US5885884A
Expired / Lapsed
US
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Process for fabricating a microcrystalline silicon structure
Assignee: Intel Corp
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Filing: 1996-08-27
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Granted: 1999-03-23
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Expires: 2016-08-27
Abstract
Abstract A film primarily comprising silicon crystal grains having a random crystal structure. The average size of the grains are within the range of approximately 50 Å to 500 Å.
Inventors
- 👤 Chia-Hong Jan
- 👤 Sean F. Corcoran
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 11:08
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/24; C; C23; C23C; C23C16/00; C23C16/22; C23C16/24; H10D; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01304; H10D64/01306; H10D64/031; H10D64/035; H10D64/60; H10D64/66; H10D64/661; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10D64/01308; H10D64/0131; H10D64/01312
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
52 words
A method of forming a microsilicon film comprising: a) introducing an amount of silicon into a deposition chamber; b) introducing an amount of chlorine into the deposition chamber, the amount of chlorine being less than approximately 5% of the amount of silicon; and c) providing excitation energy to form the microsilicon film.
Claim 2
Independent Claim
52 words
A method of forming a microsilicon film comprising: a) introducing an amount of silicon into a deposition chamber; b) introducing an amount of chlorine into the deposition chamber, the amount of chlorine being less than approximately 5% of the amount of silicon; and c) providing excitation energy to form the microsilicon film.
Claim 3
Dependent Claim
20 words
The method of claim 1 wherein the amount of silicon is provided by introducing SiH 4 into the deposition chamber.
Claim 4
Dependent Claim
19 words
The method of claim 1 wherein the amount of chlorine is provided by introducing HCl into the deposition chamber.
Claim 5
Dependent Claim
50 words
The method of claim 1 wherein the amount of chlorine is provided by introducing into the deposition chamber a gas selected from the group consisting of SiH 3 Cl, SiH 2 Cl 2 , SiHCl 3 , SiCl 4 , trichloroethylene (TCE), trichloroethane (TCA), dichloroethylene (DCE) and any combination thereof.
Claim 6
Dependent Claim
26 words
The method of claim 1 wherein silicon is introduced into the deposition chamber at a flow rate in the range of approximately 100 to 1,000 sccm.
Claim 7
Dependent Claim
35 words
The method of claim 5 wherein chlorine is introduced into the deposition chamber at a flow rate of less than approximately 5% of the flow rate at which silicon is introduced into the deposition chamber.
Claim 8
Dependent Claim
18 words
The method of claim 1 wherein the amount of chlorine is approximately 1% of the amount of silicon.
Claim 9
Dependent Claim
25 words
The method of claim 1 wherein the excitation energy is thermal energy at a temperature in the range of approximately 500° C. to 800° C.
Claim 10
Dependent Claim
27 words
The method of claim 1 wherein the microsilicon film is formed to a thickness of less than approximately 1,500 Å in a transistor gate electrode formation process.
Claim 11
Independent Claim
65 words
A method of forming a transistor gate electrode comprising a microsilicon film, the method comprising: a) introducing an amount of silicon into a deposition chamber; b) introducing an amount of chlorine into the deposition chamber, the amount of chlorine being less than approximately 5% of the amount of silicon; and c) heating the deposition chamber to form the microsilicon film of the transistor gate electrode.
Claim 12
Independent Claim
65 words
A method of forming a transistor gate electrode comprising a microsilicon film, the method comprising: a) introducing an amount of silicon into a deposition chamber; b) introducing an amount of chlorine into the deposition chamber, the amount of chlorine being less than approximately 5% of the amount of silicon; and c) heating the deposition chamber to form the microsilicon film of the transistor gate electrode.
Claim 13
Dependent Claim
34 words
The method of claim 10 wherein the amount of silicon is provided by introducing SiH 4 into the deposition chamber and the amount of chlorine is provided by introducing HCl into the deposition chamber.
Claim 14
Dependent Claim
27 words
The method of claim 10 wherein the silicon is introduced into the deposition chamber at a flow rate within the range of approximately 100 to 1,000 sccm.
Claim 15
Dependent Claim
30 words
The method of claim 10 wherein the amount of chlorine introduced into the deposition chamber is less than approximately 1% of the amount of silicon introduced into the deposition chamber.
Claim 16
Dependent Claim
24 words
The method of claim 10 wherein the deposition chamber is heated to a temperature in the range of approximately 500° C. to 800° C.
Claim 17
Dependent Claim
33 words
The method of claim 10 wherein the microsilicon film is formed to a thickness of less than approximately 1,500 Å and is subsequently implanted with dopants in a transistor gate electrode formation process.
Claim 18
Independent Claim
102 words
A method of forming a transistor gate electrode comprising: a) introducing an amount of silicon into a deposition chamber at a flow rate; b) introducing an amount of chlorine into the deposition chamber at a flow rate within a range of approximately 0.01% to 5% of the flow rate of silicon; c) providing excitation energy within the deposition chamber to deposit a microsilicon film over a gate oxide to a thickness in the range of approximately 100 Å to 2,000 Å; d) etching portions of the microsilicon film; and e) implanting dopants into the microsilicon film to form a transistor gate electrode.
Claim 19
Independent Claim
102 words
A method of forming a transistor gate electrode comprising: a) introducing an amount of silicon into a deposition chamber at a flow rate; b) introducing an amount of chlorine into the deposition chamber at a flow rate within a range of approximately 0.01% to 5% of the flow rate of silicon; c) providing excitation energy within the deposition chamber to deposit a microsilicon film over a gate oxide to a thickness in the range of approximately 100 Å to 2,000 Å; d) etching portions of the microsilicon film; and e) implanting dopants into the microsilicon film to form a transistor gate electrode.
Claim 20
Dependent Claim
19 words
The method of claim 16 wherein the amount of chlorine is provided by introducing HCl into the deposition chamber.
Claim 21
Dependent Claim
34 words
The method of claim 16 wherein the amount of chlorine is introduced into the deposition chamber at a flow rate within the range of approximately 0.01% to 1% of the flow rate of silicon.
Claim 22
Dependent Claim
33 words
The method of claim 16 wherein the deposition chamber is maintained at a pressure within the range of approximately 1 to 100 pascal during the step of providing excitation energy within the chamber.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2002-03-22 | 2002-09-21 | 2003-03-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-03-22 | 2006-09-21 | 2007-03-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-03-22 | 2010-09-21 | 2011-03-23 | $7700.00 | Window Closed / Lapsed |