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Method for forming platinum-rhodium stack as an oxygen barrier

Assignee: Mosaid Technologies Inc
•
Filing: 2000-12-28
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Granted: 2003-02-25
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Expires: 2020-12-28
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Abstract

Abstract The present invention relates to an electrically conductive film stack for semiconductors and methods and apparatus for providing same. A film stack comprising a first layer of a platinum-rhodium alloy deposited by metal organic chemical vapor deposition (MOCVD) in the presence of a reducer, such as hydrogen (H 2 ) gas, and a second layer of the platinum-rhodium alloy deposited in the presence of an oxidizing gas, such as ozone (O 3 ), provides an electrical conductor that is also a relatively good barrier to oxygen. The platinum-rhodium film stack can be used as an electrode or capacitor plate for a capacitor with a high-k dielectric material. The electrode formed with alternating reducing and oxidizing agents produces a rough surface texture, which enhances the memory cell capacitance.

Inventors

  • 👤 Haining Yang
  • 👤 Gurtej S. Sandhu

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 01:08
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/692; H10D1/696; C; C23; C23C; C23C16/00; C23C16/06; C23C16/18; H10D1/694; H10P; H10P14/00; H10P14/40; H10P14/418; H10P14/42; H10P14/43; H10B; H10B12/00; H10B12/01; H10B12/02; H10B12/03; H10D1/682; H10D1/711; H10D1/712; H10D1/716

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 71 words
A metal organic chemical vapor deposition (MOCVD) process that deposits an electrode for a metal-insulator-metal capacitor in an integrated circuit substrate, the process comprising: flowing a first oxidizer while depositing a first layer of platinum-rhodium alloy on the substrate; flowing a reducer while depositing a second layer of platinum-rhodium alloy on the first layer; and flowing a second oxidizer while depositing a third layer of platinum-rhodium alloy on the second layer.
Claim 2
Dependent Claim 71 words
A metal organic chemical vapor deposition (MOCVD) process that deposits an electrode for a metal-insulator-metal capacitor in an integrated circuit substrate, the process comprising: flowing a first oxidizer while depositing a first layer of platinum-rhodium alloy on the substrate; flowing a reducer while depositing a second layer of platinum-rhodium alloy on the first layer; and flowing a second oxidizer while depositing a third layer of platinum-rhodium alloy on the second layer.
Claim 3
Dependent Claim 30 words
The method as defined in claim 1 , wherein the first and the second oxidizer both comprise nitrous oxide (N 2 O) and the reducer comprises hydrogen (H 2 ).
Claim 4
Dependent Claim 17 words
The method as defined in claim 1 , wherein depositing the electrode is performed in one recipe.

References Cited (Backward Citations)

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2006-02-24 2006-08-26 2007-02-25 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2010-02-24 2010-08-26 2011-02-25 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2014-02-24 2014-08-26 2015-02-25 $7700.00 Window Closed / Lapsed

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