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US6355567B1 Expired / Lapsed US ⏱️ 0.0 years remaining

Retrograde openings in thin films

Assignee: International Business Machines Corp
•
Filing: 1999-06-30
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Granted: 2002-03-12
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Expires: 2019-06-30
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Abstract

Abstract Retrograde openings in thin films and the process for forming the same. The openings may include conductive materials formed within the openings to serve as a wiring pattern which includes wires having tapered cross sections. The process involves a two-step etching procedure for forming a retrograde opening within a film having a gradient of a characteristic that influences the etch rate for a chosen etchant species. An opening is first formed within the film by an anisotropic etch process. The opening is then converted to an opening including retrograde features by an isotropic etch process which is selective to the characteristic. Thereafter, the retrograde opening is filled with a conductive material, in one case, by electroplating or other deposition techniques.

Inventors

  • 👤 Scott D. Halle
  • 👤 Paul C. Jamison
  • 👤 David E. Kotecki
  • 👤 Richard S. Wise

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 18:05
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/056; H10W20/057; H10W20/063; H10W20/071; H10W20/072; H10W20/081; H10W20/082; H10W20/40; H10W20/45; H10W20/46; H10P; H10P50/00; H10P50/20; H10P50/28; H10P50/282; H10P50/283; H10W20/41; H10W20/435

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 146 words
A process for forming a retrograde opening in a film, comprising the steps of; (a) forming a film having: (1) a top, (2) bottom, and (3) characteristic that varies in the same sense from the top of the film to the bottom of the film; (b) applying a first etchant to anisotropically etch an opening in the film extending downward from the top of the film; and (c) applying a second etchant: (1) to isotropically etch the opening in the film, and (2) having a composition based on the characteristic of the film to produce further etching of the film at a first etch rate at a lower portion of the opening that is greater than a second etch rate at a higher portion of the opening resulting in a tapered retrograde opening having a top width and a bottom width greater than the top width.
Claim 2
Dependent Claim 146 words
A process for forming a retrograde opening in a film, comprising the steps of; (a) forming a film having: (1) a top, (2) bottom, and (3) characteristic that varies in the same sense from the top of the film to the bottom of the film; (b) applying a first etchant to anisotropically etch an opening in the film extending downward from the top of the film; and (c) applying a second etchant: (1) to isotropically etch the opening in the film, and (2) having a composition based on the characteristic of the film to produce further etching of the film at a first etch rate at a lower portion of the opening that is greater than a second etch rate at a higher portion of the opening resulting in a tapered retrograde opening having a top width and a bottom width greater than the top width.
Claim 3
Dependent Claim 14 words
The process as in claim 1 , wherein the characteristic comprises a dopant concentration.
Claim 4
Dependent Claim 44 words
The process as in claim 1 , wherein the characteristic is one of (a) increasing continuously from the top of the film to the bottom of the film, and (b) decreasing continuously from the top of the film to the bottom of the film.
Claim 5
Dependent Claim 20 words
The process as in claim 1 , wherein the characteristic comprises a relative amount of a constituent of the film.
Claim 6
Dependent Claim 21 words
The process as in claim 1 , wherein the step (b) comprises reactive ion etching which is non-selective to the characteristic.
Claim 7
Dependent Claim 38 words
The process as in claim 1 , further comprising the step (a1) of forming a pattern in a masking film placed on the film, and wherein the step (b) comprises anisotropically etching using a reactive ion etching technique.
Claim 8
Dependent Claim 36 words
The process as in claim 1 , wherein the step (a) comprises sequentially forming a plurality of film sub-layers and doping each film sub-layer with a corresponding dopant concentration, and the characteristic comprises the dopant concentration.
Claim 9
Dependent Claim 43 words
The process as in claim 1 , wherein the step (a) comprises sequentially forming a plurality of film layers, each film layer formed of a plurality of components, and the characteristic comprises an amount of a first component within a corresponding film layer.
Claim 10
Dependent Claim 15 words
The process as in claim 1 , wherein the step (c) comprises dry chemical etching.
Claim 11
Dependent Claim 15 words
The process as in claim 1 , wherein the step (c) comprises wet chemical etching.

References Cited (Backward Citations)

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2005-03-11 2005-09-10 2006-03-12 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2009-03-11 2009-09-10 2010-03-12 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2013-03-11 2013-09-10 2014-03-12 $7700.00 Window Closed / Lapsed

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