Patent US6110784A successfully refreshed from Google Patents.
US6110784A
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Method of integration of nitrogen bearing high K film
Assignee: GlobalFoundries Inc
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Filing: 1998-07-28
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Granted: 2000-08-29
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Expires: 2018-07-28
Abstract
Abstract A transistor and a method of making the same are provided. The transistor includes a substrate that has an upper surface and a gate dielectric layer positioned on the substrate that has a first quantity of nitrogen therein. A gate electrode is positioned on the gate dielectric layer. First and second source/drain regions are positioned in the substrate and laterally separated to define a channel region beneath the gate dielectric layer. The gate dielectric layer may be composed of a high K material with a thin equivalent thickness of oxide, such as TiO 2 , Ta 2 O 5 , CrO 2 or SrO 2 . The nitrogen suppresses later oxide formation which may otherwise increase the equivalent thickness of oxide of the gate dielectric layer. Nitrogen may also be incorporated into the substrate and the gate electrode.
Inventors
- 👤 Mark I. Gardner
- 👤 Mark C. Gilmer
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 02:03
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/65; H10P14/6516; H10P14/6518; H10P14/6524; H10P14/6526; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/0223; H10D30/0227; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01304; H10D64/01306; H10D64/01332; H10D64/01336; H10D64/0134; H10D64/01344; H10D64/01348; H10D64/60; H10D64/66; H10D64/68; H10D64/693; H10P14/6529; H10P30/00; H10P30/20; H10P30/202; H10P30/204; H10P30/208; H10P14/69; H10P14/692; H10P14/6938; H10P14/6939; H10P14/69393; H10P14/69394; H10P14/69396
Claims Analysis
Total Claims: 26
Claim 1
Independent Claim
57 words
A transistor, comprising: a substrate having an upper surface; a gate dielectric layer positioned on the substrate and having a first quantity of nitrogen therein; a gate electrode positioned on the gate dielectric layer; and first and second source/drain regions in the substrate and being laterally separated to define a channel region beneath the gate dielectric layer.
Claim 2
Dependent Claim
57 words
A transistor, comprising: a substrate having an upper surface; a gate dielectric layer positioned on the substrate and having a first quantity of nitrogen therein; a gate electrode positioned on the gate dielectric layer; and first and second source/drain regions in the substrate and being laterally separated to define a channel region beneath the gate dielectric layer.
Claim 3
Dependent Claim
24 words
The transistor of claim 1, wherein the substrate has a second quantity of nitrogen therein with a peak concentration located proximate the upper surface.
Claim 4
Dependent Claim
27 words
The transistor of claim 1, wherein the gate electrode has a third quantity of nitrogen therein with a peak concentration thereof located proximate the gate dielectric layer.
Claim 5
Dependent Claim
19 words
The transistor of claim 1, wherein the gate dielectric layer has a dielectric constant of about 8 to 120.
Claim 6
Dependent Claim
25 words
The transistor of claim 1, wherein the gate dielectric layer is TiO 2 , Ta 2 O 5 , CrO 2 or SrO 2 .
Claim 7
Dependent Claim
19 words
The transistor of claim 1, wherein the gate dielectric layer is TiO 2 or Ta 2 O 5 .
Claim 8
Dependent Claim
25 words
The transistor of claim 1, wherein each of the first and second source/drain regions comprises a lightly doped drain region and a heavier doped region.
Claim 9
Dependent Claim
20 words
The transistor of claim 7, comprising first and second dielectric sidewall spacers adjacent the gate electrode and gate dielectric layer.
Claim 10
Independent Claim
99 words
A method of fabricating a transistor on a substrate having an upper surface, comprising the steps of: forming a gate dielectric layer on the substrate, the gate dielectric layer having a dielectric constant of about 8 to 120; introducing a first quantity of nitrogen into the gate dielectric layer by annealing the gate dielectric layer in an ambient containing a nitrogen bearing species wherein the nitrogen bearing species is N 2 , NO, N 2 O or NO 2 ; forming a gate electrode on the gate dielectric layer; and forming first and second source/drain regions in the substrate.
