Resist pattern forming process with dry etching

Claim 2

A pattern forming process, for forming a pattern using a mask pattern, the mask pattern being formed by patternwise exposure of a precursor material layer to light of a predetermined wavelength and developing the exposed precursor material layer to form the mask pattern, the precursor material being sensitive to light of said predetermined wavelength, comprising the steps of forming a film, to be processed, on a substrate, the substrate having topography on its surface, the film to be processed having a film topography corresponding to the topography of the substrate; forming a bottom layer comprising a light and/or heat sensitive aromatic azide compound, and a phenolic resin, over the whole surface of said film to be processed, to provide a bottom layer having a flattened upper surface, the bottom layer thereby having said aromatic azide compound incorporated therein, the aromatic azide compound being selected such that, after heating the bottom layer or exposing the whole surface of the bottom layer to light, the bottom layer has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; heating the bottom layer or exposing the whole surface of the bottom layer to a light, such that the bottom layer, having the aromatic azide compound incorporated therein and having been heated or the whole surface thereof exposed to light, has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; forming said mask pattern over said bottom layer, the mask pattern having a dry etching resistance higher than that of the bottom layer, the mask pattern being formed by substeps including exposing the layer of the precursor material to a pattern of said light of the predetermined wavelength and developing the exposed precursor material layer to remove portions thereof, thereby forming the mask pattern and exposing part of the bottom layer; removing the exposed part of the bottom layer by dry etching process so as to expose part of the film to be processed; and removing the exposed part of said film to be processed, whereby said pattern is formed in said film.

Claim 3

A process according to claim 1 wherein the aromatic azide compound contained in the bottom layer is at least one member of the group consisting of 1-(p-azidobenzylidene)-3-(α-hydroxybenzyl)indene, sodium 4,4'-diazidostilbene-2,2'-disulfonate, 4-azidochalcone and 3,3'-diazidodiphenyl sulfone.

Claim 4

A process according to claim 1 wherein the aromatic azide compound is contained in the bottom layer together with an aromatic sulfonyl azide compound, the aromatic azide compound being an aromatic bisazide compound.

Claim 5

A process according to claim 3 wherein the bisazide compound is at least one member of the group consisting of 3,3'-diazidodiphenyl sulfone, 4,4'-diazidodiphenylmethane, 4,4'-diazidodiphenyl ether, 4'4'-diazidodiphenyl sulfide, 4,4'-diazidodiphenyl disulfide, 4,4'-diazidodiphenyl sulfone and 4,4'-diazidostilbene.

Claim 6

A process according to claim 1 wherein the precursor material layer comprises a resist film.

Claim 7

A process according to claim 1 wherein the bottom layer is heated, the heat treatment being conducted at a temperature of 100° to 300° C.

Claim 8

A process according to claim 1 wherein the bottom layer is subjected to the whole surface exposure treatment, with the surface of the bottom layer being exposed to a light of a wavelength of 200 to 500 nm.

Claim 9

A process according to claim 1 wherein the aromatic azide compound has a maximum light absorption at wavelengths of 330 to 430 nm.

Claim 10

A process according to claim 1 wherein the layer of the percursor material is exposed to the pattern of light through a mask, the mask being positioned relative to the precursor material layer through detection of an alignment mark, and wherein the aromatic azide compound is selected such that, after said heating or said exposing, the bottom layer has said reduced transmission while having only an extremely small increased absorption of light, of a wavelength over 500 nm, used as a source of light in said detection of the alignment mark.

Claim 11

A process according to claim 9 wherein the predetermined wavelength is 405 nm or 436 nm.

