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US4758525A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of making light-receiving diode

Assignee: New Energy and Industrial Technology Development Organization
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Filing: 1986-07-14
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Granted: 1988-07-19
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Expires: 2006-07-14
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Abstract

Abstract In a method of manufacturing a solar cell including a p-n junction formed in a semiconductor substrate, impurity ions are implanted through a mask in the form of an oxide film covering a light receiving surface of the semiconductor substrate except an electrode forming part, thereby forming a p-n junction which is deep in an area beneath the electrode forming part but shallow in the remaining area. Formation of the shallow p-n junction improves the spectral sensitivity in a short wavelength range. Further, utilization of the oxide film as a passivation film can prevent shortening of the life time of minority carriers in the substrate due to heat treatment, thereby retarding the electron-hole recombination rate at the light receiving surface of the substrate.

Inventors

  • 👤 Yasuhiro Kida
  • 👤 Koichi Suda
  • 👤 Kunihiro Matsukuma
  • 👤 Keiichi Morita

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 20:42
CPC Classifications
H; H10; H10F; H10F71/00; H10F71/121; H10F10/00; H10F10/10; H10F10/14; H10F30/00; H10F30/20; H10F30/21; H10F30/22; H10F30/221; H10F77/00; H10F77/30; H10F77/306; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02E10/547; Y02P; Y02P70/00; Y02P70/50; Y10; Y10S; Y10S438/00; Y10S438/928; Y10S438/965

