US6022779A
Expired / Lapsed
US
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Method of forming mask ROM
Assignee: SK Hynix Inc
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Filing: 1998-05-22
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Granted: 2000-02-08
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Expires: 2018-05-22
Abstract
Abstract A method of fabricating a mask ROM includes forming a trench on a first conductivity type semiconductor substrate, implanting a second conductivity type impurity ion in at least a surface portion of the semiconductor substrate where the trench is formed, forming an insulating oxide layer on a surface of the semiconductor substrate, including a surface of the trench, forming gate oxide layers of both sides of the trench, forming first and second gates on the gate oxide layers and forming a first conductivity type channel by implanting a first conductivity type impurity ion in one side of the trench. As such, the resulting mask ROM includes two transistors on either side of a trench having channels along the side walls of the trench. The resulting mask ROM has a reduced surface width, enhancing integration.
Inventors
- 👤 Bong-Jo Shin
- 👤 Ki-Jik Lee
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 22:57
CPC Classifications
H; H10; H10B; H10B20/00; H10B20/27; H10B20/40; H10B20/30; H10B20/38; H10D; H10D84/00; H10D84/01; H10D84/0123; H10D84/0126; H10D84/016
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
154 words
A method of fabricating a mask ROM, comprising: forming a trench at a surface of a semiconductor substrate of a first conductivity type; implanting an impurity ion of a second conductivity type in the surface of the semiconductor substrate including a bottom surface of the trench; simultaneously forming an impurity region of the second conductivity type and an insulating layer at the surface of the semiconductor substrate including the bottom surface of the trench, wherein the insulating layer is formed on the impurity region, and forming gate oxide layers simultaneously with the impurity region and the insulating layer, the gate oxide layers being formed at an exposed surface of the semiconductor substrate where the impurity ion is not implanted; forming first and second gates on the gate oxide layers; and forming a channel of a first conductivity type by implanting an impurity ion of a first conductivity type in one side of the trench.
Claim 2
Independent Claim
154 words
A method of fabricating a mask ROM, comprising: forming a trench at a surface of a semiconductor substrate of a first conductivity type; implanting an impurity ion of a second conductivity type in the surface of the semiconductor substrate including a bottom surface of the trench; simultaneously forming an impurity region of the second conductivity type and an insulating layer at the surface of the semiconductor substrate including the bottom surface of the trench, wherein the insulating layer is formed on the impurity region, and forming gate oxide layers simultaneously with the impurity region and the insulating layer, the gate oxide layers being formed at an exposed surface of the semiconductor substrate where the impurity ion is not implanted; forming first and second gates on the gate oxide layers; and forming a channel of a first conductivity type by implanting an impurity ion of a first conductivity type in one side of the trench.
Claim 3
Dependent Claim
25 words
The method as recited by claim 1, wherein the first conductivity type semiconductor substrate is P type and the second conductivity type is N type.
Claim 4
Dependent Claim
54 words
The method as recited by claim 1, wherein a first conductivity type impurity region is formed under the insulating layer while the insulating oxide layer is being formed on the semiconductor substrate and under the bottom surface of the trench and while forming the gate oxide layers on both sides of the trench, respectively.
Claim 5
Dependent Claim
50 words
The method as recited by claim 1, wherein the process of forming the trench comprises: forming a mask layer on the semiconductor substrate; patterning the mask layer in the shape of a stripe for exposing a portion of the semiconductor substrate; and etching the exposed portion of the semiconductor substrate.
Claim 6
Dependent Claim
17 words
The method as recited by claim 4, wherein the mask layer is formed of a silicon oxide.
Claim 7
Dependent Claim
18 words
The method as recited by claim 4, wherein the trench is formed by anisotropic etching the semiconductor substrate.
Claim 8
Dependent Claim
26 words
The method as recited by claim 1, wherein the step of forming the channel is performed before the step of forming the first and second gates.
Claim 9
Dependent Claim
31 words
The method as recited by claim 1, further comprising: implanting an impurity ion of a second conductivity type in an overall surface of the semiconductor substrate before the trench is formed.
Claim 10
Dependent Claim
35 words
The method as recited by claim 4, further comprising implanting an impurity ion of a second conductivity type in an overall surface of the semiconductor substrate before forming the mask layer on the semiconductor substrate.
Claim 11
Dependent Claim
25 words
The method recited by claim 1, wherein the simultaneously forming includes: forming the insulating layer and gate oxide layers by thermal oxidation of the trench.
Claim 12
Independent Claim
109 words
A method of fabricating a mask ROM, comprising: forming a trench at a surface portion of a semiconductor substrate, the trench having a bottom surface and side surfaces; implanting an impurity ion in the surface portion of the semiconductor substrate including the bottom surface of the trench; simultaneously forming an impurity layer, a buried oxide layer and a first gate oxide layer; forming a gate on the first gate oxide layer; and forming a channel of a first conductivity type by implanting an impurity ion in one side of the trench, where the impurity ion implanted in the surface portion of the semiconductor substrate is a second conductivity type.
Claim 13
Independent Claim
109 words
A method of fabricating a mask ROM, comprising: forming a trench at a surface portion of a semiconductor substrate, the trench having a bottom surface and side surfaces; implanting an impurity ion in the surface portion of the semiconductor substrate including the bottom surface of the trench; simultaneously forming an impurity layer, a buried oxide layer and a first gate oxide layer; forming a gate on the first gate oxide layer; and forming a channel of a first conductivity type by implanting an impurity ion in one side of the trench, where the impurity ion implanted in the surface portion of the semiconductor substrate is a second conductivity type.
Claim 14
Dependent Claim
33 words
The method recited by claim 11, wherein the impurity layer and buried oxide layer are formed on the bottom surface of the trench, the impurity layer being positioned under the buried oxide layer.
Claim 15
Dependent Claim
27 words
The method recited by claim 12, wherein the first gate oxide layer is formed on at least a first one of the side surfaces of the trench.
Claim 16
Dependent Claim
51 words
The method recited by claim 11, further comprising: forming a second gate oxide layer on a side surface of the trench that is different from the side surface upon which the first gate oxide film is formed, the second gate oxide layer being formed simultaneously with the first gate oxide layer.
Claim 17
Dependent Claim
69 words
The method recited by claim 11, wherein the semiconductor substrate has the first conductivity type, the impurity ions implanted in a surface of the semiconductor substrate have the second conductivity type such that the impurity layer is formed with the second conductivity type, and the impurity ions implanted in the one side of the trench have the first conductivity type such that the channel has the first conductivity type.
Claim 18
Dependent Claim
26 words
The method recited by claim 11, wherein heat oxidation is used to simultaneously form the impurity layer, the buried oxide layer and the gate oxide layer.
Claim 19
Dependent Claim
35 words
The method recited by claim 10, wherein the simultaneously forming further includes: forming the impurity region using ions that are activated during the thermal oxidation used to form the insulating layer and gate oxide layers.
Claim 20
Dependent Claim
28 words
The method recited by claim 11, wherein the simultaneously forming includes: forming the buried oxide layer and the first gate oxide layer by thermal oxidation of the trench.
Claim 21
Dependent Claim
38 words
The method recited by claim 18, wherein the simultaneously forming further includes: forming the impurity layer using ions that are activated during the thermal oxidation used to form the buried oxide layer and the first gate oxide layer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-02-07 | 2003-08-09 | 2004-02-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-02-07 | 2007-08-09 | 2008-02-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-02-07 | 2011-08-09 | 2012-02-08 | $7700.00 | Window Closed / Lapsed |