High voltage MOS transistor

Claim 1

An high voltage metal oxide semiconductor device comprising: a semiconductor substrate having a conductivity of a first type; a source region having a conductivity of a second type opposite to that of said semiconductor substrate; a channel region of the same conductivity type as said semiconductor substrate formed adjacent to and substantially surrounding said source region; a field dope region positioned lateral to said channel region having a conductivity the same as said first type; a high resistance region of said second type conductivity medial to and spaced from said channel region; a first insulating layer overlying said channel region and said high resistance region; a drain region having a conductivity of said second type opposite that of said semiconductor substrate lateral to said high resistance region opposite said source region; a drain electrode connected to said drain region; a source electrode connected to said source region, said channel region and said field dope region; a gate-electrode formed above said channel region having a first portion of said first insulating layer interpositioned therebetween; and conductive covering means for covering said high resistance region so as to enhance the sustained-voltage characteristics of said MOS device, said covering means comprising at least one floating conductive element and a field plate means, said at least one floating conductive element not being connected to either of said drain electrode, source electrode, and gate electrode, whereas said field plate means is connected to at least one of said drain electrode, source electrode, and gate electrode; said first insulating layer having a second portion interpositioned between said covering means and said high resistance region with a thickness of about 1.0 micron or greater but at least thicker than said first portion of said first insulating layer overlying said channel portion beneath said gate-electrode.