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US4957773A Expired / Lapsed US ⏱️ 0.0 years remaining

Deposition of boron-containing films from decaborane

Assignee: Syracuse University
•
Filing: 1989-02-13
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Granted: 1990-09-18
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Expires: 2009-02-13
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Abstract

Abstract Depopsition of a boron nitride film is carried out by introducing decaborane and dry nitrogen or ammonia into a plasma-assisted chemical vapor deposition chamber. The nitrogen or ammonia partial pressure should provide an excess over the decarborane pressures for example 200 milliTorr of N 2 or NH 3 and 50 MilliTorr of B 10 H 14 . Other film layers can also be produced starting from decaborane.

Inventors

  • 👤 James T. Spencer
  • 👤 Peter A. Dowben
  • 👤 Yoon G. Kim

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 11:00
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/68; C; C23; C23C; C23C16/00; C23C16/22; C23C16/30; C23C16/34; C23C16/342; H10P14/63; H10P14/6326; H10P14/6328; H10P14/6334; H10P14/6336; H10P14/66; H10P14/668; H10P14/6681; H10P14/6682; H10P32/00; H10P32/10; H10P32/14; H10P32/1408; H10P32/17; H10P32/171

Claims Analysis

Total Claims: 15
Claim 1
Independent Claim 97 words
A process for depositing a boron nitride film onto a suitable substrate comprising: supplying into a chamber that contains the substrate a gaseous mixture of decaborane and a nitrogen-based gas whose molecules contain at least one nitrogen atom, wherein said nitrogen-based gas is provided at a partial pressure that is several times as high as the partial pressure of said decaborane, and energizing the gaseous mixture in the chamber sufficiently to disassociate the nitrogen atoms from said molecules and to disassociate boron atoms from the decaborane, which then combine as said boron nitride film on said substrate.
Claim 2
Dependent Claim 97 words
A process for depositing a boron nitride film onto a suitable substrate comprising: supplying into a chamber that contains the substrate a gaseous mixture of decaborane and a nitrogen-based gas whose molecules contain at least one nitrogen atom, wherein said nitrogen-based gas is provided at a partial pressure that is several times as high as the partial pressure of said decaborane, and energizing the gaseous mixture in the chamber sufficiently to disassociate the nitrogen atoms from said molecules and to disassociate boron atoms from the decaborane, which then combine as said boron nitride film on said substrate.
Claim 3
Dependent Claim 25 words
The process of claim 1 wherein said nitrogen-based gas is selected from the group that consists of N 2 , NH 3 and mixtures thereof.
Claim 4
Dependent Claim 24 words
The process of claim 1 wherein said nitrogen-based gas and said decaborane are supplied at partial pressure of approximately 200 and 50 milliTorr, respectively.
Claim 5
Dependent Claim 33 words
The process of claim 1 wherein said chamber is an RF plasma reactor and said energizing is carried out by applying an RF current to the chamber while supplying said gaseous mixture thereto.
Claim 6
Dependent Claim 102 words
A process for depositing a binary film of boron and one other element onto a suitable substrate, comprising supplying into a chamber that contains the substrate a gaseous mixture of decaborane and another gas whose molecules contain at least one atom of said other element, wherein said other gas is provided at a partial pressure that is several times as high as the partial pressure of said decaborane; and energizing said gaseous mixture in the chamber sufficiently to disassociate said atoms from said molecules and to disassociate said boron atoms from the decaborane, which combine as said binary film on said substrate.
Claim 7
Dependent Claim 102 words
A process for depositing a binary film of boron and one other element onto a suitable substrate, comprising supplying into a chamber that contains the substrate a gaseous mixture of decaborane and another gas whose molecules contain at least one atom of said other element, wherein said other gas is provided at a partial pressure that is several times as high as the partial pressure of said decaborane; and energizing said gaseous mixture in the chamber sufficiently to disassociate said atoms from said molecules and to disassociate said boron atoms from the decaborane, which combine as said binary film on said substrate.
Claim 8
Dependent Claim 28 words
The process of claim 5 wherein said other gas is selected from the group consisting of N 2 , NH 3 , PH 3 and AsH 3 .
Claim 9
Dependent Claim 20 words
The process of claim 5 wherein said other gas is selected from the group consisting of ketanes, silane, and germane.
Claim 10
Dependent Claim 51 words
A process for depositing a boron film onto a suitable substrate, comprising introducing into a chamber that contains said substrate decaborane gas, and energizing said decaborane gas at selected locations on said substrate sufficiently to disassociate the boron from the decaborane which deposits itself on said substrate at said selected locations.
Claim 11
Dependent Claim 51 words
A process for depositing a boron film onto a suitable substrate, comprising introducing into a chamber that contains said substrate decaborane gas, and energizing said decaborane gas at selected locations on said substrate sufficiently to disassociate the boron from the decaborane which deposits itself on said substrate at said selected locations.
Claim 12
Dependent Claim 19 words
The process of claim 8 wherein said energizing includes illuminating a predetermined pattern on said substrate using ultraviolet radiation.
Claim 13
Dependent Claim 18 words
The process of claim 1 wherein said energizing is carried out photolytically using direct writing on said substrate.
Claim 14
Dependent Claim 18 words
The process of claim 8 wherein said energizing is carried out photolytically using direct writing on said substrate.
Claim 15
Dependent Claim 33 words
The process of claim 8 wherein said suitable substrate is an N-type semiconductor and said boron that is deposited at said selected locations is effective as a dopant to create P-type regions therein.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-09-17 1994-03-19 1994-09-18 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-09-17 1998-03-19 1998-09-18 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-09-17 2002-03-19 2002-09-18 $7700.00 Window Closed / Lapsed

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