US4668338A — Magnetron-enhanced plasma etching process

Claim 1

Independent Claim 153 words

A method for continuously etching in a closed chamber a structure comprising at least one of a dielectric layer and a semiconductor layer formed on or over a surface of a substrate, comprising: communicating into said chamber a selected reactive gas mixture; supplying RF electrical energy to said chamber to establish an etching plasma and and an associated electric field substantially perpendicular to said surface; applying a variable D.C. magnetic field to the chamber at a selected first field strength and a first direction substantially perpendicular to said electric field and parallel to the substrate major surface; and changing at least one of (A) the strength of the magnetic field and (B) the direction thereof to, respectively, (A) a second value for enhancing etch selectivity and (B) a second direction still perpendicular to said electric field and parallel to said substrate major surface for increasing etch uniformity across the etched layer major surface.

Claim 2

Independent Claim 153 words

A method for continuously etching in a closed chamber a structure comprising at least one of a dielectric layer and a semiconductor layer formed on or over a surface of a substrate, comprising: communicating into said chamber a selected reactive gas mixture; supplying RF electrical energy to said chamber to establish an etching plasma and and an associated electric field substantially perpendicular to said surface; applying a variable D.C. magnetic field to the chamber at a selected first field strength and a first direction substantially perpendicular to said electric field and parallel to the substrate major surface; and changing at least one of (A) the strength of the magnetic field and (B) the direction thereof to, respectively, (A) a second value for enhancing etch selectivity and (B) a second direction still perpendicular to said electric field and parallel to said substrate major surface for increasing etch uniformity across the etched layer major surface.

Claim 3

Dependent Claim 58 words

The method of claim 1, wherein the structure is an oxide layer formed on a layer of polysilicon and wherein the first field strength is selected to provide a high oxide etch rate, then before the oxide is etched through, the magnetic field is decreased to a lower second value selected to increase the oxide:polysilicon etch rate ratio.

Claim 4

Dependent Claim 39 words

The process of claim 1 or 2, wherein at an intermediate stage during the etch process the direction of the magnetic field is reversed, still parallel to the substrate major surface, to enhance etch uniformity across the etched layer.

Claim 5

Independent Claim 109 words

A method for continuously etching in a closed chamber a first layer formed on a second layer, comprising: communicating into said chamber a selected reactive gas mixture; supplying RF electrical energy to said chamber to establish an etching plasma and an associated D.C. voltage substantially perpendicular to said layers; applying to the chamber a variable D.C. magnetic field which is substantially parallel to said layers and at a first strength selected to etch the first layer at a high rate; and before the first layer is etched through, changing the strength of the magnetic field to a second, lower value to increase the etch selectivity for the second layer.

Claim 6

Independent Claim 109 words

A method for continuously etching in a closed chamber a first layer formed on a second layer, comprising: communicating into said chamber a selected reactive gas mixture; supplying RF electrical energy to said chamber to establish an etching plasma and an associated D.C. voltage substantially perpendicular to said layers; applying to the chamber a variable D.C. magnetic field which is substantially parallel to said layers and at a first strength selected to etch the first layer at a high rate; and before the first layer is etched through, changing the strength of the magnetic field to a second, lower value to increase the etch selectivity for the second layer.

Claim 7

Dependent Claim 35 words

The process of claim 4, wherein the direction of the magnetic field is reversed, still parallel to said layers at an intermediate stage of the etch process, to enhance etch uniformity across the first layer.

Claim 8

Dependent Claim 19 words

The method of claim 4 or 5, wherein the first layer is oxide and the second layer is polysilicon.

Claim 9

Dependent Claim 33 words

The process of claim 4 or 5, wherein the first layer is silicon oxide, the second layer is polysilicon and the reactive gas mixture comprises C 2 F 6 and CH 3 F.

Claim 10

Dependent Claim 51 words

The process of claim 4 or 5, wherein the first layer is silicon oxide, the second layer is polysilicon, the reactive gas mixture comprises C 2 F 6 and CH 3 F, and wherein the first and second field strengths are ≧ about 40 gauss and ≦ about 40 gauss, respectively.

Claim 11

Dependent Claim 49 words

The process of claim 4 or 5, wherein the first layer is silicon oxide, the second layer is polysilicon, the reactive gas mixture comprises C 2 F 6 and CH 3 F, and wherein the first and second field strengths are about (40-65) gauss and ≦ about 40 gauss.

Claim 12

Independent Claim 89 words

A method for etching in a closed chamber a first layer formed on a second layer, comprising: communicating into said chamber a selected reactive gas mixture; supplying RF electrical energy to said chamber to establish an etching gas plasma and an associated DC voltage substantially perpendicular to said layers; and applying a magnetic field to the chamber substantially parallel to said layers at a field strength value selected to etch the first layer at an optimum high rate and with an optimum high selectivity relative to the second layer.

Claim 13

Independent Claim 89 words

A method for etching in a closed chamber a first layer formed on a second layer, comprising: communicating into said chamber a selected reactive gas mixture; supplying RF electrical energy to said chamber to establish an etching gas plasma and an associated DC voltage substantially perpendicular to said layers; and applying a magnetic field to the chamber substantially parallel to said layers at a field strength value selected to etch the first layer at an optimum high rate and with an optimum high selectivity relative to the second layer.

Claim 14

Dependent Claim 26 words

The process of claim 10, wherein the direction of the magnetic field is reversed during the etch process to enhance etch uniformity across the first layer.

Claim 15

Dependent Claim 19 words

The process of claim 10 or 11, wherein the first and second layers are polysilicon and silicon oxide, respectively.

Claim 16

Dependent Claim 28 words

The process of claim 10 or 11, wherein the first and second layers are polysilicon and silicon oxide, respectively, and the reactant gas mixture comprises HCl and chlorine.

Claim 17

Dependent Claim 37 words

The process of claim 10 or 11, wherein the first and second layers are polysilicon and silicon oxide, respectively, the reactant gas mixture comprises HCl and chlorine, and wherein the magnetic field strength is about 60 gauss.

Annuity Stage	Window Opens	Payment Deadline	Surcharge Period Until	Estimated Fee	Status
3.5 Years (Year 4)	1990-05-25	1990-11-24	1991-05-26	$2000.00	Window Closed / Lapsed
7.5 Years (Year 8)	1994-05-25	1994-11-24	1995-05-26	$3760.00	Window Closed / Lapsed
11.5 Years (Year 12)	1998-05-25	1998-11-24	1999-05-26	$7700.00	Window Closed / Lapsed

Magnetron-enhanced plasma etching process

Abstract

Inventors

Bibliographic Details

Claims Analysis

References Cited (Backward Citations)

USPTO Annuity & Maintenance Windows

Assigned Categories & Tags

Assign Category Tag