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US5554550A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of fabricating electrically eraseable read only memory cell having a trench

Assignee: United Microelectronics Corp
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Filing: 1994-09-14
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Granted: 1996-09-10
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Expires: 2014-09-14
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Abstract

Abstract A method of fabricating an EPROM cell by forming a trench in a semiconductor substrate, forming a first insulating layer over the surface of the substrate, and the sidewalls and bottom of the trench, forming individual polycrystalline silicon layers on the sidewalls of the trench, implanting a dopant into the substrate in the bottom of, and regions adjacent, the trench, forming a second insulating layer over the polycrystalline silicon layers, forming a control gate over the polycrystalline silicon layers and an electrical contact to the bottom of the trench.

Inventors

  • 👤 Ming-Tzung Yang

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 01:06
CPC Classifications
H; H10; H10B; H10B41/00; H10B41/30

Claims Analysis

Total Claims: 16
Claim 1
Independent Claim 164 words
A methods of fabricating an electrically programmable read only memory cell on a semiconductor substrate comprising: forming an elongated trench in said substrate, forming a first insulating layer over the surface of said substrate, including the sidewalls and bottom of said trench, forming individual multiple pairs of spaced polycrystalline silicon layers on the opposed sidewalls of the trench, which form floating gates, implanting a first type dopant into said substrate thereby forming a continuous doped region in the bottom of said trench, which form a continuous source region, and also individual doped regions on opposite sides of the trench, adjacent to the top surface of the substrate, which form the drain regions, forming a second insulating layer over the said individual pairs of spaced polycrystalline silicon layers, forming a conductive control gate word line stripe over, and transverse to the trench adjacent to the individual polycrystalline silicon layers, and forming an electrical contact to the continuous doped region in the bottom of the trench.
Claim 2
Dependent Claim 164 words
A methods of fabricating an electrically programmable read only memory cell on a semiconductor substrate comprising: forming an elongated trench in said substrate, forming a first insulating layer over the surface of said substrate, including the sidewalls and bottom of said trench, forming individual multiple pairs of spaced polycrystalline silicon layers on the opposed sidewalls of the trench, which form floating gates, implanting a first type dopant into said substrate thereby forming a continuous doped region in the bottom of said trench, which form a continuous source region, and also individual doped regions on opposite sides of the trench, adjacent to the top surface of the substrate, which form the drain regions, forming a second insulating layer over the said individual pairs of spaced polycrystalline silicon layers, forming a conductive control gate word line stripe over, and transverse to the trench adjacent to the individual polycrystalline silicon layers, and forming an electrical contact to the continuous doped region in the bottom of the trench.
Claim 3
Dependent Claim 15 words
The method of claim 1 wherein the trench is formed by anisotropic reactive ion etching.
Claim 4
Dependent Claim 30 words
The method of claim 2 wherein the trench has a depth in the range of 0.5 to 2.0 micrometers and a width in the range of 0.5 to 1.5 micrometers.
Claim 5
Dependent Claim 40 words
The method of claim 2 wherein said substrate is monocrystalline silicon, and said first insulating layer is formed by thermally oxidizing the substrate, the resultant thickness of the first insulating layer being in the range of 50 to 300 Angstroms.
Claim 6
Dependent Claim 39 words
The method of claim 2 wherein said first insulating layer is a composite layer of SiO 2 , Si 3 N 4 and SiO 2 , and the overall thickness is in the range of 100 to 400 Angstroms.
Claim 7
Dependent Claim 21 words
The method of claim 2 wherein said polycrystalline silicon layers have a thickness in the range of 500 to 3000 Angstroms.
Claim 8
Dependent Claim 74 words
The method of claim 6 wherein a polycrystalline silicon layer is deposited on the surface of the substrate, the top surface portions removed by masking the trench portions and subtractively etching the exposed portions, and subsequently removing the mask and exposing the remaining layer to an anisotropic dry etch that removes the layer portion on the bottom of the trench and the upper end portions of the layers on the sidewalls of the trench.
Claim 9
Dependent Claim 31 words
The method of claim 7 wherein the second insulating layer is SiO 2 with a thickness in the range of 50 to 300 Angstroms, and is formed by chemical vapor deposition.
Claim 10
Dependent Claim 33 words
The method of claim 7 wherein the second insulating layer is SiO 2 , Si 3 N 4 and SiO 2 with an overall thickness in the range of 100 to 400 Angstroms.
Claim 11
Dependent Claim 16 words
The method of claim 2 wherein the conductive word line stripe is formed of polycrystalline silicon.
Claim 12
Dependent Claim 50 words
The method of claim 10 wherein said stripe is formed by using a silane or Si 2 H 6 ambient gas as the source of silicon within a chamber having a pressure of between about 0.001 mTorr to 10 Torr and a temperature of between about 500° to 700° C.
Claim 13
Dependent Claim 18 words
The method of claim 11 wherein the thickness of the stripe is between about 500 to 8000 Angstroms.
Claim 14
Dependent Claim 42 words
The method of claim 1 wherein the electrical contact to the doped region beneath the trench is formed at the end of the trench by etching an opening to the bottom of the trench and filling the opening with a conductive metal.
Claim 15
Dependent Claim 20 words
The method of claim 1 wherein a passivating layer is deposited on the substrate after the stripe has been completed.
Claim 16
Dependent Claim 23 words
The method of claim 14 wherein a layer of borophospho silicate glass is deposited by spin on techniques, and the layer etched back.

References Cited (Backward Citations)

US4975383A Cited
US4975384A Cited
US5180680A Cited
US5338953A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-09-10 2000-03-11 2000-09-10 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-09-10 2004-03-11 2004-09-10 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-09-10 2008-03-11 2008-09-10 $7700.00 Window Closed / Lapsed

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