Field effect transistor

Claim 2

A field effect transistor comprising: a substrate made of GaAs; a channel layer over the substrate; at least a first barrier layer over the channel layer; a contact layer over the first barrier layer, the channel layer being made of a material having an electron affinity greater than that of the first barrier layer, the contact layer being made of a material having the same electron affinity as that of the first barrier layer and the first barrier having a higher resistance than that of the channel layer; a gate electrode in contact with the first barrier layer; and, a source electrode and a drain electrode in contact with the contact layer, wherein the channel layer, the first barrier layer and the contact layer are lattice-matched to the substrate.

Claim 3

A field effect transistor according to claim 1, wherein the first barrier layer is made of an undoped material.

Claim 4

A field effect transistor comprising: a substrate made of GaAs; a semiconductor structure disposed on a substrate, the semiconductor structure comprising, in order, from bottom to top, a channel layer, a barrier structure and a contact layer, the semiconductor structure having a recess on a top surface thereof so as to expose a portion of the barrier structure, the barrier structure having a first barrier layer, the channel layer being made of a material having an electron affinity greater than that of the first barrier layer, the contact layer being made of a material having the same electron affinity as that of the first barrier layer and the first barrier having a higher resistance than that of the channel layer, wherein the channel layer, the barrier structure and the contact layer are lattice-matched to the substrate; a gate electrode disposed on the exposed portion of the barrier structure, the gate electrode being in Schottky contact with the barrier structure; and a source electrode and a drain electrode respectively provided on the top surface of the semiconductor structure, the source electrode and the drain electrode being in Ohmic contact with the contact layer.

Claim 5

A field effect transistor comprising: a substrate made of GaAs; a semiconductor structure disposed on a substrate, the semiconductor structure comprising, in order, from bottom to top, a channel layer, a barrier structure and a contact layer, the semiconductor structure having a recess on a top surface thereof so as to expose a portion of the barrier structure, the barrier structure having a first barrier layer, the channel layer being made of a material having an electron affinity greater than that of the first barrier layer, the contact layer being made of a material having the same electron affinity as that of the first barrier layer and the first barrier having a higher resistance than that of the channel layer, wherein the channel layer, the barrier structure and the contact layer are lattice-matched to the substrate; a gate electrode disposed on the exposed portion of the barrier structure, the gate electrode being in Schottky contact with the barrier structure; and a source electrode and a drain electrode respectively provided on the top surface of the semiconductor structure, the source electrode and the drain electrode being in Ohmic contact with the contact layer.

Claim 6

A field effect transistor according to claim 3, wherein the first barrier layer is made of an undoped material.

Claim 7

A field effect transistor according to claim 3, wherein the field effect transistor is a heterostructure insulated-gate field effect transistor.

Claim 8

A field effect transistor comprising: a semiconductor structure disposed on a substrate, the semiconductor structure comprising, in order, from bottom to top, a channel layer, a barrier structure and a contact layer, the semiconductor structure having a recess on a top surface thereof so as to expose a portion of the barrier structure, the barrier structure having a first barrier layer having a higher resistance than that of the channel layer, the channel layer being made of a material having an electron affinity greater than that of the first barrier layer, the contact layer being made of a material having the same electron affinity as that of the first barrier layer, said first barrier layer having a thickness of about form 5 nm to 15 nm; a gate electrode disposed on the exposed portion of the barrier structure, the gate electrode being in Schottky contact with the barrier structure; and a source electrode and a drain electrode respectively provided on the top surface of the semiconductor structure, the source electrode and the drain electrode being in Ohmic contact with the contact layer.

Claim 9

A field effect transistor comprising: a semiconductor structure disposed on a substrate, the semiconductor structure comprising, in order, from bottom to top, a channel layer, a barrier structure and a contact layer, the semiconductor structure having a recess on a top surface thereof so as to expose a portion of the barrier structure, the barrier structure having a first barrier layer having a higher resistance than that of the channel layer, the channel layer being made of a material having an electron affinity greater than that of the first barrier layer, the contact layer being made of a material having the same electron affinity as that of the first barrier layer, said first barrier layer having a thickness of about form 5 nm to 15 nm; a gate electrode disposed on the exposed portion of the barrier structure, the gate electrode being in Schottky contact with the barrier structure; and a source electrode and a drain electrode respectively provided on the top surface of the semiconductor structure, the source electrode and the drain electrode being in Ohmic contact with the contact layer.

