Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
187 words
A logic array for receiving a plurality of input signals and providing one or more product terms comprising: ECL array means for combining a plurality of input signals and providing at least one product term, said ECL array means having a plurality of programming means arranged in a matrix of N rows by M columns, where N and M are positive integers; ECL input buffer means for receiving ECL input signals and providing signals to said array; ECL output buffer means for receiving said at least one product term and providing an ECL output signal corresponding to each said at least one product term; a plurality of access means, one for each of said programming means and being coupled to its associated programming means; means for directly testing the programmed state of each said programming means in response to test input signals having signal levels other than ECL voltage levels; and means for providing a verify output signal in response to the programmed state of a programming means being tested, said verify output signal not being dependent on the state of said one or more product terms.
Claim 2
Dependent Claim
187 words
A logic array for receiving a plurality of input signals and providing one or more product terms comprising: ECL array means for combining a plurality of input signals and providing at least one product term, said ECL array means having a plurality of programming means arranged in a matrix of N rows by M columns, where N and M are positive integers; ECL input buffer means for receiving ECL input signals and providing signals to said array; ECL output buffer means for receiving said at least one product term and providing an ECL output signal corresponding to each said at least one product term; a plurality of access means, one for each of said programming means and being coupled to its associated programming means; means for directly testing the programmed state of each said programming means in response to test input signals having signal levels other than ECL voltage levels; and means for providing a verify output signal in response to the programmed state of a programming means being tested, said verify output signal not being dependent on the state of said one or more product terms.
Claim 3
Dependent Claim
100 words
A logic array as in claim 1 wherein said access means comprise a bipolar transistor having a first current handling terminal connected to a supply voltage, a second current handling terminal connected to one end of its associated programming means, and a control terminal connected to receive an input signal, and wherein said means for directly testing comprises a verification transistor having a first current handling terminal connected to a supply voltage, a second current handling terminal connected to said means for providing a verify output signal, and a control terminal connected to said control terminal of said access means.
Claim 4
Dependent Claim
59 words
A logic array as in claim 2 which comprises a plurality of said verification transistors, each uniquely associated with one of said N rows, each of said first current handling terminals of said plurality of verification transistors being connected in common and each of said second current handling terminals of said plurality of verification transistors being connected in common.
Claim 5
Dependent Claim
59 words
A logic array as in claim 2 wherein said means for providing a verify output signal comprises: a verify output transistor having a control terminal for receiving signals from said verification transistor, a first current handling terminal connected to a supply voltage, and a second current handling terminal for providing said verify output signal at a verify output terminal.
Claim 6
Dependent Claim
29 words
A logic array as in claim 4 which further comprises a verification fuse connected in series with said verification transistor second current handling terminal and said verify output terminal.