Claim 12

A pattern forming process, for forming a pattern using a mask, the mask being formed by exposure of a photoresist film selectively to light of a predetermined wavelength and developing the exposed photoresist film, the photoresist material of the photoresist film being sensitive to light of said predetermined wavelength, comprising the steps of forming a film, to be processed, on a substrate, the substrate having topography on its surface, the film to be processed having a film topography corresponding to the topography of the substrate; forming a bottom layer comprising a light and/or heat sensitive aromatic azide compound, and a phenolic resin, over the whole surface of said film to be processed, to provide a bottom layer having a flattened upper surface, the bottom layer thereby having the aromatic azide compound incorporated therein, the aromatic azide compound being selected such that, after heating the bottom layer or exposing the whole surface of the bottom layer to light, the bottom layer has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; heating the bottom layer or exposing the whole surface of the bottom layer to a light, such that the bottom layer, having the aromatic azide compound incorporated therein and having been heated or the whole surface thereof exposed to light, has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; forming an intermediate layer comprising a material having a dry etching resistance higher than that of the bottom layer on the whole surface of the bottom layer; forming said photoresist film on the whole surface of the intermediate layer; exposing desired parts of the photoresist film selectively to said light of the predetermined wavelength so as to modify the solubility of the exposed parts selectively; developing the photoresist film to selectively remove the parts of high solubility, so as to expose parts of the intermediate layer; removing the exposed parts of the intermediate layer, so as to expose parts of the bottom layer; removing the exposed parts of the bottom layer by dry etching, so as to expose parts of the film to be processed; and removing the exposed parts of the film to be processed, whereby said pattern is formed in said film.

Claim 13

A pattern forming process, for forming a pattern using a mask, the mask being formed by exposure of a photoresist film selectively to light of a predetermined wavelength and developing the exposed photoresist film, the photoresist material of the photoresist film being sensitive to light of said predetermined wavelength, comprising the steps of forming a film, to be processed, on a substrate, the substrate having topography on its surface, the film to be processed having a film topography corresponding to the topography of the substrate; forming a bottom layer comprising a light and/or heat sensitive aromatic azide compound, and a phenolic resin, over the whole surface of said film to be processed, to provide a bottom layer having a flattened upper surface, the bottom layer thereby having the aromatic azide compound incorporated therein, the aromatic azide compound being selected such that, after heating the bottom layer or exposing the whole surface of the bottom layer to light, the bottom layer has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; heating the bottom layer or exposing the whole surface of the bottom layer to a light, such that the bottom layer, having the aromatic azide compound incorporated therein and having been heated or the whole surface thereof exposed to light, has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; forming an intermediate layer comprising a material having a dry etching resistance higher than that of the bottom layer on the whole surface of the bottom layer; forming said photoresist film on the whole surface of the intermediate layer; exposing desired parts of the photoresist film selectively to said light of the predetermined wavelength so as to modify the solubility of the exposed parts selectively; developing the photoresist film to selectively remove the parts of high solubility, so as to expose parts of the intermediate layer; removing the exposed parts of the intermediate layer, so as to expose parts of the bottom layer; removing the exposed parts of the bottom layer by dry etching, so as to expose parts of the film to be processed; and removing the exposed parts of the film to be processed, whereby said pattern is formed in said film.

Claim 14

A process according to claim 11 wherein the aromatic azide compound contained in the bottom layer is at least one member of the group consisting of 1-(p-azidobenzylidene)-3-(α-hydroxybenzyl)indene, sodium 4,4'-diazidostilbene-2,2'-disulfonate, 4-azidochalcone and 3,3'-diazidodiphenylene sulfone.

Claim 15

A process according to claim 11 wherein the aromatic azide compound is contained in the bottom layer together with an aromatic sulfonyl azide compound, the aromatic azide compound being an aromatic bisazide compound.

Claim 16

A process according to claim 13 wherein the bisazide compound is at least one member of the group consisting of 3,3'-diazidodiphenyl sulfone, 4,4'-diazidodiphenylmethane, 4,4'-diazidodiphenyl ether, 4,4'-diazidodiphenyl sulfide, 4,4'-diazidodiphenyl disulfide, 4,4'-diazidodiphenyl sulfone and 4,4'-diazidostilbene.

Claim 17

A process according to claim 11 wherein the bottom layer is heated, the heat treatment being conducted at a temperature of 100° to 300° C.

Claim 18

A process according to claim 11 wherein the bottom layer is subjected to the whole surface exposure treatment, the exposure treatment being conducted with a light of a wavelength of 200 to 500 nm.

