Method for fabrication of n-channel MIS device

Claim 3

In a method for fabricating an n-channel MIS device comprising the steps of: (a) selectively forming a predetermined insulator film on a selected area of the upper surface of a p-type semiconductor except for first and second surface portions in which source and drain regions are to be respectively formed and including at least a third surface portion in which a channel between the source and drain regions is to be provided, the portion of said insulator film on said third surface portion providing a gate insulator film; (b) introducing a first n-type impurity into said first and second surface portions of said substrate by using said insulator film as a mask so as to form source and drain regions respectively therein; and (c) forming a first silicate glass film on an upper surface of the resultant substrate; the improvement comprising the combination of steps for providing metal contacts for the source, drain and gate of said MIS device, while preventing a change in the conductivity characteristics of the source and drain regions as well as the introduction of impurities into said predetermined insulator film comprising the steps of (d) forming first, second and third windows in those portions of said first silicate glass film the respective parts of which correspond to said source region, said drain region and said gate insulator film; (e) introducing a second n-type impurity through said first and second windows to form n-type high impurity concentration regions respectively in the surface portions of the substrate exposed by said first and second windows, a second silicate glass film being simultaneously formed on an upper surface of the resulant substrate; (f) selectively removing said second silicate glass film, leaving at least those portions of said second silicate glass film which lie on the upper surface portions of the substrate and on side wall portions of said first, second and third windows in said first silicate glass film; and

Claim 4

In a method for fabricating an n-channel MIS device comprising the steps of: (a) selectively forming a predetermined insulator film on a selected area of the upper surface of a p-type semiconductor except for first and second surface portions in which source and drain regions are to be respectively formed and including at least a third surface portion in which a channel between the source and drain regions is to be provided, the portion of said insulator film on said third surface portion providing a gate insulator film; (b) introducing a first n-type impurity into said first and second surface portions of said substrate by using said insulator film as a mask so as to form source and drain regions respectively therein; and (c) forming a first silicate glass film on an upper surface of the resultant substrate; the improvement comprising the combination of steps for providing metal contacts for the source, drain and gate of said MIS device, while preventing a change in the conductivity characteristics of the source and drain regions as well as the introduction of impurities into said predetermined insulator film comprising the steps of (d) forming first, second and third windows in those portions of said first silicate glass film the respective parts of which correspond to said source region, said drain region and said gate insulator film; (e) introducing a second n-type impurity through said first and second windows to form n-type high impurity concentration regions respectively in the surface portions of the substrate exposed by said first and second windows, a second silicate glass film being simultaneously formed on an upper surface of the resulant substrate; (f) selectively removing said second silicate glass film, leaving at least those portions of said second silicate glass film which lie on the upper surface portions of the substrate and on side wall portions of said first, second and third windows in said first silicate glass film; and

Claim 5

(g) providing metal contacts in said first, second and third windows respectively.

Claim 6

(g) providing metal contacts in said first, second and third windows respectively.

Claim 7

The improvement according to claim 2, wherein said first and second silicate glass films are phosphosilicate glass films.