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US6429532B1 Expired / Lapsed US ⏱️ 0.0 years remaining

Pad design

Assignee: United Microelectronics Corp
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Filing: 2000-05-09
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Granted: 2002-08-06
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Expires: 2020-05-09
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Abstract

Abstract A pad design. The pad design provides an additional testing pad that is electrically connected to a conventional bonding pad and positioned beside the bonding pad. The conventional bonding pad is formed on a provided chip, and a bump is formed on the bonding pad. A final test is performed on the testing pad so that damage formed on the bump or on the bonding pad can be prevented.

Inventors

  • 👤 Charlie Han
  • 👤 Kai-Kuang Ho

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-10 02:05
CPC Classifications
H; H10; H10W; H10W72/00; H10W72/20; H10P; H10P74/00; H10P74/27; H10P74/273; H10W72/01; H10W72/019; H10W72/221; H10W72/251; H10W72/29; H10W72/90; H10W72/941; H10W72/9415; H10W72/942

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 68 words
A pad design, comprising: a chip, having at least a bonding pad on an active surface of the chip; a protecting film over the active surface of the chip, exposing at least two different portions of the bonding pad; and a bump formed on one of the exposed portions of the bonding pad, with the other exposed portion of the bonding pad being used as a testing pad.
Claim 2
Dependent Claim 68 words
A pad design, comprising: a chip, having at least a bonding pad on an active surface of the chip; a protecting film over the active surface of the chip, exposing at least two different portions of the bonding pad; and a bump formed on one of the exposed portions of the bonding pad, with the other exposed portion of the bonding pad being used as a testing pad.
Claim 3
Dependent Claim 17 words
The pad design according to claim 1 , wherein a material of the bonding pad comprises aluminum.
Claim 4
Dependent Claim 16 words
The pad design according to claim 1 , wherein a material of the bump comprises copper.
Claim 5
Dependent Claim 54 words
The pad design according to claim 1 , wherein the chip comprises a plurality of bonding pads, and a plurality of bumps and testing pads respectively formed on the bonding pads in a manner that the bumps are centrally arranged in array and the testing pads are distributed at a periphery of the chip.
Claim 6
Dependent Claim 24 words
The pad design according to claim 4 , wherein each of the bonding pad comprises a testing pad positioned beside each of the bumps.
Claim 7
Dependent Claim 83 words
A pad design, comprising: a chip, having at least a bonding pad on an active surface of the chip; a redistributed layer formed on the active surface of the chip, wherein a portion of the redistributed layer electrically contacts the bonding pad; a protecting layer, exposing a first region and a second region of the redistributed layer; and a bump positioned on the first region of the redistributed layer, and the second region of the redistributed layer is used as a testing pad.
Claim 8
Dependent Claim 83 words
A pad design, comprising: a chip, having at least a bonding pad on an active surface of the chip; a redistributed layer formed on the active surface of the chip, wherein a portion of the redistributed layer electrically contacts the bonding pad; a protecting layer, exposing a first region and a second region of the redistributed layer; and a bump positioned on the first region of the redistributed layer, and the second region of the redistributed layer is used as a testing pad.
Claim 9
Dependent Claim 16 words
The pad design according to claim 6 , wherein a material of the bump comprises copper.
Claim 10
Dependent Claim 28 words
The pad design according to claim 6 , wherein a thickness of the redistributed layer between the first region and the second region is less than 10 μm.

References Cited (Backward Citations)

US5262719A Cited
US5684304A Cited
US5834844A Cited
US5793117A Cited
US5838023A Cited
US6013537A Cited
US6153448A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2005-08-05 2006-02-04 2006-08-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2009-08-05 2010-02-04 2010-08-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2013-08-05 2014-02-04 2014-08-06 $7700.00 Window Closed / Lapsed

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