Claim 19

A pattern forming process, for forming a pattern using a mask pattern, the mask pattern being formed by patternwise exposure of a precursor material layer to light of a predetermined wavelength and developing the exposed precursor material layer to form the mask pattern, the precursor material being sensitive to light of said predetermined wavelength, comprising the steps of forming a film, to be processed, on a substrate, the substrate having topography on its surface, the film to be processed having a film topography corresponding to the topography of the substrate; forming a bottom layer comprising a light and/or heat sensitive aromatic sulfonyl azide compound, and a phenolic resin, over the whole surface of said film to be processed, to provide a bottom layer having a flattened upper surface, the bottom layer thereby having said aromatic sulfonyl azide compound incorporated therein, the aromatic sulfonyl azide compound being selected such that, after heating the bottom layer or exposing the whole surface of the bottom layer to light, the bottom layer has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; heating the bottom layer or exposing the whole surface of the bottom layer to a light, such that the bottom layer, having the aromatic sulfonyl azide compound incorporated therein and having been heated or the whole surface thereof exposed to light, has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; forming said mask pattern over said bottom layer, the mask pattern having a dry etching resistance higher than that of the bottom layer, the mask pattern being formed by substeps including exposing the layer of the precursor material to a pattern of said light of the predetermined wavelength and developing the exposed precursor material layer to remove portions thereof, thereby forming the mask pattern and exposing part of the bottom layer; removing the exposed part of the bottom layer by dry etching process so as to expose part of the film to be processed; and removing the exposed part of said film to be processed, whereby said pattern is formed in said film.

Claim 20

A pattern forming process, for forming a pattern using a mask pattern, the mask pattern being formed by patternwise exposure of a precursor material layer to light of a predetermined wavelength and developing the exposed precursor material layer to form the mask pattern, the precursor material being sensitive to light of said predetermined wavelength, comprising the steps of forming a film, to be processed, on a substrate, the substrate having topography on its surface, the film to be processed having a film topography corresponding to the topography of the substrate; forming a bottom layer comprising a light and/or heat sensitive aromatic sulfonyl azide compound, and a phenolic resin, over the whole surface of said film to be processed, to provide a bottom layer having a flattened upper surface, the bottom layer thereby having said aromatic sulfonyl azide compound incorporated therein, the aromatic sulfonyl azide compound being selected such that, after heating the bottom layer or exposing the whole surface of the bottom layer to light, the bottom layer has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; heating the bottom layer or exposing the whole surface of the bottom layer to a light, such that the bottom layer, having the aromatic sulfonyl azide compound incorporated therein and having been heated or the whole surface thereof exposed to light, has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; forming said mask pattern over said bottom layer, the mask pattern having a dry etching resistance higher than that of the bottom layer, the mask pattern being formed by substeps including exposing the layer of the precursor material to a pattern of said light of the predetermined wavelength and developing the exposed precursor material layer to remove portions thereof, thereby forming the mask pattern and exposing part of the bottom layer; removing the exposed part of the bottom layer by dry etching process so as to expose part of the film to be processed; and removing the exposed part of said film to be processed, whereby said pattern is formed in said film.

Claim 21

A process according to claim 17 wherein the aromatic sulfonyl azide compound contained in the bottom layer is at least one member of the group consisting of 1-phenyl-3-methyl-4-(p-azidosulfophenylazo)-5-pyrazolone, 4-N,N-dimethylamino-4'-azidosulfoazobenzene, 4'-aminoazobenzene-4-sulfonyl azide, p-(2-hydroxy-1-naphthylazo)benzenesulfonyl azide, p-(4-hydroxy-1-naphthylazo)benzenesulfonyl azide, 2',4'-dihydroxyazobenzene-4-sulfonyl azide, 4'-(N-phenylaminoazobenzene)-4-sulfonyl azide, 4,4'-bis(1-phenyl-3-methyl-5-hydroxy-4-pyrazolylazo)biphenyl-2,2'-bissulfonyl azide, p-(3-methyl-4-phenylazo-5-hydroxypyrazolyl)benzenesulfonyl azide, 3-methyl-4-(1-phenyl-3-methyl-5-hydroxy-4-pyrazolylazo)benzenesulfonyl azide, p-[3-methyl-4-(p-azidosulfophenylazo)-5-hydroxypyrazolyl]benzenesulfonyl azide, p-(2-amino-1-naphthylazo)benzenesulfonyl azide, p-[3-methyl-4-(2,5-dichlorophenylazo)-5-hydroxypyrazolyl]phenylsulfonyl azide, 4,4'-bis(p-hydroxyphenylazo)stilbene-2,2'-disulfonyl azide, 4,4'-bis(p-aminophenylazo)stilbene-2,2'-disulfonyl azide, 4,4'-bis(p-methoxyphenylazo)stilbene-2,2'-disulfonyl azide, 4,4'-bis(p-ethoxyphenylazo)stilbene-2,2'-disulfonyl azide, p-(2,4-dihydroxy-3-quinolylazo)phenylsulfonyl azide, 2-[p-(4-hydroxyphenylazo)phenyl]benzothiazole-7-sulfonyl azide, 2-[4-(N,N-dimethylamino)styryl]quinoline-4-sulfonyl azide, 2-[4-(N,N-dimethylamino)styryl]benzothiazole-6-sulfonyl azide and 2-[4-(N,N-dimethylamino)styryl]benzimidazole-6-sulfonyl azide.

