Abstract This invention provides a process, and delineates typical materials to be used in that process, which enables the use of a precision radiation source to produce a microcircuit resist image accurate to a few micrometers or even fractions of a micrometer. In addition, the process of the invention provides for the dry development of this image, thus insuring the ability to create a finished resist structure exhibiting the same accuracy in dimensions. Specifically, the invention provides a process in which a positive or negative resist polymer is irradiated under low pressure using a precision radiation source such as an electron beam, masked ion beam, or focused ion beam to generate organic free radicals. After irradiation, the reactive resist polymer is exposed to oxygen or air to create peroxides or hydroperoxides. The peroxides or hydroperoxides are later thermally decomposed to generate organic free radicals which can be reacted with a silicon-containing organic molecule which contains at least one vinyl or other functional group capable of reacting with the organic free radical. The resulting copolymer resist then includes a latent image containing silicon, which can be dry developed using plasma or reactive ion etching techniques. In another embodiment of this invention, an intermediary non-silicon-containing organic molecule is grafted to the active sites on the resist polymer. The organic molecule is then reacted with a silicon-containing compound, so that it becomes a grafting intermediary between the initial polymeric resist and the silicon-containing compound.
A method of producing a negative resist structure, which can be created utilizing a dry development process, comprising: (a) applying a polymeric resist film to a substrate; (b) irradiating said polymeric resist film using a precision radiation source selected from the group consisting of a scanning electron beam, masked ion beam and focused ion beam, at low pressure applied in a predetermined pattern at a dosage dependent on the reactivity of said polymeric resist film, thereby generating free radicals which lead to the formation of active sites which are capable of being converted to at least one of the class of peroxides and hydroperoxides on exposure to an oxygen-containing atmosphere; (c) exposing said irradiated polymeric resist film to an oxygen-containing atmosphere in order to convert at least a substantial proportion of said free radical active sites to at least one of the class of peroxides and hydroperoxides; (d) thermally decomposing said class of peroxides and hydroperoxides to create free radicals associated with said polymeric resist film, and reacting such free radicals with a non-silicon-containing organic molecule which includes at least one functional group capable of reacting with said free radicals and at least one functional group capable of reacting with the desired silicon-containing compound; (e) reacting said grafted resist film with said desired silicon-containing compound, so that said non-silicon-containing molecule acts as a grafting intermediary between said initial polymeric resist film and said silicon-containing compound; and (f) developing the irradiated, grafted resist into the desired negative resist structure utilizing an etching technique comprising an oxygen-containing plasma or reactive ion to remove the non-irradiated portion of said resist.
Claim 2
Independent Claim
267 words
A method of producing a negative resist structure, which can be created utilizing a dry development process, comprising: (a) applying a polymeric resist film to a substrate; (b) irradiating said polymeric resist film using a precision radiation source selected from the group consisting of a scanning electron beam, masked ion beam and focused ion beam, at low pressure applied in a predetermined pattern at a dosage dependent on the reactivity of said polymeric resist film, thereby generating free radicals which lead to the formation of active sites which are capable of being converted to at least one of the class of peroxides and hydroperoxides on exposure to an oxygen-containing atmosphere; (c) exposing said irradiated polymeric resist film to an oxygen-containing atmosphere in order to convert at least a substantial proportion of said free radical active sites to at least one of the class of peroxides and hydroperoxides; (d) thermally decomposing said class of peroxides and hydroperoxides to create free radicals associated with said polymeric resist film, and reacting such free radicals with a non-silicon-containing organic molecule which includes at least one functional group capable of reacting with said free radicals and at least one functional group capable of reacting with the desired silicon-containing compound; (e) reacting said grafted resist film with said desired silicon-containing compound, so that said non-silicon-containing molecule acts as a grafting intermediary between said initial polymeric resist film and said silicon-containing compound; and (f) developing the irradiated, grafted resist into the desired negative resist structure utilizing an etching technique comprising an oxygen-containing plasma or reactive ion to remove the non-irradiated portion of said resist.
Claim 3
Dependent Claim
27 words
The process of claim 1 wherein said polymers to be used to create said resist film are selected from the group consisting of poly(vinyl acetate) and polyisobutylene.
Claim 4
Dependent Claim
19 words
The process of claim 1 wherein said non-silicon-containing organic molecule used as the intermediary grafting agent is acrylic acid.
Claim 5
Dependent Claim
19 words
The process of claim 1 wherein said silicon-containing compound to be grafted to said intermediary grafting agent is hexamethyldisilazane.