Junction isolated IC with thick EPI portion having sides at least 20 degrees from (110) orientations

Claim 2

A semiconductor device comprising: a semiconductor substrate having a first conductivity type and having a surface on one of (a) the (100) crystal plane and (b) a plane inclined within 5° against the (100) crystal plane; a dent provided on a surface region of said substrate; a highly doped layer having a second conductivity type opposite to the first conductivity type, provided on a surface region of said substrate in a portion of said dent and extending on a surface region of said substrate from a peripheral portion of said dent; and a semiconductor layer having the second conductivity type, having a lower impurity concentration than that of said highly doped layer and provided on the surface of said substrate, said semiconductor layer filling up said dent and having a substantially flat surface, thereby said semiconductor layer having a thick portion on said dent and a thin portion on the surface of said substrate other than said dent, wherein said dent has a polygonal shape having main sides, each of which is parallel to at least one specific direction selected from a direction of the <100> crystal axis and directions inclined within 25° against the <100> crystal axis.

Claim 3

A semiconductor device as set forth in claim 1, wherein a highly doped region having the second conductivity type and having a higher impurity concentration than that of said semiconductor layer is provided so as to extend from the surface of said semiconductor layer to the extended portion of said highly doped layer in the peripheral portion of said dent.

Claim 4

A semiconductor device comprising: a semiconductor substrate having a first conductivity type and having a surface on one of (a) the (100) crystal plane and (b) a plane inclined within 5° against the (100) crystal plane; a dent provided on a surface region of said substrate; a highly doped layer having a second conductivity type opposite to the first conductivity type, provided on a surface region of said substrate in a portion of said dent and extending on a surface region of said substrate from a peripheral portion of said dent; and a semiconductor layer having the second conductivity type, having a lower impurity concentration than that of said highly doped layer and provided on the surface of said substrate, said semiconductor layer filling up said dent and having a substantially flat surface, thereby said semiconductor layer having a thick portion on said dent and a thin portion on the surface of said substrate other than said dent, and means to prevent inclined planes from appearing above said substantially flat surface during etching, comprising said dent with a polygonal shape having main sides, each of which is parallel to at least one specific direction selected from a direction of the <100> crystal axis and directions inclined within 25° against the <100> crystal axis.

Claim 5

A semiconductor device comprising: a semiconductor substrate having a first conductivity type and having a surface on one of (a) the (100) crystal plane and (b) a plane inclined within 5° against the (100) crystal plane; a dent provided on a surface region of said substrate; a highly doped layer having a second conductivity type opposite to the first conductivity type, provided on a surface region of said substrate in a portion of said dent and extending on a surface region of said substrate from a peripheral portion of said dent; and a semiconductor layer having the second conductivity type, having a lower impurity concentration than that of said highly doped layer and provided on the surface of said substrate, said semiconductor layer filling up said dent and having a substantially flat surface, thereby said semiconductor layer having a thick portion on said dent and a thin portion on the surface of said substrate other than said dent, and means to prevent inclined planes from appearing above said substantially flat surface during etching, comprising said dent with a polygonal shape having main sides, each of which is parallel to at least one specific direction selected from a direction of the <100> crystal axis and directions inclined within 25° against the <100> crystal axis.

Claim 6

A semiconductor device as set forth in claim 1 wherein said substrate is a silicon substrate of one conductor type and the semiconductor layer is an epitaxial silicon layer of a conductor type opposite to that of the substrate.

Claim 7

A semiconductor device as set forth in claim 4 wherein an impurity zone of the same conductor type as that of the substrate is formed so that said impurity zone extends from the surface of the epitaxial silicon layer to the surface of the substrate outside said dent and an island region is formed so that the island region is surrounded by said impurity zone and independently separated in the epitaxial silicon layer.

Claim 8

A semiconductor device as set forth in claim 5 wherein a semiconductor element requiring a high breakdown voltage is mounted on a first island region composed of the thick portion of the epitaxial silicon layer on said dent.

Claim 9

A semiconductor device as set forth in claim 5 or 6 wherein a semiconductor element not requiring a high breakdown voltage is mounted on a second island region composed of the thin portion of the epitaxial silicon layer outside said dent.