US4842897A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for forming deposited film
Assignee: Canon Inc
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Filing: 1986-12-29
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Granted: 1989-06-27
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Expires: 2006-12-29
Abstract
Abstract A method for forming deposited film by introducing into a reaction space a gaseous starting material for formation of a deposited film and a gaseous halogenic oxidizing agent having the property of oxidation action for said starting material to effect chemical contact therebetween to thereby form a plural number of precursors including precursors under excited state, and forming said deposited film on a substrate previously position in a film forming space spatially communicated with said reaction space with the use of at least one precursor of these precursors as the feeding source for the constituent element of said deposited film, said method comprising the step of increasing the proportion of the amount of said gaseous starting material introduced relative to the amount of said gaseous halogenic oxidizing agent introduced in said reaction space.
Inventors
- 👤 Eiji Takeuchi
- 👤 Jun-Ichi Hanna
- 👤 Isamu Shimizu
- 👤 Masaaki Hirooka
- 👤 Akira Sakai
- 👤 Masao Ueki
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 16:47
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/32; H10P14/3242; H10P14/3244; H10P14/3251; C; C23; C23C; C23C16/00; C23C16/44; C23C16/448; C23C16/452; H10P14/24; H10P14/29; H10P14/2901; H10P14/2922; H10P14/2923; H10P14/3202; H10P14/3204; H10P14/3211; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3438; H10P14/3441; H10P14/3442; H10P14/3444
Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
240 words
A method for forming a deposited film on a substrate in a film forming space by introducing into a reaction space a gaseous starting material for formation of a deposited film and a gaseous halogenic oxidizing agent selected from the group consisting of F 2 , Cl 2 , Br 2 and I 2 , said gaseous halogenic oxidizing agent having the property of oxidation action on said starting material to effect chemical contact therebetween to thereby form a plural number of precursors including precursors in an excited state, said film forming space positioned adjacent and in communication with said reaction space and said deposited film including at least one of these precursors as a constituent element thereof, said method comprising: forming in said reaction space a first mixture of said gaseous starting material and said gaseous halogenic oxidizing agent in an amount ratio relative to each other such that said first mixture is capable of effecting an etching action on said substrate; introducing said first mixture into said film forming space to effect said etching action on said substrate and form an etched substrate; increasing the amount of said gaseous starting material relative to the amount of said gaseous halogenic oxidizing agent to form a second mixture in said reaction space capable of effecting film formation on said etched substrate; and introducing said second mixture into said film forming space to effect said film formation on said etched substrate.
Claim 2
Independent Claim
240 words
A method for forming a deposited film on a substrate in a film forming space by introducing into a reaction space a gaseous starting material for formation of a deposited film and a gaseous halogenic oxidizing agent selected from the group consisting of F 2 , Cl 2 , Br 2 and I 2 , said gaseous halogenic oxidizing agent having the property of oxidation action on said starting material to effect chemical contact therebetween to thereby form a plural number of precursors including precursors in an excited state, said film forming space positioned adjacent and in communication with said reaction space and said deposited film including at least one of these precursors as a constituent element thereof, said method comprising: forming in said reaction space a first mixture of said gaseous starting material and said gaseous halogenic oxidizing agent in an amount ratio relative to each other such that said first mixture is capable of effecting an etching action on said substrate; introducing said first mixture into said film forming space to effect said etching action on said substrate and form an etched substrate; increasing the amount of said gaseous starting material relative to the amount of said gaseous halogenic oxidizing agent to form a second mixture in said reaction space capable of effecting film formation on said etched substrate; and introducing said second mixture into said film forming space to effect said film formation on said etched substrate.
Claim 3
Dependent Claim
16 words
The method according to claim 1, wherein said gaseous starting material is a chain silane compound.
Claim 4
Dependent Claim
16 words
The method according to claim 3, wherein the chain silane compound is a straight chain compound.
Claim 5
Dependent Claim
28 words
The method according to claim 3, wherein the straight chain silane compound is represented by the general formula Si n H zn+2 (n is an integer of 1-8).
Claim 6
Dependent Claim
17 words
The method according to claim 2, wherein the chain silane compound is a branched chain silane compound.
Claim 7
Dependent Claim
22 words
The method according to claim 1, wherein said gaseous starting material is a silane compound having a cyclic structure of silicon atoms.
Claim 8
Dependent Claim
16 words
The method according to claim 1, wherein said gaseous starting material is a chain germane compound.
Claim 9
Dependent Claim
27 words
The method according to claim 7, wherein the chain germane compound is represented by the general formula Ge m H zm+2 (m is an integer of 1-5).
