US5935877A
Expired / Lapsed
US
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Etch process for forming contacts over titanium silicide
Assignee: Applied Materials Inc
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Filing: 1995-09-01
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Granted: 1999-08-10
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Expires: 2015-09-01
Abstract
Abstract A plasma etch process for an insulating layer, such as silicon dioxide, overlaying a silicide layer having a high selectivity with respect to the silicide layer is disclosed, comprising the use of a mixture of a nitrogen-containing gas and one or more other fluorine-containing etch gases in an etch chamber maintained within a pressure range of from about 5 millitorr to about 400 millitorr. The high selectivity exhibited by the etch process of the invention permits operation of the etch process at reduced pressures of from as low as 5 millitorr to about 30 millitorr to achieve complete etching of vertical sidewall openings in the oxide layer with significant overetch capability.
Inventors
- 👤 Luc Van Autryve
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 01:37
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/28; H10P50/282; H10P50/283; H10W; H10W20/00; H10W20/01; H10W20/071; H10W20/081
Claims Analysis
Total Claims: 36
Claim 1
Independent Claim
104 words
A plasma etch process for selectively etching an insulation layer overlaying a silicide surface of an integrated circuit structure on a semiconductor workpiece at a temperature at least about 0 degrees C., the process comprising: flowing into an etch chamber containing said workpiece, a mixture of one or more fluorine-containing etch gases and a nitrogen-containing gas while simultaneously maintaining a plasma associated with said etch chamber, at a pressure of less than or equal to about 700 millitorr, wherein the nitrogen-containing gas ranges from about 2 to about 30 volume % of the total amount of fluorine-containing etchant gas flowing into said etch chamber.
Claim 2
Dependent Claim
104 words
A plasma etch process for selectively etching an insulation layer overlaying a silicide surface of an integrated circuit structure on a semiconductor workpiece at a temperature at least about 0 degrees C., the process comprising: flowing into an etch chamber containing said workpiece, a mixture of one or more fluorine-containing etch gases and a nitrogen-containing gas while simultaneously maintaining a plasma associated with said etch chamber, at a pressure of less than or equal to about 700 millitorr, wherein the nitrogen-containing gas ranges from about 2 to about 30 volume % of the total amount of fluorine-containing etchant gas flowing into said etch chamber.
Claim 3
Dependent Claim
24 words
The process of claim 1 wherein said process is carried out on a silicon dioxide (SiO 2 ) insulating layer in said etch chamber.
Claim 4
Dependent Claim
21 words
The process of claim 1 wherein one or more inert gases are also flowed into said etch chamber during the process.
Claim 5
Dependent Claim
20 words
The process of claim 1 wherein the pressure in said chamber ranges from about 5 millitorr to about 400 millitorr.
Claim 6
Dependent Claim
21 words
The process of claim 4 wherein said plasma associated with said etch chamber is generated by an inductively coupled plasma generator.
Claim 7
Dependent Claim
16 words
The process of claim 5 wherein said pressure in said chamber is maintained below 50 millitorr.
Claim 8
Dependent Claim
26 words
The process of claim 4 wherein said pressure in said etch chamber is maintained in a range of from about 50 millitorr to about 200 millitorr.
Claim 9
Dependent Claim
17 words
The process of claim 7 wherein said pressure in said chamber is maintained at about 150 millitorr.
Claim 10
Dependent Claim
22 words
The process of claim 7 wherein said plasma associated with said etch chamber is generated by a capacitive discharge type plasma generator.
Claim 11
Dependent Claim
48 words
The process of claim 3 wherein said one or more fluorine-containing etch gases are organic fluorocarbons selected from the group consisting of CF 4 , CHF 3 , CH 2 F 2 , CH 3 F, C 2 F 6 , C 4 F 8 and mixtures thereof.
Claim 12
Dependent Claim
26 words
The process of claim 10 wherein said one or more fluorine-containing etch gases are selected from the group consisting of CF 4 and CHF 3 .
Claim 13
Dependent Claim
37 words
The process of claim 10 wherein the nitrogen-containing gas is selected from the group consisting of N 2 , N 2 O, NO, NO 2 , NH 3 , N 2 H 4 , and mixtures thereof.
Claim 14
Dependent Claim
60 words
The process of claim 3 wherein said one or more fluorine-containing gases comprise one or more 3-6 carbon fluorinated hydrocarbons having the formula C x H y F z , wherein x is 3 to 6, y is 0 to 3, z is 2x-y when said fluorinated hydrocarbon is cyclic, and z is 2x-y+2 when said fluorinated hydrocarbon is noncyclic.
Claim 15
Dependent Claim
14 words
The process of claim 2 wherein said silicide surface is a refractory metal silicide.
Claim 16
Dependent Claim
22 words
The process of claim 14 wherein the refractory metal is selected from the group consisting of molybdenum, cobalt, titanium, tantalum, and tungsten.
Claim 17
Dependent Claim
21 words
The process of claim 1 wherein the power level of said plasma ranges from about 300 watts to about 5 kw.
Claim 18
Dependent Claim
120 words
A plasma etch process for selectively etching a dielectric on a silicide surface of an integrated circuit structure on a semiconductor workpiece, the process comprising: a) maintaining an etch chamber containing said workpiece at a pressure of from about 1 millitorr to about 200 millitorr; b) flowing into said chamber a mixture of a nitrogen-containing gas and one or more fluorine-containing etch gases, in a ratio of about 10 volume % to 30 volume % nitrogen-containing gas of the volume of said one or more fluorine-containing etch gases; c) maintaining a plasma associated with said etch chamber within a power level ranging from about 300 watts to about 5 kw; and d) selectively etching said dielectric without etching said silicide.