Claim 22

A process according to claim 17 wherein the precursor material layer comprises a resist film.

Claim 23

A process according to claim 17 wherein the bottom layer is heated, the heat treatment being conducted at a temperature of 100° to 300° C.

Claim 24

A process according to claim 17 wherein the bottom layer is subjected to the whole surface exposure treatment, with the surface of the bottom layer being exposed to a light of a wavelength of 200 to 500 nm.

Claim 25

A process according to claim 17 wherein the layer of the precursor material is exposed to the pattern of light through a mask, the mask being positioned relative to the precursor material layer through detection of an alignment mark, and wherein the aromatic sulfonyl azide compound is selected such that, after said heating or said exposing, the bottom layer has said reduced transmission while having only an extremely small increased absorption of light, of a wavelength over 500 nm, used as a source of light in said detection of the alignment mark.

Claim 26

A process according to claim 22 wherein the predetermined wavelength is 405 nm or 436 nm.

Claim 27

A pattern forming process, for forming a pattern using a mask, the mask being formed by exposure of a photoresist film selectively to light of a predetermined wavelength and developing the exposed photoresist film, the photoresist material of the photoresist film being sensitive to light of said predetermined wavelength, comprising the steps of forming a film, to be processed, on a substrate, the substrate having topography on its surface, the film to be processed having a film topography corresponding to the topography of the substrate; forming a bottom layer comprising a light and/or heat sensitive aromatic sulfonyl azide compound, and a phenolic resin, over the whole surface of said film to be processed, to provide a bottom layer having a flattened upper surface, the bottom layer thereby having the aromatic sulfonyl azide compound incorporated therein, the aromatic sulfonyl azide compound being selected such that, after heating the bottom layer or exposing the whole surface of the bottom layer to light, the bottom layer has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; heating the bottom layer or exposing the whole surface of the bottom layer to a light, such that the bottom layer, having the aromatic sulfonyl azide compound incorporated therein and having been heated or the whole surface thereof exposed to light, has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; forming an intermediate layer comprising a material having a dry etching resistance higher than that of the bottom layer on the whole surface of the bottom layer; forming said photoresist film on the whole surface of the intermediate layer; exposing desired parts of the photoresist film selectively to said light of the predetermined wavelength so as to modify the solubility of the exposed parts selectively; developing the photoresist film to selectively remove the parts of high solubility, so as to expose parts of the intermediate layer; removing the exposed parts of the intermediate layer, so as to expose parts of the bottom layer; removing the exposed parts of the bottom layer by dry etching, so as to expose parts of the film to be processed; and removing the exposed parts of the film to be processed, whereby said pattern is formed in said film.