Claim 10
Dependent Claim
15 words
The method according to claim 1, wherein said gaseous starting material is a tetrahedral compound.
Claim 11
Dependent Claim
34 words
The method according to claim 1, wherein the substrate is positioned as opposed to the direction in which said gaseous starting material and said gaseous halogenic oxidizing agent are introduced into said reaction space.
Claim 12
Independent Claim
234 words
A method for forming a deposited film on a substrate in a film forming space by introducing into a reaction space a gaseous starting material for formation of a deposited film and a gaseous halogenic oxidizing agent selected from the group consisting of F 2 , Cl 2 , Br 2 and I 2 , said gaseous halogenic oxidizing agent having the property of oxidation action on said starting material to effect chemical contact therebetween to thereby form a plural number of precursors including precursors in an excited state, said film forming space positioned adjacent and in communication with said reaction spac and said deposited film including at least one of these precursors as a constituent element thereof, said method comprising: forming in said reaction space a first mixture of said gaseous starting material and said gaseous halogenic oxidizing agent said first mixture capable of forming said deposited film on said substrate; introducing said mixture into said film forming space to effect the formation of said deposited film to a desired thickness on said substrate; increasing the amount of said gaseous halogenic oxidizing agent relative to the amount of said gaseous starting material to form a second mixture in said reaction space capable of effecting an etching action of the surface of said deposited film; and introducing said second mixture into said film forming space to effect said etching action on said deposited film.
Claim 13
Independent Claim
234 words
A method for forming a deposited film on a substrate in a film forming space by introducing into a reaction space a gaseous starting material for formation of a deposited film and a gaseous halogenic oxidizing agent selected from the group consisting of F 2 , Cl 2 , Br 2 and I 2 , said gaseous halogenic oxidizing agent having the property of oxidation action on said starting material to effect chemical contact therebetween to thereby form a plural number of precursors including precursors in an excited state, said film forming space positioned adjacent and in communication with said reaction spac and said deposited film including at least one of these precursors as a constituent element thereof, said method comprising: forming in said reaction space a first mixture of said gaseous starting material and said gaseous halogenic oxidizing agent said first mixture capable of forming said deposited film on said substrate; introducing said mixture into said film forming space to effect the formation of said deposited film to a desired thickness on said substrate; increasing the amount of said gaseous halogenic oxidizing agent relative to the amount of said gaseous starting material to form a second mixture in said reaction space capable of effecting an etching action of the surface of said deposited film; and introducing said second mixture into said film forming space to effect said etching action on said deposited film.
Claim 14
Independent Claim
208 words
A method for preparing a semiconductor device having at least one layer of a semiconductive deposited film on a substrate which comprises: forming in a reaction space a first mixture of a gaseous starting material for formation of a deposited film and a gaseous halogenic oxidizing agent selected from the group consisting of F 2 , Cl 2 , Br 2 and I 2 , said gaseous halogenic oxidizing agent having the property of oxidation action on said starting material to effect chemical contact therebetween to thereby form a plural number of precursors including precursors in an excited state, said reaction space positioned adjacent and in communication with a film forming space, said first mixture capable of forming said deposited film on said substrate; introducing said first mixture into said film forming space to effect the formation of said deposited film; increasing the amount of said gaseous halogenic oxidizing agent relative to the amount of said gaseous starting material to form a second mixture capable of effecting an etching action by an oxidative reaction on said deposited film; and introducing said second mixture into said film forming space so as to contact said deposited film in a limited region and effect said etching thereon in a desired pattern.
Claim 15
Independent Claim
208 words
A method for preparing a semiconductor device having at least one layer of a semiconductive deposited film on a substrate which comprises: forming in a reaction space a first mixture of a gaseous starting material for formation of a deposited film and a gaseous halogenic oxidizing agent selected from the group consisting of F 2 , Cl 2 , Br 2 and I 2 , said gaseous halogenic oxidizing agent having the property of oxidation action on said starting material to effect chemical contact therebetween to thereby form a plural number of precursors including precursors in an excited state, said reaction space positioned adjacent and in communication with a film forming space, said first mixture capable of forming said deposited film on said substrate; introducing said first mixture into said film forming space to effect the formation of said deposited film; increasing the amount of said gaseous halogenic oxidizing agent relative to the amount of said gaseous starting material to form a second mixture capable of effecting an etching action by an oxidative reaction on said deposited film; and introducing said second mixture into said film forming space so as to contact said deposited film in a limited region and effect said etching thereon in a desired pattern.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1992-06-26 | 1992-12-26 | 1993-06-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-06-26 | 1996-12-26 | 1997-06-27 | $3760.00 | Window Closed / Lapsed |
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