US5897371A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Alignment process compatible with chemical mechanical polishing
Assignee: Monterey Research LLC
•
Filing: 1996-12-19
•
Granted: 1999-04-27
•
Expires: 2016-12-19
Abstract
Abstract The present invention concerns a process that maintains a second (or "replica") set of alignment marks during existing processing steps used in manufacturing a semiconductor device or integrated circuit, including CMP and other planarization methods. The present invention avoids alignment problems encountered in conventional CMP processes, particularly tungsten CMP. All alignment steps can be realized through one or more subsequent second (or "replica") alignment marks, set and preserved throughout the remaining process steps, thus maintaining alignment integrity. The present method and apparatus concerns a new alignment mark that may be "printed" in a metal layer on the wafer, for example, a local interconnect or contact layer. The new alignment mark is generally not subjected to planarization or to an "open frame" process. The new alignment mark may also be used to re-etch other alignment marks directly onto the layer conventionally causing alignment problems, such as those created following CMP.
Inventors
- 👤 Kuantai Yeh
- 👤 Ahmad Chatila
- 👤 Shahin Sharifzadeh
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 19:52
CPC Classifications
H; H10; H10P; H10P52/00; H10P52/40; H10P52/403; H10W; H10W46/00; H10W46/501; Y; Y10; Y10S; Y10S438/00; Y10S438/975
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
99 words
A method for generating an alignment mark for use in a photolithographic system comprising the steps of: forming a first alignment mark in a first location of a semiconductor wafer; forming a replica alignment mark in a second location of said semiconductor wafer referenced by said first alignment mark separate from said first location; forming over said first alignment mark a planarized and/or opaque metal layer; forming a second alignment mark in a third location on said semiconductor wafer referenced by said replica alignment mark, said third location being separate from said second location; and continuing the fabrication process.
Claim 2
Independent Claim
99 words
A method for generating an alignment mark for use in a photolithographic system comprising the steps of: forming a first alignment mark in a first location of a semiconductor wafer; forming a replica alignment mark in a second location of said semiconductor wafer referenced by said first alignment mark separate from said first location; forming over said first alignment mark a planarized and/or opaque metal layer; forming a second alignment mark in a third location on said semiconductor wafer referenced by said replica alignment mark, said third location being separate from said second location; and continuing the fabrication process.
Claim 3
Dependent Claim
25 words
The method according to claim 1, wherein said step of forming said planarized and/or opaque metal layer comprises: performing a Chemical Mechanical Polishing (CMP) process.
Claim 4
Dependent Claim
12 words
The method according to claim 2 wherein said metal layer comprises tungsten.
Claim 5
Dependent Claim
24 words
The method according to claim 2 further comprising: depositing a layer of conformal material on said wafer prior to forming said second alignment mark.
Claim 6
Independent Claim
99 words
A method for generating an alignment mark for use in a photolithographic system comprising the steps of: etching a first alignment mark having a step height in a first location of a semiconducting wafer; etching a second alignment mark in a second location of said semiconducting wafer referenced by said first alignment mark separate from said first location; coating said first alignment mark with a metal layer; polishing said wafer sufficient to substantially planarize said metal layer; and etching a third alignment mark in a third location of said semiconducting wafer using said second alignment mark as a reference.
Claim 7
Independent Claim
99 words
A method for generating an alignment mark for use in a photolithographic system comprising the steps of: etching a first alignment mark having a step height in a first location of a semiconducting wafer; etching a second alignment mark in a second location of said semiconducting wafer referenced by said first alignment mark separate from said first location; coating said first alignment mark with a metal layer; polishing said wafer sufficient to substantially planarize said metal layer; and etching a third alignment mark in a third location of said semiconducting wafer using said second alignment mark as a reference.
Claim 8
Dependent Claim
15 words
The method according to claim 5 wherein said polishing step comprises Chemical Mechanical Polishing (CMP).
Claim 9
Dependent Claim
12 words
The method according to claim 6 wherein said metal layer comprises tungsten.
Claim 10
Dependent Claim
14 words
The method according to claim 5 wherein said metal layer comprises a non-conformal material.
References Cited (Backward Citations)
US4789648A
Cited
US4954142A
Cited
US4933743A
Cited
US5262354A
Cited
US5371047A
Cited
US5397741A
Cited
US5271798A
Cited
US5433651A
Cited
US5504036A
Cited
US5401691A
Cited
US5503962A
Cited
US5456756A
Cited
US5477058A
Cited
US5738961A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2002-04-26 | 2002-10-26 | 2003-04-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-04-26 | 2006-10-26 | 2007-04-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-04-26 | 2010-10-26 | 2011-04-27 | $7700.00 | Window Closed / Lapsed |