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US4960729A Expired / Lapsed US ⏱️ 0.0 years remaining

Integrated circuits and a method for manufacture thereof

Assignee: Quick Tech Ltd
•
Filing: 1989-12-07
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Granted: 1990-10-02
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Expires: 2009-12-07
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Abstract

Abstract A technique for providing a radiation formable conductive link in an integrated circuit comprising the steps of: depositing a plurality of aluminum conductors on an exposed surface of an otherwise completed integrated circuit, and forming a bridge of amorphous silicon layer joining the aluminum conductors at selected locations, whereby subsequent laser radiation produces diffusion of aluminum into the amorphous silicon, producing a highly conductive aluminum doped silicon bridge.

Inventors

  • 👤 Zvi Orbach
  • 👤 Meir I. Janai

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 04:53
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/49; H10W20/491; H10W20/492; H10W20/01; H10W20/031; H10W20/067; H10W20/068

Claims Analysis

Total Claims: 16
Claim 1
Independent Claim 102 words
A technique for providing a direct radiation formable conductive link between first and second metal layers in an integrated circuit comprising the steps of: providing a first patterned metal layer on a substrate; providing an insulation layer over first patterned metal layer; providing a second patterned metal layer over said insulation layer; forming an aperture in said insulation layer through which adjacent, non-contacting portions of said first patterned metal layer and said second patterned metal layer are exposed; and after completion of all preceding steps, providing a layer of amorphous silicon contacting said first and second pattern metal layers at said aperture.
Claim 2
Dependent Claim 102 words
A technique for providing a direct radiation formable conductive link between first and second metal layers in an integrated circuit comprising the steps of: providing a first patterned metal layer on a substrate; providing an insulation layer over first patterned metal layer; providing a second patterned metal layer over said insulation layer; forming an aperture in said insulation layer through which adjacent, non-contacting portions of said first patterned metal layer and said second patterned metal layer are exposed; and after completion of all preceding steps, providing a layer of amorphous silicon contacting said first and second pattern metal layers at said aperture.
Claim 3
Dependent Claim 37 words
A technique according to claim 1 further comprising the step of selectably applying radiation directly to the layer of amorphous silicon for producing a conductive bridge joining said first and second patterned metal layers at said aperture.
Claim 4
Dependent Claim 17 words
A technique according to claim 1 further comprising the step of doping said layer of amorphous silicon.
Claim 5
Dependent Claim 17 words
A technique according to claim 2 further comprising the step of doping said layer of amorphous silicon.
Claim 6
Dependent Claim 22 words
A technique according to claim 3 wherein said step of doping comprises doping said layer of amorphous silicon with a p-type dopant.
Claim 7
Dependent Claim 12 words
A technique according to claim 5 wherein said type dopant comprises boron.
Claim 8
Dependent Claim 19 words
A technique according to claim 2 wherein said step of applying radiation comprises producing a doped silicon conductive bridge.
Claim 9
Dependent Claim 21 words
A technique according to claim 1 further comprising the step of providing an anti-reflective coating over the layer of amorphous silicon.
Claim 10
Dependent Claim 21 words
A technique according to claim 2 further comprising the step of providing an anti-reflective coating over the layer of amorphous silicon.
Claim 11
Dependent Claim 44 words
A technique according to claim 2, wherein said first and second patterned metal layers comprise aluminum conductors, and wherein said step of applying radiation comprises applying laser radiation to a selected layer of amorphous silicon, and producing a conductive pathway between said aluminum conductors.
Claim 12
Dependent Claim 45 words
A technique according to claim 2, wherein said first and second patterned metal layers comprise aluminum conductors, and wherein said step of applying radiation comprises applying ion beam radiation to a selected layer of amorphous silicon, and producing a conductive pathway between said aluminum conductors.
Claim 13
Dependent Claim 45 words
A technique according to claim 2, wherein said first and second patterned metal layers comprise aluminum conductors, and wherein said step of applying radiation comprises applying electron beam radiation to a selected layer of amorphous silicon, and producing a conductive pathway between said aluminum conductors.
Claim 14
Dependent Claim 13 words
A technique according to claim 8 wherein said anti-reflective coating comprises silicon nitride.
Claim 15
Dependent Claim 29 words
A technique according to claim 2 wherein said step of applying radiation includes the step of causing diffusion of said patterned metal layers into the layer of amorphous silicon.
Claim 16
Dependent Claim 24 words
A technique according to claim 2 wherein said step of applying radiation includes the step of causing crystallization of the layer of amorphous silicon.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-10-01 1994-04-02 1994-10-02 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-10-01 1998-04-02 1998-10-02 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-10-01 2002-04-02 2002-10-02 $7700.00 Window Closed / Lapsed

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