Abstract A damascene method of forming planarized interconnects between conductive material layers in trench-isolated cells in an integrated circuit is disclosed. The method includes depositing and patterning a photoresist layer over a portion of an integrated circuit with isolated devices to expose a portion of an isolation trench separating the conductive layers of isolated devices desired to be interconnected. The method further involves etching a portion of the trench refill material, removing the photoresist layer, and depositing a second conductive layer in the trench to replace the material removed by the etching step. The invention also relates to an interconnected, optionally planarized structure that includes a substrate with an isolation trench defining a first device region and a second device region, a first conductive material in the first and second device regions and adjacent to the trench, a layer of first dielectric material in the trench and adjacent to the first conductive material, and a second conductive material in the trench and overlying the first dielectric material and adjacent to the first conductive material.
A method of forming a local interconnect between trench isolated devices in an integrated circuit, wherein adjacent trench-isolated devices comprise a first dielectric layer adjacent a semiconductor substrate, a first conductive material layer overlying said dielectric layer and adjacent to an isolation trench, and a second dielectric material in said trench and adjacent said first dielectric material and said conductive material, the method comprising: selectively etching said second dielectric material to remove a portion of said dielectric material overlying said trench from said trench; and depositing a second conductive layer in said trench to replace said material removed by said etching step and conductively connecting first conductive material lavers of adjacent trench isolated devices through a horizontal plane of said first conductive material layers.
Claim 2
Independent Claim
124 words
A method of forming a local interconnect between trench isolated devices in an integrated circuit, wherein adjacent trench-isolated devices comprise a first dielectric layer adjacent a semiconductor substrate, a first conductive material layer overlying said dielectric layer and adjacent to an isolation trench, and a second dielectric material in said trench and adjacent said first dielectric material and said conductive material, the method comprising: selectively etching said second dielectric material to remove a portion of said dielectric material overlying said trench from said trench; and depositing a second conductive layer in said trench to replace said material removed by said etching step and conductively connecting first conductive material lavers of adjacent trench isolated devices through a horizontal plane of said first conductive material layers.
Claim 3
Dependent Claim
30 words
The method of claim 1, further comprising the step of substantially planarizing said second conductive layer and said first conductive layer to a plane of said first conductive material layer.
Claim 4
Dependent Claim
32 words
The method of claim 2, wherein the step of substantially planarizing said second conductive layer and said first conductive layer is accomplished by one of an etch back and a polish process.
Claim 5
Dependent Claim
22 words
The method of claim 1, further comprising the step of depositing a third dielectric layer adjacent said first and second conductive layers.
Claim 6
Dependent Claim
18 words
The method of claim 1, wherein said first conductive material layers of adjacent trench-isolated devices are the same.