Semiconductor device having dual gate dielectric thickness along the channel and fabrication thereof

Claim 2

A process of forming a semiconductor device, comprising: forming a gate dielectric having at least two regions of different thickness over the substrate; and forming a gate electrode over the gate dielectric; wherein forming the gate dielectric includes: forming a masking layer having an opening exposing a region of the substrate; forming a first dielectric region in a first portion of the exposed region of the substrate; and forming a second dielectric region in a second region of the exposed region of the substrate, the second dielectric region being thicker than the first dielectric region.

Claim 3

A process of forming a semiconductor device, comprising: forming a masking layer over a substrate, the masking layer having an opening exposing a region of the substrate; forming a gate dielectric having at least two regions of different thickness in the opening and over the substrate; and forming a gate electrode over the gate dielectric.

Claim 4

A process of forming a semiconductor device, comprising: forming a masking layer over a substrate, the masking layer having an opening exposing a region of the substrate; forming a gate dielectric having at least two regions of different thickness in the opening and over the substrate; and forming a gate electrode over the gate dielectric.

Claim 5

The process of claim 1, wherein forming the masking layer includes depositing an oxide and removing a portion of the oxide to form the opening.

Claim 6

The process of claim 1, wherein forming the gate electrode includes depositing a gate electrode material in the opening and over the first dielectric and second dielectric regions.

Claim 7

The process of claim 4, further including removing the masking layer after forming the gate electrode.

Claim 8

The process of claim 5, wherein removing the masking layer includes etching the masking layer using anistotropic etching techniques.

Claim 9

The process of claim 5, further including forming source/drain regions adjacent the gate electrode after removing the masking layer.

Claim 10

The process of claim 1, wherein forming the first dielectric region and forming the second dielectric region includes: forming a mask to mask the second portion of the exposed region of the substrate and leave unmasked the first portion of the exposed region of the substrate; implanting a nitrogen-bearing species into the first portion of the exposed region of the substrate; removing the mask; and oxidizing the exposed region of the substrate to form an oxide layer in the second portion of the exposed region of the substrate and a nitrogen-bearing oxide layer in the first portion of the exposed region of the substrate.

Claim 11

The process of claim 1, wherein forming the first dielectric region and forming the second dielectric region includes: forming a dielectric material in the opening; selectively removing the dielectric material from the first portion of the exposed region of the substrate to leave a remaining portion of the dielectric material in the second region of the exposed region of the substrate; and oxidizing the first portion of the substrate after selectively removing the dielectric material from the first portion of the exposed region of the substrate to form an oxide layer in the first portion of the exposed region of the substrate; wherein the oxide layer forms the first gate dielectric region and the remaining portion of the dielectric material forms the second gate dielectric region.

Claim 12

The process of claim 1, further including forming a source region adjacent the first dielectric region and a drain region adjacent the second, thicker dielectric region.

Claim 13

The process of claim 2, wherein forming the gate electrode includes forming the gate electrode in the opening.

Claim 14

The process of claim 11, wherein forming the gate electrode includes depositing a gate electrode material over the masking layer and in the opening and polishing the gate electrode material to form the gate electrode in the opening.

Claim 15

The process of claim 12, further including selectively removing the masking layer while leaving the gate electrode.

Claim 16

The process of claim 13, further including forming active regions adjacent the gate electrode after removing the masking layer.

Claim 17

The process of claim 2, wherein forming the gate dielectric in the opening includes: forming a mask to expose a first part of the substrate region defined by the opening and cover a second part of the substrate region; implanting a nitrogen-bearing species into the exposed first part of the substrate region; removing the mask after implanting the nitrogen-bearing species; and oxidizing the region of the substrate defined by the opening in the masking layer to form an oxide layer over the second part of the exposed region and a nitrogen-bearing oxide layer over the first part of the exposed region of the substrate.

Claim 18

The process of claim 2, wherein forming the gate dielectric in the opening includes: forming a first dielectric material in the opening; forming a mask to cover a first part of the opening and expose a second part of the opening; removing the first dielectric material in the first part and leaving the first dielectric material in the second part; and forming a second dielectric material over the substrate in the first part after removing the first dielectric material wherein the second dielectric material and the remaining first dielectric material form the at least two regions of different thickness.