Integrated fabrication method of forming connectors through insulative layers

Claim 2

In integrated circuit fabrication, a method of forming metallic connectors through a layer of electrically insulative material and a metallization pattern for connecting such connectors on said layer comprising forming a layer of electrically insulative material on a substrate, forming on said insultative layer, a mask of photoresist material having a plurality of openings through which said insulative layer is exposed, etching to selectively remove the exposed insulative layer to form insulative layer openings through which the underlying substrate is exposed, depositing a first layer of metal over the masked substrate, said metal layer being thinner than said insulative layer whereby said insulative layer openings are partially filled with metal, removing said photoresist mask to thereby remove the metal layer deposited on said photoresist with only the metal deposited in said insulative layer openings remaining, depositing a second layer of metal over said first insulative layer and the metal remaining in said openings, and selectively removing portions of said second metal layer over said insulative layer to form said metallization pattern connected to the metal remaining in said openings.

Claim 3

The method of claim 1 wherein said etching is chemical etching.

Claim 4

The method of claim 1 wherein said etching step is carried out by RF sputter etching.

Claim 5

The method of claim 3 wherein said RF sputter etching utilizes reactive ions.

Claim 6

The method of claim 1 wherein said photoresist mask is removed by the steps of applying a sheet having a contact adhesive surface to said first layer of metal, and removing said sheet to selectively remove those portions of said second metal layer over said photoresist together with said photoresist.

Claim 7

The method of claim 5 wherein said sheet is adhesive-coated tape.

Claim 8

The method of claim 1 wherein said initial substrate on which said insulative layer is formed comprises metallization on a substrate insulative layer on the surface of a semiconductor member.

Claim 9

In integrated circuit fabrication, a method of forming metallic connectors through a layer of electrically insulative material and a metallization pattern for connecting such connectors on said layer comprising forming a first layer of electrically insulative material on a substrate, forming on said first insulative layer, a mask of photoresist material having a plurality of openings through which said insulative layer is exposed, etching to selectively remove the exposed insulative layer to form insulative layer openings through which the underlying substrate is exposed, depositing a first layer of metal over the masked substrate said metal layer being thinner than said insulative layer whereby said insulative layer openings are partially filled with metal, removing said phototresist mask to thereby remove the metal layer deposited on said photoresist with only the metal deposited in said insulative layer openings remaining, forming a second layer of electrically inslulative material over said first insulative layer and remaining metal, forming a plurality of openings through said second insulative layer respectively in registration with said openings in said first insulative layer to expose the metal remaining in said first layer openings, depositing a second layer of metal over said second insulative layer and said remaining metal exposed in said second insulative layer openings, and selectively removing portions of said second metal layer over said second insulative layer to form said metallization pattern connected to the remaining metal exposed in said second insulative layer openings.

Claim 10

In integrated circuit fabrication, a method of forming metallic connectors through a layer of electrically insulative material and a metallization pattern for connecting such connectors on said layer comprising forming a first layer of electrically insulative material on a substrate, forming on said first insulative layer, a mask of photoresist material having a plurality of openings through which said insulative layer is exposed, etching to selectively remove the exposed insulative layer to form insulative layer openings through which the underlying substrate is exposed, depositing a first layer of metal over the masked substrate said metal layer being thinner than said insulative layer whereby said insulative layer openings are partially filled with metal, removing said phototresist mask to thereby remove the metal layer deposited on said photoresist with only the metal deposited in said insulative layer openings remaining, forming a second layer of electrically inslulative material over said first insulative layer and remaining metal, forming a plurality of openings through said second insulative layer respectively in registration with said openings in said first insulative layer to expose the metal remaining in said first layer openings, depositing a second layer of metal over said second insulative layer and said remaining metal exposed in said second insulative layer openings, and selectively removing portions of said second metal layer over said second insulative layer to form said metallization pattern connected to the remaining metal exposed in said second insulative layer openings.

Claim 11

The method of claim 8 wherein said etching is chemical etching.

Claim 12

The method of claim 8 wherein said photoresist mask is removed by the steps of applying a sheet having a contact adhesive surface to said first layer of metal, and removing said sheet to selectively remove those portions of said second metal layer over said photoresist.

Claim 13

The method of claim 10 wherein said sheet is adhesive-coated tape.

Claim 14

The method of claim 8 wherein the openings through said second insulative layer have smaller lateral dimensions than the openings through said first insulative layer, thereby facilitating registration.

Claim 15

The method of claim 8 wherein said second insulative layer is thicker than said first insulative layer.

Claim 16

The method of claim 8 wherein the openings through said second insulative layer are formed by etching through a photoresist mask.

Claim 17

The method of claim 8 wherein said initial substrate on which said first insulative layer is formed comprises metallization on a substrate insulative layer on the surface of a semiconductor member.