Claim 28

A pattern forming process, for forming a pattern using a mask, the mask being formed by exposure of a photoresist film selectively to light of a predetermined wavelength and developing the exposed photoresist film, the photoresist material of the photoresist film being sensitive to light of said predetermined wavelength, comprising the steps of forming a film, to be processed, on a substrate, the substrate having topography on its surface, the film to be processed having a film topography corresponding to the topography of the substrate; forming a bottom layer comprising a light and/or heat sensitive aromatic sulfonyl azide compound, and a phenolic resin, over the whole surface of said film to be processed, to provide a bottom layer having a flattened upper surface, the bottom layer thereby having the aromatic sulfonyl azide compound incorporated therein, the aromatic sulfonyl azide compound being selected such that, after heating the bottom layer or exposing the whole surface of the bottom layer to light, the bottom layer has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; heating the bottom layer or exposing the whole surface of the bottom layer to a light, such that the bottom layer, having the aromatic sulfonyl azide compound incorporated therein and having been heated or the whole surface thereof exposed to light, has a reduced transmission of said light of the predetermined wavelength while having only an extremely small increased absorption of light of a wavelength over 500 nm; forming an intermediate layer comprising a material having a dry etching resistance higher than that of the bottom layer on the whole surface of the bottom layer; forming said photoresist film on the whole surface of the intermediate layer; exposing desired parts of the photoresist film selectively to said light of the predetermined wavelength so as to modify the solubility of the exposed parts selectively; developing the photoresist film to selectively remove the parts of high solubility, so as to expose parts of the intermediate layer; removing the exposed parts of the intermediate layer, so as to expose parts of the bottom layer; removing the exposed parts of the bottom layer by dry etching, so as to expose parts of the film to be processed; and removing the exposed parts of the film to be processed, whereby said pattern is formed in said film.

Claim 29

A process according to claim 24 wherein the aromatic sulfonyl azide compound contained in the bottom layer is at least one member of the group consisting of 1-phenyl-3-methyl-4-(p-azido sulfophenylazo)-5-pyrazolone, 4-N,N-dimethylamino-4'-azidosulfoazobenzene, 4'-aminoazobenzene-4-sulfonyl azide, p-(2-hydroxy-1-naphthylazo)benzenesulfonyl azide, p-(4-hydroxy-1-naphthylazo)benzenesulfonyl azide, 2',4'-dihydroxy-azobenzene-4-sulfonyl azide, 4'-(N-phenylaminoazobenzene)-4-sulfonyl azide, 4'4'-bis(1-phenyl-3-methyl-5-hydroxy-4-pyrazolylazo)biphenyl-2,2'-bissulfonyl azide, p-(3-methyl-4-phenylazo-5-hydroxypyrazolyl)benzensulfonyl azide, 3-methyl-4-(1-phenyl-3-methyl-5-hydroxy-4-pyrazolylazo)benzenesulfonyl azide, p-[3-methyl-4-(p-azidosulfophenylazo)-5-hydroxypyrazolyl]benzenesulfonyl azide, p-(2-amino-1-naphthylazo)benzenesulfonyl azide, p-[3-methyl-4-(2,5-dichlorophenylazo)-5-hydroxypyrazolyl]phenylsulfonyl azide, 4,4'-bis(p-hydroxyphenylazo)stilbene-2,2'-disulfonyl azide, 4,4'-bis(p-aminophenylazo)stilbene-2,2'-disulfonyl azide, 4,4'-bis(p-methoxyphenylazo)stilbene-2,2'-disulfonyl azide, 4,4'-bis(p-ethoxyphenylazo)stilbene-2,2'-disulfonyl azide, p-(2,4-dihydroxy-3-quinolylazo)phenylsulfonyl azide, 2-[p-(4-hydroxyphenylazo)phenyl]benzothiazole-7-sulfonyl azide, 2-[4-(N,N-dimethylamino)styryl]quinoline-4-sulfonyl azide, 2-[4-(N,N-dimethylamino)styryl]benzothiazole-6-sulfonyl azide and 2-[4-(N,N-dimethylamino)styryl]benzimidazole-6-sulfonyl azide.

Claim 30

A process according to claim 24 wherein the bottom layer is heated, the heat treatment being conducted at a temperature of 100° to 300° C.

Claim 31

A process according to claim 24 wherein the bottom layer is subjected to the whole surface exposure treatment, the exposure treatment being conducted with a light of a wavelength of 200 to 500 nm.

Claim 32

A process according to claim 24 wherein the photoresist film is exposed to the pattern of light through a mask, the mask being positioned relative to the photoresist film through detection of an alignment mark, and wherein the aromatic sulfonyl azide compound is selected such that, after said heating or said exposing, the bottom layer has said reduced transmission while having only an extremely small increased absorption of light, of a wavelength over 500 nm, used as a source of light in said detection of the alignment mark.

Claim 33

A process according to claim 28 wherein the predetermined wavelength is 405 nm or 436 nm.

Claim 34

A process according to claim 11 wherein the photoresist film is exposed to the pattern of light through a mask, the mask being positioned relative to the photoresist film through detection of an alignment mark, and wherein the aromatic azide compound is selected such that, after said heating or said exposing, the bottom layer has said reduced transmission while having only an extremely small increased absorption of light, of a wavelength over 500 nm, used as a source of light in said detection of the alignment mark.

