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US5973360A
Expired / Lapsed
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Field effect-controllable semiconductor component
Assignee: Infineon Technologies AG
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Filing: 1998-09-21
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Granted: 1999-10-26
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Expires: 2018-09-21
Abstract
Abstract The field effect-controllable semiconductor component has a drain zone of the first conductivity type and also at least one gate electrode which is composed of polycrystalline silicon and is insulated from the drain zone. A source region of the second conductivity type is introduced in the drain zone. In addition, there is formed in the drain zone a trench structure, which reach from the surface of the epitaxial layer down into the substrate layer. An additional field plate made of polysilicon and embedded in an oxide layer is introduced in the trench structure. The thickness of the oxide surrounding the field plate increases down in a direction towards the drain.
Inventors
- 👤 Jenoe Tihanyi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 22:53
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/64; H10D30/66; H10D30/668; H10D62/00; H10D62/10; H10D62/102; H10D62/103; H10D62/105; H10D62/109; H10D62/111; H10D62/113; H10D62/115; H10D62/116; H10D62/13; H10D62/149; H10D62/151; H10D62/156; H10D62/157; H10D64/00; H10D64/111; H10D64/117; H10D64/20; H10D64/27; H10D64/311; H10D64/411; H10D64/511; H10D64/512; H10D64/513; H10D64/23; H10D64/251; H10D64/256; H10D64/514; H10D64/516
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
114 words
A field effect-controllable semiconductor component, comprising: a semiconductor body having a surface; a drain zone of a first conductivity type in said semiconductor body; a gate electrode composed of polycrystalline silicon in said semiconductor body, said gate electrode being insulated from said drain zone; a source region of a second conductivity type introduced in said drain zone; said drain zone having a trench structure formed therein reaching from said surface of said semiconductor body into said drain zone; and a field plate in said trench structure and an oxide layer surrounding said field plate, said oxide layer having a thickness increasing gradually and continuously from said surface in a direction towards said drain zone.
Claim 2
Dependent Claim
114 words
A field effect-controllable semiconductor component, comprising: a semiconductor body having a surface; a drain zone of a first conductivity type in said semiconductor body; a gate electrode composed of polycrystalline silicon in said semiconductor body, said gate electrode being insulated from said drain zone; a source region of a second conductivity type introduced in said drain zone; said drain zone having a trench structure formed therein reaching from said surface of said semiconductor body into said drain zone; and a field plate in said trench structure and an oxide layer surrounding said field plate, said oxide layer having a thickness increasing gradually and continuously from said surface in a direction towards said drain zone.
Claim 3
Dependent Claim
33 words
The semiconductor component according to claim 1, which further comprises a further layer surrounding said oxide layer, said further layer being doped more heavily with the first conductivity type than said drain zone.
Claim 4
Dependent Claim
29 words
The semiconductor component according to claim 2, which further comprises at least one additional layer of the second conductivity type introduced into said oxide layer surrounding said field plate.
Claim 5
Dependent Claim
27 words
The semiconductor component according to claim 1, wherein said trench structure is one of a multiplicity of trench structures arranged in grid form in said semiconductor body.
Claim 6
Dependent Claim
27 words
The semiconductor component according to claim 1, wherein said trench structure is one of a multiplicity of trench structures arranged in strip form in said semiconductor body.
Claim 7
Dependent Claim
22 words
The semiconductor component according to claim 1, wherein said field plate is electrically connected to a source terminal of said source region.
Claim 8
Dependent Claim
18 words
The semiconductor component according to claim 1, wherein said field plate is electrically connected to said gate electrode.
Claim 9
Dependent Claim
20 words
The semiconductor component according to claim 7, wherein said field plate is a vertical field plate serving as a gate.
Claim 10
Dependent Claim
15 words
The semiconductor component according to claim 1, wherein said field plate is composed of polysilicon.
Claim 11
Dependent Claim
15 words
The semiconductor component according to claim 1, wherein said field plate is composed of polysilicon.
References Cited (Backward Citations)
GB2089118A
Cited
US5883411A
Cited
US4941026A
Cited
US4914058A
Cited
US5072269A
Cited
US5126807A
Cited
EP0477873A2
Cited
US5216275A
Cited
US5438215A
Cited
US5430315A
Cited
US5559353A
Cited
US5747831A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2002-10-25 | 2003-04-26 | 2003-10-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-10-25 | 2007-04-26 | 2007-10-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-10-25 | 2011-04-26 | 2011-10-26 | $7700.00 | Window Closed / Lapsed |