US4378628A
Expired / Lapsed
US
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Cobalt silicide metallization for semiconductor integrated circuits
Assignee: Agere Systems LLC
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Filing: 1981-08-27
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Granted: 1983-04-05
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Expires: 2001-08-27
Abstract
Abstract In order to form MOSFET structures, a cobalt layer (16) is deposited and sintered, at about 400° C. to 500° C., on a patterned semiconductor wafer having exposed polycrystalline (14) or monocrystalline (11) silicon portions, as well as exposed oxide (15 or 25) portions. The cobalt reacts with exposed surfaces of the silicon portions and forms thereat such compounds as cobalt monosilicide (CoSi) or di-cobalt silicide (C0 2 Si), or a mixture of both. The unreacted cobalt is selectively removed, as by selective etching in a suitable acid bath. A heat treatment at about 700° C. or more, preferably in an oxidizing ambient which contains typically about 2 percent oxygen, converts the cobalt compound(s) into relatively stable cobalt disilicide (CoSi 2 ). Subsequently, deposition of an in situ doped layer (33) of polycrystalline silicon (polysilicon) on the cobalt disilicide contacting the monocrystalline silicon portions--followed by gettering, deposition of a layer (34) of aluminum, and standard etch-patterning of the aluminum and polysilicon layers--completes the metallization of the desired MOSFET structures on the silicon wafer.
Inventors
- 👤 Hyman J. Levinstein
- 👤 Shyam P. Murarka
- 👤 Ashok K. Sinha
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 09:07
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/0223; H10D64/00; H10D64/01; H10D64/011; H10D64/0111; H10D64/0112; H10D64/013; H10D64/01302; H10D64/01304; H10D64/01318; H10D64/0132
Claims Analysis
Total Claims: 25
Claim 1
Independent Claim
65 words
A method for fabricating cobalt disilicide electrode metallization contacts for a semiconductor integrated circuit including heating a cobalt silicide layer overlying in contact with exposed silicon portions of a patterned silicon wafer to a temperature of at least 700° C., whereby said layer is converted into a layer essentially of cobalt disilicide, and forming a layer of silicon dioxide on said layer of cobalt disilicide.
Claim 2
Independent Claim
65 words
A method for fabricating cobalt disilicide electrode metallization contacts for a semiconductor integrated circuit including heating a cobalt silicide layer overlying in contact with exposed silicon portions of a patterned silicon wafer to a temperature of at least 700° C., whereby said layer is converted into a layer essentially of cobalt disilicide, and forming a layer of silicon dioxide on said layer of cobalt disilicide.
Claim 3
Dependent Claim
20 words
The method of claim 1 in which the temperature is in the range of about 700° C. to 1000° C.
Claim 4
Dependent Claim
31 words
The method of claim 1 or 2 in which said ambient is an oxidizing ambient whereby said layer of silicon dioxide during said heating forms on said layer of cobalt disilicide.
Claim 5
Dependent Claim
24 words
The method of claim 3 in which the ambient contains oxygen in a molar concentration in the range of about 0.5 to 5.0 percent.
Claim 6
Dependent Claim
33 words
The method recited in claim 1 or 2 followed by the steps of: (a) depositing a polysilicon layer on said cobalt disilicide layer; and (b) depositing an aluminum layer on said polysilicon layer.
Claim 7
Dependent Claim
132 words
In a method for fabricating a silicon device: (a) depositing a metal layer of cobalt on a patterned silicon wafer having exposed silicon portions; (b) heating the cobalt to a first temperature in the range of about 400° C. to 550° C., in order to form a cobalt silicide layer overlying in contact with said silicon portions, whereby cobalt metal remains overlying the complement of said silicon portions; (c) removing the cobalt metal overlying those portions of the silicon wafer complementary to said exposed silicon portions thereof, whereby the cobalt silicide layer remains intact; and (d) heating the cobalt silicide layer to a second temperature of at least about 700° C. in an oxidizing ambient in order to convert the cobalt silicide layer into a cobalt disilicide layer contacting said silicon portions.
Claim 8
Dependent Claim
132 words
In a method for fabricating a silicon device: (a) depositing a metal layer of cobalt on a patterned silicon wafer having exposed silicon portions; (b) heating the cobalt to a first temperature in the range of about 400° C. to 550° C., in order to form a cobalt silicide layer overlying in contact with said silicon portions, whereby cobalt metal remains overlying the complement of said silicon portions; (c) removing the cobalt metal overlying those portions of the silicon wafer complementary to said exposed silicon portions thereof, whereby the cobalt silicide layer remains intact; and (d) heating the cobalt silicide layer to a second temperature of at least about 700° C. in an oxidizing ambient in order to convert the cobalt silicide layer into a cobalt disilicide layer contacting said silicon portions.
