Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
197 words
A nonvolatile memory comprising: a semiconductor substrate having a selection transistor and a cell transistor defined thereon; a line form of a first selection gate line formed on the selection transistor region in one direction and a floating gate formed on the cell transistor region in a fixed pattern; an insulating film and a second gate line formed on the first selection gate line at fixed intervals, and an insulating film and a control gate line over the insulating film including the floating gate in a direction the same with the first gate line; impurity regions formed in one region in the semiconductor substrate on both sides of the control gate line and the first selection gate line; a first planar protection film having first contact holes one each to the first selection gate line and to the impurity region; a contact plug in the first contact hole; a conductive layer pattern in contact with the contact plug; a second planar protection film having a contact hole to the conductive layer pattern over the first selection gate line; and, a wiring line formed on the second contact hole and the second planar protection film in one direction.
Claim 2
Dependent Claim
197 words
A nonvolatile memory comprising: a semiconductor substrate having a selection transistor and a cell transistor defined thereon; a line form of a first selection gate line formed on the selection transistor region in one direction and a floating gate formed on the cell transistor region in a fixed pattern; an insulating film and a second gate line formed on the first selection gate line at fixed intervals, and an insulating film and a control gate line over the insulating film including the floating gate in a direction the same with the first gate line; impurity regions formed in one region in the semiconductor substrate on both sides of the control gate line and the first selection gate line; a first planar protection film having first contact holes one each to the first selection gate line and to the impurity region; a contact plug in the first contact hole; a conductive layer pattern in contact with the contact plug; a second planar protection film having a contact hole to the conductive layer pattern over the first selection gate line; and, a wiring line formed on the second contact hole and the second planar protection film in one direction.
Claim 3
Dependent Claim
28 words
A nonvolatile memory as claimed in claim 1 , wherein a gate insulating film is provided under each of the first selection gate line and the floating gate.
Claim 4
Dependent Claim
33 words
A nonvolatile memory as claimed in claim 2 , wherein the gate insulating film provided under the first selection gate line is thicker than the gate insulating film provided under the floating gate.
Claim 5
Dependent Claim
21 words
A nonvolatile memory as claimed in claim 1 , wherein the insulating film is of an ONO (Oxide Nitride Oxide) structure.
Claim 6
Dependent Claim
30 words
A nonvolatile memory as claimed in claim 1 , wherein the second selection gate line is electrically floated on the first selection gate line by the first planar protection film.
Claim 7
Dependent Claim
32 words
A nonvolatile memory as claimed in claim 1 , wherein the first contact hole is formed such that the first planar protection film wraps one side of the second selection gate line.
Claim 8
Dependent Claim
35 words
A nonvolatile memory as claimed in claim 1 , wherein the first contact hole is formed to an upper region of the first selection gate line at which the second selection gate line is isolated.
Claim 9
Dependent Claim
205 words
A nonvolatile memory comprising: a semiconductor substrate having a selection transistor and a cell transistor defined thereon; a stack of a gate insulating film and a first selection gate line formed in line forms on the selection transistor region in one direction and a stack of a gate insulating film and a floating gate formed in fixed patterns on the cell transistor region; an insulating film and a second gate line formed on the first selection gate line at fixed intervals, and an insulating film and a control gate line over the insulating film including the floating gate in a direction the same with the first gate line; impurity regions formed in one region in the semiconductor substrate on both sides of the control gate line and the first selection gate line; a planar protection film having contact holes one each to the first selection gate line to expose sides of the second gate line and to the impurity region; a contact plug formed in the first contact hole, such that the second selection gate line is connected to the first selection gate line; and, a wiring line formed on the contact hole to the impurity region and the planar protection film in one direction.
Claim 10
Dependent Claim
205 words
A nonvolatile memory comprising: a semiconductor substrate having a selection transistor and a cell transistor defined thereon; a stack of a gate insulating film and a first selection gate line formed in line forms on the selection transistor region in one direction and a stack of a gate insulating film and a floating gate formed in fixed patterns on the cell transistor region; an insulating film and a second gate line formed on the first selection gate line at fixed intervals, and an insulating film and a control gate line over the insulating film including the floating gate in a direction the same with the first gate line; impurity regions formed in one region in the semiconductor substrate on both sides of the control gate line and the first selection gate line; a planar protection film having contact holes one each to the first selection gate line to expose sides of the second gate line and to the impurity region; a contact plug formed in the first contact hole, such that the second selection gate line is connected to the first selection gate line; and, a wiring line formed on the contact hole to the impurity region and the planar protection film in one direction.
Claim 11
Dependent Claim
31 words
A nonvolatile memory as claimed in claim 8 , wherein the gate insulating film on the selection transistor region is thicker than the gate insulating film on the cell transistor region.
Claim 12
Dependent Claim
20 words
A nonvolatile memory as claimed in claim 8 , wherein the insulating film is of an ONO(Oxide Nitride Oxide) structure.
Claim 13
Dependent Claim
23 words
A nonvolatile as claimed in claim 8 , wherein the contact hole is formed in a region the second selection line is isolated.