at a surface of a semiconductor body, comprising: a first pull-up transistor having a source and a drain each formed in a doped portion of said surface clad with titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a first pull-down transistor having a source and a drain each formed in a doped portion of said surface clad with said titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a second pull-up transistor having a source and a drain each formed in a portion of said surface clad with titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a second pull-down transistor having a source and a drain each formed in a portion of said surface clad with titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a first connection, formed of a material comprising the metal of titanium silicide, connecting the drains of said first pull-up and first pull-down transistors to the gates of said second pull-up and second pull-down transistors, said material of said first connection being substantially a diffusion barrier to the dopant of said drain of said first pull-down transistor; wherein the gates of said first and second pull-up and pull-down transistors are formed of polycrystalline silicon clad with said titanium silicide; and wherein the first connection is titanium nitride; a second connection, formed of a material comprising the metal of titanium silicide, connecting the drains of said second pull-up and second pull-down transistors, said material of said second connection being substantially a diffusion barrier to the dopant of said drain of said second pull-down transistor; wherein the second connection is titanium nitride; wherein the sources of the first and second pull-up transistors are coupled to a first reference voltage, and wherein the sources of the first and second pull-down transistors are coupled to a second reference voltage.

Claim 6

A memory cell formed at a surface of a semiconductor body, comprising: a first pull-up transistor having a source and a drain each formed in a doped portion of said surface clad with titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a first pull-down transistor having a source and a drain each formed in a doped portion of said surface clad with said titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a second pull-up transistor having a source and a drain each formed in a portion of said surface clad with titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a second pull-down transistor having a source and a drain each formed in a portion of said surface clad with titanium silicide, and having a gate disposed above a portion of said surface between said source and drain; a first connection, formed of a material comprising the metal of titanium silicide, connecting the drains of said first pull-up and first pull-down transistors to the gates of said second pull-up and second pull-down transistors, said material of said first connection being substantially a diffusion barrier to the dopant of said drain of said first pull-down transistor; wherein the gates of said first and second pull-up and pull-down transistors are formed of polycrystalline silicon clad with said titanium silicide; and wherein the first connection is titanium nitride; a second connection, formed of a material comprising the metal of titanium silicide, connecting the drains of said second pull-up and second pull-down transistors, said material of said second connection being substantially a diffusion barrier to the dopant of said drain of said second pull-down transistor; wherein the second connection is titanium nitride; wherein the sources of the first and second pull-up transistors are coupled to a first reference voltage, and wherein the sources of the first and second pull-down transistors are coupled to a second reference voltage.

Claim 7

A static random access memory cell at a semiconductor surface, comprising: first and second inverters, each said inverter comprising: a driver transistor having a first conductivity type semiconductor portion clad with a titanium disilicide; and wherein said driver transistors each have a source, a drain and a gate, said source and drain being of said first conductivity type; a load element having a semiconductor portion doped with dopant of a second conductivity type; said load elements each comprise a transistor having a source, a drain and a gate, said source and drain being of said second conductivity type; a first connection of a material comprising titanium nitride connecting the first conductivity type semiconductor portion of said driver transistor of said first inverter to the second conductivity type portion of said load element of said second inverter, wherein said material of said first connection is substantially a diffusion barrier to dopant of the first conductivity type semiconductor portion; and a second connection of a material comprising titanium nitride, connecting the first conductivity type portion of said driver transistor of said second inverter to the second conductivity type portion of said semiconductor load element of said first inverter, wherein said material of said second connection is substantially a diffusion barrier to dopant of the first conductivity type semiconductor portion.

Claim 8

A static random access memory cell at a semiconductor surface, comprising: first and second inverters, each said inverter comprising: a driver transistor having a first conductivity type semiconductor portion clad with a titanium disilicide; and wherein said driver transistors each have a source, a drain and a gate, said source and drain being of said first conductivity type; a load element having a semiconductor portion doped with dopant of a second conductivity type; said load elements each comprise a transistor having a source, a drain and a gate, said source and drain being of said second conductivity type; a first connection of a material comprising titanium nitride connecting the first conductivity type semiconductor portion of said driver transistor of said first inverter to the second conductivity type portion of said load element of said second inverter, wherein said material of said first connection is substantially a diffusion barrier to dopant of the first conductivity type semiconductor portion; and a second connection of a material comprising titanium nitride, connecting the first conductivity type portion of said driver transistor of said second inverter to the second conductivity type portion of said semiconductor load element of said first inverter, wherein said material of said second connection is substantially a diffusion barrier to dopant of the first conductivity type semiconductor portion.