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US4657845A Expired / Lapsed US ⏱️ 0.0 years remaining

Positive tone oxygen plasma developable photoresist

Assignee: International Business Machines Corp
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Filing: 1986-01-14
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Granted: 1987-04-14
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Expires: 2006-01-14
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Abstract

Abstract A positive tone photoresist is obtained without a solvent development step. The resist is a polymer containing masked reactive functionality which is imagewise exposed to unmask the functionality then treated with a non-organometallic reagent to remask that functionality. Following flood exposure, the resist is treated with an organometallic reagent containing an element which forms a non-volatile oxide. It is then developed by means of oxygen reactive ion etching.

Inventors

  • 👤 Jean M. J. Frechet
  • 👤 Hiroshi Ito
  • 👤 Scott A. MacDonald
  • 👤 Carlton G. Willson

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 15:40
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/26; G03F7/265; G03F7/004; G03F7/039

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 114 words
A process for producing a positive tone oxygen plasma developable photoresist, said process comprising the steps of: (1) coating a substrate with a polymer containing a masked reactive functionality, (2) exposing to radiation and processing said polymer in an imagewise manner to unmask selected portions of said reactive functionality, (3) treating the polymer with a non-organometallic species which reacts with the unmasked functionality, (4) flood exposing to radiation the polymer and processing it to unmask the reactive functionality which remains in the polymer, (5) treating the polymer with an organometallic material containing an element which forms a non-volatile oxide, and (6) developing the system by oxygen etching to obtain a positive tone relief image.
Claim 2
Dependent Claim 114 words
A process for producing a positive tone oxygen plasma developable photoresist, said process comprising the steps of: (1) coating a substrate with a polymer containing a masked reactive functionality, (2) exposing to radiation and processing said polymer in an imagewise manner to unmask selected portions of said reactive functionality, (3) treating the polymer with a non-organometallic species which reacts with the unmasked functionality, (4) flood exposing to radiation the polymer and processing it to unmask the reactive functionality which remains in the polymer, (5) treating the polymer with an organometallic material containing an element which forms a non-volatile oxide, and (6) developing the system by oxygen etching to obtain a positive tone relief image.
Claim 3
Dependent Claim 21 words
A process as claimed in claim 1, wherein the polymer with masked reactive functionality has recurrent pendant groups that undergo acidolysis.
Claim 4
Dependent Claim 14 words
A process as claimed in claim 1, wherein the non-organometallic species is an isocyanate.
Claim 5
Dependent Claim 15 words
A process as claimed in claim 1, wherein the organometallic species is a silicon compound.
Claim 6
Dependent Claim 15 words
A process as claimed in claim 1, wherein the organometallic species is a tin compound.
Claim 7
Dependent Claim 13 words
A process as claimed in claim 4, wherein the silicon compound is hexamethyldisilazane.
Claim 8
Dependent Claim 13 words
A process as claimed in claim 4, wherein the silicon compound is N,N-Dimethylaminotrimethylsilane.
Claim 9
Dependent Claim 15 words
A process as claimed in claim 1, wherein the polymer is baked after imagewise exposure.
Claim 10
Dependent Claim 25 words
A process as claimed in claim 1, wherein a photoinitiator is added to the polymer resist to assist in the unmasking of the reactive functionality.
Claim 11
Dependent Claim 15 words
A process as in claim 9, wherein the photoinitiator is triphenylsulfonium hexafluoroarsenate or tripheylsulfonium hexafluoroantimonate.

References Cited (Backward Citations)

US4396704A Cited
US4481279A Cited
US4426247A Cited
US4491628A Cited
US4433044A Cited
US4596761A Cited
US4507331A Cited
US4613398A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-04-13 1990-10-13 1991-04-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-04-13 1994-10-13 1995-04-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-04-13 1998-10-13 1999-04-14 $7700.00 Window Closed / Lapsed

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