Patent US4720442A successfully refreshed from Google Patents.
← Back to Patent Explorer
US4720442A Expired / Lapsed US ⏱️ 0.0 years remaining

Photomask blank and photomask

Assignee: AGC Inc
•
Filing: 1986-05-27
•
Granted: 1988-01-19
•
Expires: 2006-05-27
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A photomask blank comprising a transparent substrate and at least two layers including a masking layer and an antireflection layer, formed thereon, wherein said masking layer is a chromium masking layer containing more than 25% by atomic ratio of nitrogen, and said antireflection layer is a chromium oxide antireflection layer containing more than 25% by atomic ratio of nitrogen.

Inventors

  • 👤 Norihiko Shinkai
  • 👤 Takeshi Haranoh
  • 👤 Junetsu Kanazawa
  • 👤 Takashi Hatano

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 11:43
CPC Classifications
G; G03; G03F; G03F1/00; G03F1/38; G03F1/46; G03F1/50; G03F1/54

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 71 words
A photomask blank comprising a transparent substrate and at least two layers including a masking layer and an antireflection layer, formed thereon, wherein said masking layer is a chromium masking layer containing from more than 25% to not more than 50% by atomic ratio of nitrogen, and said antireflection layer is a chromium oxide antireflection layer containing from more than 25% to not more than 40% by atomic ratio of nitrogen.
Claim 2
Dependent Claim 71 words
A photomask blank comprising a transparent substrate and at least two layers including a masking layer and an antireflection layer, formed thereon, wherein said masking layer is a chromium masking layer containing from more than 25% to not more than 50% by atomic ratio of nitrogen, and said antireflection layer is a chromium oxide antireflection layer containing from more than 25% to not more than 40% by atomic ratio of nitrogen.
Claim 3
Dependent Claim 16 words
The photomask blank according to claim 1, wherein the chromium masking layer contains boron or carbon.
Claim 4
Dependent Claim 32 words
The photomask blank according to claim 1, wherein the chromium masking layer contains from 1 to 20% by atomic ratio of boron, or from 5 to 30% by atomic ratio of carbon.
Claim 5
Dependent Claim 35 words
The photomask blank according to claim 2, wherein a chromium layer containing more than 25% by atomic ratio of nitrogen is formed on the transparent substrate, as an under layer beneath the chromium masking layer.
Claim 6
Dependent Claim 20 words
The photomask blank according to claim 4, wherein the under layer has a thickness of from 50 to 300 Å.
Claim 7
Dependent Claim 34 words
The photomask blank according to claim 1, wherein the antireflection layer is formed on the transparent substrate and beneath the chromium masking layer, and another antireflection layer is formed on the chromium masking layer.
Claim 8
Dependent Claim 72 words
A photomask comprising a transparent substrate and at least two patternized layers including a patternized masking layer and a patternized antireflection layer, formed thereon, wherein said masking layer is a chromium masking layer containing from more than 25% to not more than 50% by atomic ratio of nitrogen, and said antireflection layer is a chromium oxide antireflection layer containing from more than 25% to not more than 40% atomic ratio of nitrogen.
Claim 9
Dependent Claim 72 words
A photomask comprising a transparent substrate and at least two patternized layers including a patternized masking layer and a patternized antireflection layer, formed thereon, wherein said masking layer is a chromium masking layer containing from more than 25% to not more than 50% by atomic ratio of nitrogen, and said antireflection layer is a chromium oxide antireflection layer containing from more than 25% to not more than 40% atomic ratio of nitrogen.
Claim 10
Dependent Claim 15 words
The photomask according to claim 7, wherein the chromium masking layer contains boron or carbon.
Claim 11
Dependent Claim 31 words
The photomask according to claim 7, wherein the chromium masking layer contains from 1 to 20% by atomic ratio of boron, or from 5 to 30% by atomic ratio of carbon.
Claim 12
Dependent Claim 34 words
The photomask according to claim 8, wherein a chromium layer containing more than 25% by atomic ratio of nitrogen is formed on the transparent substrate, as an under layer beneath the chromium masking layer.
Claim 13
Dependent Claim 19 words
The photomask according to claim 10, wherein the under layer has a thickness of from 50 to 300 Å.
Claim 14
Dependent Claim 33 words
The photomask according to claim 7, wherein the antireflection layer is formed on the transparent substrate and beneath the chromium masking layer, and another antireflection layer is formed on the chromium masking layer.

References Cited (Backward Citations)

US4363846A Cited
US4530891A Cited
US4374912A Cited
US4497878A Cited
JPS5990852A Cited
US4563407A Cited
JPS60182439A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-01-18 1991-07-20 1992-01-19 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-01-18 1995-07-20 1996-01-19 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-01-18 1999-07-20 2000-01-19 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag