Semiconductor integrated circuit device having a ceramic thin film capacitor

Claim 2

A semiconductor integrated circuit device comprising: a semiconductor substrate; and a laminated capacitor including a lower electrode, a ceramic capacitive film made of a ceramic thin film having a perovskite structure, and an upper electrode which are sequentially formed on a main face of said semiconductor substrate; wherein a sidewall of said upper electrode is placed on an upper face of said ceramic capacitive film inwardly from a sidewall of said ceramic capacitive film, and said sidewall of said ceramic capacitive film is placed on an upper face of said lower electrode inwardly from said sidewall of said lower electrode, wherein the distance between said sidewall of said upper electrode and said sidewall of said ceramic capacitive film, said distance being measured along a surface of said upper face of said ceramic capacitive film, plus a thickness D of said ceramic capacity film measured along a surface of said sidewall of said ceramic capacitive film, equals a length L, and wherein said length L and said thickness D of said ceramic capacitive film have a relationship of L≧2D.

Claim 3

The semiconductor integrated circuit device of claim 1, wherein said surface of said upper face of said ceramic capacitive film forms a first area and said surface of said sidewall of said ceramic capacitive film forms a second area.

Claim 4

A semiconductor integrated circuit device comprising: a semiconductor substrate; and a laminated capacitor including a lower electrode, a ceramic capacitive film made of a ceramic thin film having a perovskite structure, and an upper electrode which are sequentially formed on a main face of said semiconductor substrate; wherein a sidewall of said upper electrode is placed on an upper face of said ceramic capacitive film inwardly from a sidewall of said ceramic capacitive film, and said sidewall of said ceramic capacitive film is placed on an upper face of said lower electrode inwardly from said sidewall of said lower electrode in a part of the peripheral portion of said laminated capacitor, wherein the distance between said sidewall of said upper electrode and said sidewall of said ceramic capacitive film, said distance being measured along a surface of said upper face of said ceramic capacitive film, plus a thickness D of said ceramic capacitive film measured along a surface of said sidewall of said ceramic capacitive film, equals a length L1, wherein said length L1 and said thickness D of said ceramic capacitive film have a relationship of L1≧2D, wherein another sidewall of said upper electrode is placed on said upper face of said ceramic capacitive film flush with another sidewall of said ceramic capacitive film or inwardly from said another sidewall of said ceramic capacitive film, and another part of said peripheral portion of said ceramic capacitive film is provided on said main face of said semiconductor substrate on the outside of another sidewall of said lower electrode in a residual area of said another part of said peripheral portion of said laminated capacitor, wherein the distance between said another sidewall of said lower electrode and said another sidewall of said ceramic capacitive film, said distance being measured along said main face of said semiconductor substrate, equals a length L2, and wherein said length L2 and said thickness D of said ceramic capacitive film have a relationship of L2≧D.

Claim 5

A semiconductor integrated circuit device comprising: a semiconductor substrate; and a laminated capacitor including a lower electrode, a ceramic capacitive film made of a ceramic thin film having a perovskite structure, and an upper electrode which are sequentially formed on a main face of said semiconductor substrate; wherein a sidewall of said upper electrode is placed on an upper face of said ceramic capacitive film inwardly from a sidewall of said ceramic capacitive film, and said sidewall of said ceramic capacitive film is placed on an upper face of said lower electrode inwardly from said sidewall of said lower electrode in a part of the peripheral portion of said laminated capacitor, wherein the distance between said sidewall of said upper electrode and said sidewall of said ceramic capacitive film, said distance being measured along a surface of said upper face of said ceramic capacitive film, plus a thickness D of said ceramic capacitive film measured along a surface of said sidewall of said ceramic capacitive film, equals a length L1, wherein said length L1 and said thickness D of said ceramic capacitive film have a relationship of L1≧2D, wherein another sidewall of said upper electrode is placed on said upper face of said ceramic capacitive film flush with another sidewall of said ceramic capacitive film or inwardly from said another sidewall of said ceramic capacitive film, and another part of said peripheral portion of said ceramic capacitive film is provided on said main face of said semiconductor substrate on the outside of another sidewall of said lower electrode in a residual area of said another part of said peripheral portion of said laminated capacitor, wherein the distance between said another sidewall of said lower electrode and said another sidewall of said ceramic capacitive film, said distance being measured along said main face of said semiconductor substrate, equals a length L2, and wherein said length L2 and said thickness D of said ceramic capacitive film have a relationship of L2≧D.

Claim 6

The semiconductor integrated circuit device of claim 3, wherein said surface of said upper face of said ceramic capacitive film forms a first area and said surface of said sidewall of said ceramic capacitive film forms a second area.