Claim 10

A field effect transistor comprising: a semiconductor structure disposed on a substrate, the semiconductor structure comprising, in order, from bottom to top, a channel layer, a barrier structure and a contact layer, the semiconductor structure having a recess on a top surface thereof so as to expose a portion of the barrier structure, the barrier structure having a first barrier layer having a higher resistance than that of the channel layer, the channel layer being made of a material having a electron affinity greater than that of the first barrier layer, the contact layer being made of a material having the same electron affinity as that of the first barrier layer, the channel layer is an n-type InGaAs layer, the first barrier layer is a undoped GaAs layer, and the contact layer is an n-type GaAs layer; a gate electrode disposed on the exposed portion of the barrier structure, the gate electrode being in Schottky contact with the barrier structure; and a source electrode and a drain electrode respectively provided on the top surface of the semiconductor structure, the source electrode and the drain electrode being in Ohmic contact with the contact layer.

Claim 11

A field effect transistor comprising: a semiconductor structure disposed on a substrate, the semiconductor structure comprising, in order, from bottom to top, a channel layer, a barrier structure and a contact layer, the semiconductor structure having a recess on a top surface thereof so as to expose a portion of the barrier structure, the barrier structure having a first barrier layer having a higher resistance than that of the channel layer, the channel layer being made of a material having a electron affinity greater than that of the first barrier layer, the contact layer being made of a material having the same electron affinity as that of the first barrier layer, the channel layer is an n-type InGaAs layer, the first barrier layer is a undoped GaAs layer, and the contact layer is an n-type GaAs layer; a gate electrode disposed on the exposed portion of the barrier structure, the gate electrode being in Schottky contact with the barrier structure; and a source electrode and a drain electrode respectively provided on the top surface of the semiconductor structure, the source electrode and the drain electrode being in Ohmic contact with the contact layer.

Claim 12

A field effect transistor according to claim 7, wherein the semiconductor structure further includes a buffer layer between the channel layer and the substrate such that the buffer layer is in contact with the channel layer, the buffer layer being made of an undoped material having the same electron affinity as that of the channel layer.

Claim 13

A field effect transistor comprising: a semiconductor structure disposed on a substrate, the semiconductor structure comprising, in order, from bottom to top, a channel layer, a barrier structure and a contact layer, the semiconductor structure having a recess on a too surface thereof so as to expose a portion of the barrier structure, the barrier structure having a first barrier layer, the channel layer being made of a material having an electron affinity greater than that of the first barrier layer, the contact layer being made of a material having the same electron affinity as that of the first barrier layer, the barrier structure further including a second barrier layer between the first barrier layer and the channel layer, the second barrier layer being made of a material having an electron affinity smaller than the material of the channel layer and greater than the material of the first barrier layer; a gate electrode disposed on the exposed portion of the barrier structure, the gate electrode being in Schottky contact with the barrier structure; and a source electrode and a drain electrode respectively provided on the top surface of the semiconductor structure, the source electrode and the drain electrode being in Ohmic contact with the contact layer.

Claim 14

A field effect transistor comprising: a semiconductor structure disposed on a substrate, the semiconductor structure comprising, in order, from bottom to top, a channel layer, a barrier structure and a contact layer, the semiconductor structure having a recess on a too surface thereof so as to expose a portion of the barrier structure, the barrier structure having a first barrier layer, the channel layer being made of a material having an electron affinity greater than that of the first barrier layer, the contact layer being made of a material having the same electron affinity as that of the first barrier layer, the barrier structure further including a second barrier layer between the first barrier layer and the channel layer, the second barrier layer being made of a material having an electron affinity smaller than the material of the channel layer and greater than the material of the first barrier layer; a gate electrode disposed on the exposed portion of the barrier structure, the gate electrode being in Schottky contact with the barrier structure; and a source electrode and a drain electrode respectively provided on the top surface of the semiconductor structure, the source electrode and the drain electrode being in Ohmic contact with the contact layer.

Claim 15

A field effect transistor according to claim 9, wherein the barrier structure further includes a third barrier layer between the first barrier layer and the second barrier layer, the third barrier layer being made of a material having a electron affinity greater than the material of the second barrier layer.

Claim 16

A field effect transistor according to claim 9, wherein the semiconductor structure further includes another channel layer between the substrate and the first channel layer.