Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
84 words
An integrated circuit comprising: a substrate having a silicon upper portion; device isolation regions defining predetermined active device areas; a plurality of active devices in said active device areas, portions of said active devices being formed from a conductive first thin film layer; a local interconnect layer distinct from said first thin film layer, said local interconnect layer comprising lines predominantly comprising titanium nitride, said lines of said local interconnect layer interconnecting predetermined portions of said active device regions over said device isolation regions.
Claim 2
Dependent Claim
84 words
An integrated circuit comprising: a substrate having a silicon upper portion; device isolation regions defining predetermined active device areas; a plurality of active devices in said active device areas, portions of said active devices being formed from a conductive first thin film layer; a local interconnect layer distinct from said first thin film layer, said local interconnect layer comprising lines predominantly comprising titanium nitride, said lines of said local interconnect layer interconnecting predetermined portions of said active device regions over said device isolation regions.
Claim 3
Dependent Claim
17 words
The device of claim 2, wherein said titanium nitride interconnect lines are less than 2000 angstroms thick.
Claim 4
Dependent Claim
25 words
The device of claim 2, wherein said titanium nitride interconnect lines make contact to titanium silicide layers at the surface of said active device regions.
Claim 5
Dependent Claim
34 words
The device of claim 2, wherein ones of said titanium nitride lines also make contact to a gate layer in predetermined locations, said gate layer being polycrystalline and comprising a substantial fraction of silicon.
Claim 6
Dependent Claim
44 words
The device of claim 2, wherein said active device regions are covered by an interlevel dielectric having contact holes filled with metal therein, said metal in said contact holes making direct contact only to portions of said titanium nitride layer at the bottom thereof.
Claim 7
Dependent Claim
37 words
The device of claim 2, wherein said titanium nitride layer extends both over predetermined portions of said device isolation region and also over predetermined portions of titanium silicide layers at the surface of said active device regions.
Claim 8
Dependent Claim
52 words
The device of claim 2, wherein said active devices comprise field effect transistors having gates formed from patterned portions of said first thin film layer, said first thin film layer providing a gate layer, and wherein said lines of said interconnect layer also make contact to said gate layer in predetermined locations.
Claim 9
Dependent Claim
18 words
The device of claim 7, wherein said gate layer is polycrystalline and comprises a substantial fraction of silicon.
Claim 10
Dependent Claim
14 words
The device of claim 8, wherein said gate layer comprises more than 80% silicon.
Claim 11
Dependent Claim
14 words
The device of claim 9, wherein said gate layer consists essentially of polycrystalline silicon.
Claim 12
Dependent Claim
13 words
The device of claim 7, wherein said gate layer comprises a silicide layer.
Claim 13
Dependent Claim
27 words
The device of claim 11, wherein said lines of said interconnect layer also make contact to said silicide layer portion of said gate layer in predetermined locations.