Claims Analysis

Total Claims: 21
Claim 1
Independent Claim 147 words
A method of manufacturing a light-receiving diode comprising the steps of: (a) forming on one principal surface, of a pair of principal surfaces of a semiconductor substrate of a first conductivity type, an oxide film having a window at an electrode forming part; (b) implanting impurity ions of a second conductivity type into said one principal surface through said oxide film; (c) selectively forming a layer of aluminum on the other principal surface, of the pair of prinicpal surfaces of the semiconductor substrate; and (d) heat-treating (1) said substrate to activate the implanted ions in the one principal surface, thereby producing an impurity-doped region having a low sheet resistance at said electrode forming part but having a relatively high sheet resistance at the remaining part, and (2) the layer of aluminum on the other principal surface of the substrate to diffuse aluminum into the other principal surface.
Claim 2
Independent Claim 147 words
A method of manufacturing a light-receiving diode comprising the steps of: (a) forming on one principal surface, of a pair of principal surfaces of a semiconductor substrate of a first conductivity type, an oxide film having a window at an electrode forming part; (b) implanting impurity ions of a second conductivity type into said one principal surface through said oxide film; (c) selectively forming a layer of aluminum on the other principal surface, of the pair of prinicpal surfaces of the semiconductor substrate; and (d) heat-treating (1) said substrate to activate the implanted ions in the one principal surface, thereby producing an impurity-doped region having a low sheet resistance at said electrode forming part but having a relatively high sheet resistance at the remaining part, and (2) the layer of aluminum on the other principal surface of the substrate to diffuse aluminum into the other principal surface.
Claim 3
Dependent Claim 31 words
A method as claimed in claim 1, further comprising the step of depositing an electrode on said impurity-doped region through the window of said oxide film formed in said step (a).
Claim 4
Dependent Claim 41 words
A method as claimed in claim 1, wherein the aluminum is diffused into the other principal surface so as to produce a region of the first conductivity type in the substrate having a higher impurity concentration than that of said substrate.
Claim 5
Dependent Claim 50 words
A method as claimed in claim 1, wherein said heat-treating sid substrate and said heat-treating the layer of aluminum is performed in a signle step, whereby the activation of the implanted ions in the one principal surface and the diffusion of aluminum into the other principal surface are performed simultaneously.
Claim 6
Dependent Claim 57 words
A method as claimed in claim 1, wherein the selective forming of a layer of aluminum is a selective forming of a layer of aluminum paste, the heat-treating of the layer of aluminum being a heat-treating of the layer of aluminum paste so as to bake the aluminum paste and diffuse aluminum into the other principal surface.
Claim 7
Dependent Claim 51 words
A method as claimed in claim 5, wherein said heat-treating said substrate and said heat-treating the layer of aluminum paste is performed in a single step, whereby the activation of the implanted ions in the one principal surface and the diffusion of aluminum into the other principal surface are performed simultaneously.
Claim 8
Dependent Claim 25 words
A method as claimed in claim 5, wherein said aluminum paste layer has a window for enhancing contact of an electrode to be formed thereafter.
Claim 9
Dependent Claim 27 words
A method as claimed in claim 7, further comprising the step of forming a pattern of silver paste on the other principal surface of the heat-treated substrate.
Claim 10
Dependent Claim 28 words
A method as claimed in claim 1, wherein said oxide film is retained on said semiconductor substrate during the heat-treating, the oxide film acting as a passivation film.
Claim 11
Dependent Claim 18 words
A method as claimed in claim 9, wherein said oxide film has a thickness of about 100 Å.
Claim 12
Dependent Claim 21 words
A method as claimed in claim 1, wherein said heat-treating step includes conveying the substrate on a belt through a furnace.
Claim 13
Independent Claim 116 words
A method of manufacturing a light-receiving diode comprising the steps of: (a) forming, on one principal surface of a pair of principal surfaces of a semiconductor substrate of a first conductivity type, an oxide film having a window at an electrode forming part; (b) implanting impurity ions of a second conductivity type into said one principal surface through said oxide film; (c) selectively forming a layer of aluminum on the other principal surface of the pair of principal surfaces; and (d) heat-treating said substrate to activate the implanted ions, thereby forming a pn-junction which is deep beneath said electrode forming part but shallow beneath the remaining part, and to diffuse aluminum into the other principal surface.
Claim 14
Independent Claim 116 words
A method of manufacturing a light-receiving diode comprising the steps of: (a) forming, on one principal surface of a pair of principal surfaces of a semiconductor substrate of a first conductivity type, an oxide film having a window at an electrode forming part; (b) implanting impurity ions of a second conductivity type into said one principal surface through said oxide film; (c) selectively forming a layer of aluminum on the other principal surface of the pair of principal surfaces; and (d) heat-treating said substrate to activate the implanted ions, thereby forming a pn-junction which is deep beneath said electrode forming part but shallow beneath the remaining part, and to diffuse aluminum into the other principal surface.
Claim 15
Dependent Claim 31 words
A method as claimed in claim 12, further comprising the step of depositing an electrode on said impurity-doped region through the window of said oxide film formed in said step (a).
Claim 16
Dependent Claim 18 words
A method as claimed in claim 12, wherein the layer of aluminum is a layer of aluminum paste.
Claim 17
Dependent Claim 28 words
A method as claimed in claim 14, wherein the heat-treating is a single step, whereby the activation of the implanted ions and diffusion of aluminum are performed simultaneously.
Claim 18
Independent Claim 138 words
A method of manufacturing a light-receiving diode comprising the steps of: (a) forming, on one principal surface of a pair of principal surfaces of a semiconductor substrate of a first conductivity type, a film having a window at an electrode forming part and exerting a retarting action to implanting ions; (b) implanting impurity ions of a second conductivity type into said one principal surface through said film; (c) selectively forming a layer of aluminum on the other principal surface of the pair of principal surfaces; and (d) heat-treating said substrate to activate the ions implanted into said one principal surface, thereby producing an impurity-doped region having a lower sheet resistance and a deeper depth at said electrode forming part than at the remaining part, and to diffuse aluminum to form an aluminum-doped region in the other principal surface.
Claim 19
Independent Claim 138 words
A method of manufacturing a light-receiving diode comprising the steps of: (a) forming, on one principal surface of a pair of principal surfaces of a semiconductor substrate of a first conductivity type, a film having a window at an electrode forming part and exerting a retarting action to implanting ions; (b) implanting impurity ions of a second conductivity type into said one principal surface through said film; (c) selectively forming a layer of aluminum on the other principal surface of the pair of principal surfaces; and (d) heat-treating said substrate to activate the ions implanted into said one principal surface, thereby producing an impurity-doped region having a lower sheet resistance and a deeper depth at said electrode forming part than at the remaining part, and to diffuse aluminum to form an aluminum-doped region in the other principal surface.
Claim 20
Dependent Claim 18 words
A method as claimed in claim 16, wherein the layer of aluminum is a layer of aluminum paste.
Claim 21
Dependent Claim 28 words
A method as claimed in claim 17, wherein the heat-treating is a single step, whereby the activation of the implanted ions and diffusion of aluminum are performed simultaneously.

References Cited (Backward Citations)

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US3945856A Cited
US4029518A Cited
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US4152824A Cited
US4426234A Cited
US4505023A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-07-19 1992-01-18 1992-07-19 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-07-19 1996-01-18 1996-07-19 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-07-19 2000-01-18 2000-07-19 $7700.00 Window Closed / Lapsed

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