Claim 19
Dependent Claim
120 words
A plasma etch process for selectively etching a dielectric on a silicide surface of an integrated circuit structure on a semiconductor workpiece, the process comprising: a) maintaining an etch chamber containing said workpiece at a pressure of from about 1 millitorr to about 200 millitorr; b) flowing into said chamber a mixture of a nitrogen-containing gas and one or more fluorine-containing etch gases, in a ratio of about 10 volume % to 30 volume % nitrogen-containing gas of the volume of said one or more fluorine-containing etch gases; c) maintaining a plasma associated with said etch chamber within a power level ranging from about 300 watts to about 5 kw; and d) selectively etching said dielectric without etching said silicide.
Claim 20
Dependent Claim
21 words
The process of claim 17 wherein said plasma associated with said etch chamber is generated by an electromagnetically coupled plasma generator.
Claim 21
Dependent Claim
18 words
The process of claim 18 wherein said pressure in said chamber is maintained at below about 50 millitorr.
Claim 22
Dependent Claim
41 words
The process of claim 17 wherein said pressure in said chamber is maintained within a range of from about 50 millitorr to about 200 millitorr and said plasma associated with said etch chamber is generated by a capacitive discharge-type plasma generator.
Claim 23
Dependent Claim
50 words
The process of claim 17 wherein said one or more fluorine-containing etch gases are selected from the group consisting of CF 4 , CHF 3 , CH 2 F 2 , CH 3 F, C 2 F 6 , SF 6 , C 4 F 8 , and mixtures thereof.
Claim 24
Dependent Claim
60 words
The process of claim 17 wherein said one or more fluorine-containing gases comprise one or more 3-6 carbon fluorinated hydrocarbons having the formula C x H y F z , wherein x is 3 to 6, y is 0 to 3, z is 2x-y when said fluorinated hydrocarbon is cyclic, and z is 2x-y+2 when said fluorinated hydrocarbon is noncyclic.
Claim 25
Dependent Claim
21 words
The process of claim 17 wherein one or more inert gases are also flowed into said etch chamber during said process.
Claim 26
Dependent Claim
33 words
The process of claim 17 further comprising the step of: d) over-etching said dielectric with the plasma for a selected time while maintaining selectivity of said oxide with respect to the silicide layer.
Claim 27
Dependent Claim
131 words
A plasma etch method for etching a dielectric on a silicide surface of an integrated circuit structure on a semiconductor workpiece, the method comprising: (a) maintaining an etch chamber containing said workpiece at a pressure from about 30 millitorr to about 200 millitorr; (b) flowing into said chamber a mixture of nitrogen-containing gas and one or more fluorine-containing etch gases, wherein the nitrogen-containing gas ranges from about 2 volume % to about 30 volume % of the total amount of said one or more fluorine-containing etch gases flowing into said etch chamber; (c) generating a plasma associated with said etch chamber using an inductively coupled plasma generator maintained within a power level ranging from about 300 watts to about 5 kw; and d) selectively etching said dielectric without etching said silicide.
Claim 28
Dependent Claim
131 words
A plasma etch method for etching a dielectric on a silicide surface of an integrated circuit structure on a semiconductor workpiece, the method comprising: (a) maintaining an etch chamber containing said workpiece at a pressure from about 30 millitorr to about 200 millitorr; (b) flowing into said chamber a mixture of nitrogen-containing gas and one or more fluorine-containing etch gases, wherein the nitrogen-containing gas ranges from about 2 volume % to about 30 volume % of the total amount of said one or more fluorine-containing etch gases flowing into said etch chamber; (c) generating a plasma associated with said etch chamber using an inductively coupled plasma generator maintained within a power level ranging from about 300 watts to about 5 kw; and d) selectively etching said dielectric without etching said silicide.
Claim 29
Dependent Claim
29 words
A method according to claim 25, wherein the amount of nitrogen-containing gas added is between about 5 v % to about 25 v % of the fluorine-containing etch gas.
Claim 30
Dependent Claim
16 words
A method according to claim 25, wherein the etching step is carried out with magnetic enhancement.
Claim 31
Dependent Claim
38 words
A method according to claim 25, wherein the nitrogen-containing gas is selected from the group consisting of N 2 , N 2 O, NO, NO 2 , NH 3 , N 2 H 4 , and mixtures thereof.
Claim 32
Dependent Claim
13 words
A method according to claim 25, wherein the etching is reactive ion etching.
Claim 33
Dependent Claim
20 words
A method according to claim 25, wherein the silicide layer comprises a silicide of molybdenum, cobalt, titanium, tantalum or tungsten.
Claim 34
Dependent Claim
38 words
A method according to claim 25, further comprising the steps of: d) over-etching said dielectric with the plasma for at least 150% of the etch time while maintaining selectivity of said oxide with respect to the silicide layer.
Claim 35
Dependent Claim
22 words
A plasma etch process according to claim 1, wherein said temperature is between about 0 degrees C. and about 40 degrees C.
Claim 36
Dependent Claim
22 words
A plasma etch process according to claim 32, wherein said temperature is between about 10 degrees C. and about 40 degrees C.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2002-08-09 | 2003-02-08 | 2003-08-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-08-09 | 2007-02-08 | 2007-08-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-08-09 | 2011-02-08 | 2011-08-10 | $7700.00 | Window Closed / Lapsed |