Claim 9
Dependent Claim
22 words
The steps of claim 6 followed by the step of: depositing a doped in situ polysilicon layer on said cobalt disilicide layer.
Claim 10
Dependent Claim
18 words
The step of claim 7 followed by the step of: depositing an aluminum layer on said polysilicon layer.
Claim 11
Dependent Claim
24 words
The steps of claim 8 in which said ambient contains oxygen in a molar concentration in the range of about 0.5 to 5.0 percent.
Claim 12
Dependent Claim
19 words
The steps of claim 9 in which said ambient contains oxygen in a molar concentration of about 2 percent.
Claim 13
Dependent Claim
26 words
The steps of claim 6 or 7 in which said ambient contains oxygen in a molar concentration in the range of about 0.5 to 5.0 percent.
Claim 14
Dependent Claim
19 words
The steps of claim 11 in which said ambient contains oxygen in a molar concentration of about 2 percent.
Claim 15
Dependent Claim
26 words
The steps of claim 6, 7, 8, 9 or 10 in which said first temperature is in the range of about 400° C. to 550° C.
Claim 16
Dependent Claim
14 words
The steps of claim 11 in which said first temperature is about 450° C.
Claim 17
Dependent Claim
152 words
In a method for fabricating an insulated gate field effect transistor, the steps for fabricating gate electrode metallization comprising: (a) depositing a layer of cobalt on a patterned silicon wafer having exposed portions of a polysilicon layer; (b) heating the wafer to a first temperature in the range of about 400° C. to 550° C., for a time sufficient to convert first portions of said layer of cobalt which overlies the exposed portions of the polysilicon layer into a layer of cobalt silicide, whereby second portions of said layer of cobalt complementary to said first portions remain as cobalt; (c) removing, by selective etching, said second portions of said layer of cobalt complementary to said first portions; (d) heating the wafer to a second temperature of at least about 700° C. in an oxidizing ambient for a time sufficient to convert said layer of cobalt silicide into a layer of cobalt disilicide.
Claim 18
Dependent Claim
152 words
In a method for fabricating an insulated gate field effect transistor, the steps for fabricating gate electrode metallization comprising: (a) depositing a layer of cobalt on a patterned silicon wafer having exposed portions of a polysilicon layer; (b) heating the wafer to a first temperature in the range of about 400° C. to 550° C., for a time sufficient to convert first portions of said layer of cobalt which overlies the exposed portions of the polysilicon layer into a layer of cobalt silicide, whereby second portions of said layer of cobalt complementary to said first portions remain as cobalt; (c) removing, by selective etching, said second portions of said layer of cobalt complementary to said first portions; (d) heating the wafer to a second temperature of at least about 700° C. in an oxidizing ambient for a time sufficient to convert said layer of cobalt silicide into a layer of cobalt disilicide.
Claim 19
Dependent Claim
21 words
The steps of claim 15 in which said second temperature is in the range of about 700° C. to 1000° C.
Claim 20
Dependent Claim
14 words
The steps of claim 15 in which said first temperature is about 450° C.
Claim 21
Dependent Claim
30 words
The steps for claim 15, 16, or 17 in which the thickness of the polysilicon layer is so great that some polysilicon thereof remains underlying the layer of cobalt disilicide.
Claim 22
Dependent Claim
24 words
The steps of claim 18 in which said ambient contains oxygen in a molar concentration in the range of about 0.5 to 5.0 percent.
Claim 23
Dependent Claim
19 words
The steps of claim 18 in which said ambient contains oxygen in a molar concentration of about 2 percent.
Claim 24
Dependent Claim
27 words
The steps of claim 15, 16, or 17 in which said ambient contains oxygen in a molar concentration in the range of about 0.5 to 5.0 percent.
Claim 25
Dependent Claim
22 words
The steps of claim 15, 16, or 17 in which said ambient contains oxygen in a molar concentration of about 2 percent.
References Cited (Backward Citations)
US3617824A
Cited
US4109372A
Cited
US4180596A
Cited
US4283439A
Cited
US4285761A
Cited
US4339869A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-04-04 | 1986-10-04 | 1987-04-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-04-04 | 1990-10-04 | 1991-04-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-04-04 | 1994-10-04 | 1995-04-05 | $7700.00 | Window Closed / Lapsed |