Claim 11
Independent Claim
99 words
A method of fabricating a transistor on a substrate having an upper surface, comprising the steps of: forming a gate dielectric layer on the substrate, the gate dielectric layer having a dielectric constant of about 8 to 120; introducing a first quantity of nitrogen into the gate dielectric layer by annealing the gate dielectric layer in an ambient containing a nitrogen bearing species wherein the nitrogen bearing species is N 2 , NO, N 2 O or NO 2 ; forming a gate electrode on the gate dielectric layer; and forming first and second source/drain regions in the substrate.
Claim 12
Dependent Claim
31 words
The method of claim 9, comprising the step of introducing a second quantity of nitrogen in the substrate wherein the peak concentration of the nitrogen is located proximate the upper surface.
Claim 13
Dependent Claim
35 words
The method of claim 10, wherein the step of introducing the second quantity of nitrogen comprises forming a sacrificial layer on the upper surface, implanting the nitrogen into the substrate, and removing the sacrificial layer.
Claim 14
Dependent Claim
18 words
The method of claim 9, comprising the step of introducing a quantity of nitrogen into the gate electrode.
Claim 15
Dependent Claim
21 words
The method of claim 12, wherein the step of introducing the quantity of nitrogen comprises implanting nitrogen into the gate electrode.
Claim 16
Dependent Claim
18 words
The method of claim 10, comprising the step of introducing a quantity of nitrogen into the gate electrode.
Claim 17
Dependent Claim
23 words
The method of claim 9, wherein the step of introducing the first quantity of nitrogen comprises implanting nitrogen into the gate dielectric layer.
Claim 18
Dependent Claim
25 words
The method of claim 9, wherein the gate dielectric layer comprises TiO 2 , Ta 2 O 5 , CrO 2 or SrO 2 .
Claim 19
Dependent Claim
19 words
The transistor of claim 9, wherein the gate dielectric layer comprises TiO 2 or Ta 2 O 5 .
Claim 20
Independent Claim
84 words
A method of fabricating a gate dielectric layer on a substrate having an upper surface, comprising the steps of: forming a layer of insulating material on the upper surface, the insulating material having a dielectric constant of about 8 to 120; and introducing a first quantity of nitrogen into the gate dielectric layer by annealing the gate dielectric layer in an ambient containing a nitrogen bearing species wherein the nitrogen bearing species is N 2 , NO, N 2 O or NO 2 .
Claim 21
Independent Claim
84 words
A method of fabricating a gate dielectric layer on a substrate having an upper surface, comprising the steps of: forming a layer of insulating material on the upper surface, the insulating material having a dielectric constant of about 8 to 120; and introducing a first quantity of nitrogen into the gate dielectric layer by annealing the gate dielectric layer in an ambient containing a nitrogen bearing species wherein the nitrogen bearing species is N 2 , NO, N 2 O or NO 2 .
Claim 22
Dependent Claim
31 words
The method of claim 18, comprising the step of introducing a second quantity of nitrogen in the substrate wherein the peak concentration of the nitrogen is located proximate the upper surface.
Claim 23
Dependent Claim
35 words
The method of claim 19, wherein the step of introducing the second quantity of nitrogen comprises forming a sacrificial layer on the upper surface, implanting the nitrogen into the substrate, and removing the sacrificial layer.
Claim 24
Dependent Claim
22 words
The method of claim 18, wherein the step of introducing the first quantity of nitrogen comprises implanting nitrogen into the insulating material.
Claim 25
Dependent Claim
24 words
The method of claim 18, wherein the insulating material comprises TiO 2 , Ta 2 O 5 , CrO 2 or SrO 2 .
Claim 26
Dependent Claim
18 words
The transistor of claim 18, wherein the insulating material comprises TiO 2 or Ta 2 O 5 .
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-08-29 | 2004-02-28 | 2004-08-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-08-29 | 2008-02-28 | 2008-08-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-08-29 | 2012-02-28 | 2012-08-29 | $7700.00 | Window Closed / Lapsed |