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US4301231A Expired / Lapsed US ⏱️ 0.0 years remaining

Negative resist for high energy radiation

Assignee: Toray Industries Inc
•
Filing: 1980-02-15
•
Granted: 1981-11-17
•
Expires: 2000-02-15
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Abstract

Abstract Negative resist materials comprising soluble, film-forming polymers with side branches containing vinyl silyl groups are used for pattern generation on exposure to high energy radiation such as electron beams or X-rays.

Inventors

  • 👤 Yuji Atarashi
  • 👤 Mutsuo Kataoka

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-25 00:20
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/075; G03F7/0757; G03F7/0758

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 65 words
A resist material capable of forming a negative image by application of radiation, said material comprising an organic polymer with branches at least some of which contain vinyl silyl groups and are represented by the formula ##STR11## wherein R 1 is a divalent organic bonding, R 2 is a monovalent organic group other than vinyl group and n is an integer of 1 to 3.
Claim 2
Dependent Claim 65 words
A resist material capable of forming a negative image by application of radiation, said material comprising an organic polymer with branches at least some of which contain vinyl silyl groups and are represented by the formula ##STR11## wherein R 1 is a divalent organic bonding, R 2 is a monovalent organic group other than vinyl group and n is an integer of 1 to 3.
Claim 3
Dependent Claim 33 words
The resist material as defined in claim 1, in which said polymer contains at least 3×10 -5 equivalent per gram thereof of vinyl silyl group-containing branches as vinyl groups attached to silicon atoms.
Claim 4
Dependent Claim 22 words
The resist material as defined in claim 1, in which the weight average molecular weight of said polymer is at least 2,000.
Claim 5
Dependent Claim 69 words
The resist material as defined in claim 1, in which said R 1 is Z-R 3 where Z, which is bonded to the main polymer chain, is --COO--, --OCO--, --CONH--, --CH 2 OCO-- or --OCH 2 CH 2 OCO--, and R 3 is --CH 2 -- 1-8 , --CH═CH--, --C.tbd.C--, --CH 2 --C.tbd.C--, ##STR12## phenylene, or any of these bondings with hydrogens partially substituted by alkyl or aryl group.
Claim 6
Dependent Claim 32 words
The resist material as defined in claim 1, in which the main polymer chain of said polymer comprises carbonaceous chain, polyether, polyimine, polysulfide, polyamide, polyester, polyurethane, polycarbonate, polyurea, cellulose, amylose, or dextrane.

References Cited (Backward Citations)

US2982757A Cited
US3657164A Cited
US4151158A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1984-11-16 1985-05-18 1985-11-17 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1988-11-16 1989-05-18 1989-11-17 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1992-11-16 1993-05-18 1993-11-17 $7700.00 Window Closed / Lapsed

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