Claim 35

A process according to claim 30 wherein the predetermined wavelength is 405 nm or 436 nm.

Claim 36

A pattern forming process, for forming a pattern using a mask pattern, the mask pattern being formed by patternwise exposure of a precursor material layer to light of a predetermined wavelength and developing the exposed precursor material layer to form the mask pattern, the precursor material being sensitive to light of said predetermined wavelength, comprising the steps of forming a film, to be processed, on a substrate, the substrate having topography on its surface, the film to be processed having a film topography corresponding to the topography of the substrate; forming a bottom layer comprising a light and/or heat sensitive aromatic azide compound, and a phenolic resin, over the whole surface of said film to be processed, to provide a bottom layer having a flattened upper surface, the bottom layer thereby having said aromatic azide compound incorporated therein, the aromatic azide compound being selected such that, after heating the bottom layer or exposing the whole surface of the bottom layer to light, the bottom layer has a reduced transmission of said light of the predetermined wavelength while permitting transmission of light of a wavelength of over 500 nm; heating the bottom layer or exposing the whole surface of the bottom layer to a light, such that the bottom layer, having the aromatic azide compound incorporated therein and having been heated or the whole surface thereof exposed to light, has a reduced transmission of said light of the predetermined wavelength while permitting transmission of light of a wavelength over 500 nm; forming said mask pattern over said bottom layer, the mask pattern having a dry etching resistance higher than that of the bottom layer, the mask pattern being formed by substeps including exposing the layer of the precursor material to a pattern of said light of the predetermined wavelength and developing the exposed precursor material layer to remove portions thereof, thereby forming the mask pattern and exposing part of the bottom layer; removing the exposed part of the bottom layer by dry etching process so as to expose part of the film to be processed; and removing the exposed part of said film to be processed, whereby said pattern is formed in said film.

Claim 37

A pattern forming process, for forming a pattern using a mask pattern, the mask pattern being formed by patternwise exposure of a precursor material layer to light of a predetermined wavelength and developing the exposed precursor material layer to form the mask pattern, the precursor material being sensitive to light of said predetermined wavelength, comprising the steps of forming a film, to be processed, on a substrate, the substrate having topography on its surface, the film to be processed having a film topography corresponding to the topography of the substrate; forming a bottom layer comprising a light and/or heat sensitive aromatic azide compound, and a phenolic resin, over the whole surface of said film to be processed, to provide a bottom layer having a flattened upper surface, the bottom layer thereby having said aromatic azide compound incorporated therein, the aromatic azide compound being selected such that, after heating the bottom layer or exposing the whole surface of the bottom layer to light, the bottom layer has a reduced transmission of said light of the predetermined wavelength while permitting transmission of light of a wavelength of over 500 nm; heating the bottom layer or exposing the whole surface of the bottom layer to a light, such that the bottom layer, having the aromatic azide compound incorporated therein and having been heated or the whole surface thereof exposed to light, has a reduced transmission of said light of the predetermined wavelength while permitting transmission of light of a wavelength over 500 nm; forming said mask pattern over said bottom layer, the mask pattern having a dry etching resistance higher than that of the bottom layer, the mask pattern being formed by substeps including exposing the layer of the precursor material to a pattern of said light of the predetermined wavelength and developing the exposed precursor material layer to remove portions thereof, thereby forming the mask pattern and exposing part of the bottom layer; removing the exposed part of the bottom layer by dry etching process so as to expose part of the film to be processed; and removing the exposed part of said film to be processed, whereby said pattern is formed in said film.

Claim 38

A process according to claim 32 wherein the layer of the precursor material is exposed to the pattern of light through a mask, the mask being positioned relative to the precursor material layer through detection of an alignment mark by irradiating light of a wavelength of over 500 nm thereon, the aromatic azide compound being selected such that, after said heating or said exposing, the bottom layer has said reduced transmission while permitting sufficient transmission of the light of the wavelength of over 500 nm so as to be able to detect the alignment mark during the detection thereof.

Claim 39

A process according to claim 17 wherein the aromatic sulfonyl azide compound is an aromatic bisulfonyl azide compound.