Patent Explorer
Browse, filter, and analyze 946 patents across global jurisdictions.
| Patent Number | Title | Assignee | Status | Filing Date | Grant Date | Expires | Remaining | Claims | Actions |
|---|---|---|---|---|---|---|---|---|---|
| EP0050005A2 | Semiconductor memory with improved data programming time | Toshiba Corp | Expired / Lapsed | 1981-10-07 | โ | 2001-10-07 | 0.0 yrs | 28 | |
| US20020001905A1 | Vertical nano-size transistor using carbon nanotubes and manufacturing method thereof | Samsung Electronics Co Ltd | Expired / Lapsed | 2001-06-27 | โ | 2021-06-27 | 0.0 yrs | 16 | |
| JPS63122148A | Manufacture of semiconductor device | Fujitsu Ltd | Expired / Lapsed | 1986-11-11 | โ | 2006-11-11 | 0.0 yrs | 0 | |
| GB500344A | Improvements in and relating to dry surface-contact electric rectifiers | British Thomson Houston Co Ltd | Expired / Lapsed | 1938-09-21 | โ | 1958-09-21 | 0.0 yrs | 0 | |
| GB500342A | Improvements relating to dry surface-contact electric rectifiers | British Thomson Houston Co Ltd | Expired / Lapsed | 1938-09-19 | โ | 1958-09-19 | 0.0 yrs | 0 | |
| EP0165865A2 | Method and apparatus for testing integrated circuits | Fairchild Semiconductor Corp | Expired / Lapsed | 1985-06-14 | โ | 2005-06-14 | 0.0 yrs | 65 | |
| DE19603107A1 | Self pre-ageing circuit device for semiconductor memory e.g. application specific memory | SK Hynix Inc | Expired / Lapsed | 1996-01-29 | โ | 2016-01-29 | 0.0 yrs | 0 | |
| GB2042296A | Nonvolatile static random access method and memory device | Xicor LLC | Expired / Lapsed | 1980-01-16 | โ | 2000-01-16 | 0.0 yrs | 14 | |
| GB1313486A | Oesophagus probe | Siemens Corp | Expired / Lapsed | 1971-04-19 | โ | 1991-04-19 | 0.0 yrs | 0 | |
| EP0020116A1 | Masterslice semiconductor device and method of producing it | Fujitsu Ltd | Expired / Lapsed | 1980-05-23 | โ | 2000-05-23 | 0.0 yrs | 8 | |
| GB1469486A | Testing semiconductor devices | International Business Machines Corp | Expired / Lapsed | 1974-05-01 | โ | 1994-05-01 | 0.0 yrs | 0 | |
| WO1979000724A1 | Amorphous semiconductors equivalent to crystalline semiconductors | Energy Conversion Devices Inc | Expired / Lapsed | 1979-03-02 | โ | 1999-03-02 | 0.0 yrs | 0 | |
| EP0051158A1 | Electrically alterable double dense memory | International Business Machines Corp | Expired / Lapsed | 1981-10-05 | โ | 2001-10-05 | 0.0 yrs | 14 | |
| DE1105526B | Method for manufacturing a semiconductor device | Siemens Corp | Expired / Lapsed | 1959-12-29 | โ | 1979-12-29 | 0.0 yrs | 0 | |
| JPS60175477A | Laser light amplifier | Hoya Corp | Expired / Lapsed | 1984-02-21 | โ | 2004-02-21 | 0.0 yrs | 0 | |
| JPS63166219A | Manufacture of semiconductor device | Toshiba Corp | Expired / Lapsed | 1986-12-26 | โ | 2006-12-26 | 0.0 yrs | 0 | |
| DE1156510B | Semiconductor component with an essentially monocrystalline semiconductor body and four zones of alternating conductivity type and method for manufacturing | Siemens Corp | Expired / Lapsed | 1961-05-09 | โ | 1981-05-09 | 0.0 yrs | 0 | |
| GB738216A | Improvements in and relating to broad area transistors | General Electric Co | Expired / Lapsed | 1953-06-15 | โ | 1973-06-15 | 0.0 yrs | 0 | |
| GB809877A | Materials for and methods of manufacturing semiconductor devices | Texas Instruments Inc | Expired / Lapsed | 1956-11-22 | โ | 1976-11-22 | 0.0 yrs | 0 | |
| WO1996007351A1 | Ultra miniature pressure sensor and guidewire using the same and method | Cardiometrics Inc | Expired / Lapsed | 1995-08-04 | โ | 2015-08-04 | 0.0 yrs | 0 |
Showing 21 to 40 of 946 patents