US5258093A
Expired / Lapsed
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Procss for fabricating a ferroelectric capacitor in a semiconductor device
Assignee: NXP USA Inc
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Filing: 1992-12-21
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Granted: 1993-11-02
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Expires: 2012-12-21
Abstract
Abstract An etching process for the patterning of electrodes and a ferroelectric dielectric layer in a ferroelectric capacitor, which is formed in a semiconductor device, is disclosed. A series of overlying layers including a first electrode layer (16), a ferroelectric layer (18), and a second electrode layer (20) are etched to form a ferroelectric capacitor (14) on a semiconductor substrate (10). The second electrode layer (20) is selectively etched in a first aqueous solution containing hydrochloric acid, nitric acid, and a metal etching compound comprised of phosphoric acid, nitric acid, and acetic acid. The ferroelectric layer (18) is selectively etched in a second aqueous solution containing hydrogen peroxide, hydrofluoric acid, and nitric acid. The etch rate of the ferroelectric layer in the second aqueous solution is controlled by selection of the relative concentration of the chemicals used to form the solution. The wet chemical etching process of the invention can be combined with a dry etching process for the purpose of removing dry etch residue following formation of the ferroelectric capacitor (14).
Inventors
- 👤 Papu D. Maniar
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 10:27
CPC Classifications
H; H10; H10P; H10P70/00; H10P70/10; H10P70/15; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/682; H10P50/00; H10P50/20; H10P50/28; H10P50/282; H10P50/283; H10P50/60; H10P50/66; H10P50/663; H10P50/667
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
95 words
A method for fabricating a ferroelectric capacitor in a semiconductor device comprising: providing a substrate having a first electrode layer disposed thereon; forming a ferroelectric layer overlying the first electrode; forming a second electrode layer overlying the ferroelectric layer; selectively etching the second electrode layer in a first aqueous solution including hydrochloric acid, nitric acid, and a metal etching compound having phosphoric acid, nitric acid, and acetic acid, wherein the ferroelectric layer is not substantially etched; and selectively etching the ferroelectric layer in a second aqueous solution including hydrogen peroxide, hydrofluoric acid, and nitric acid.
Claim 2
Independent Claim
95 words
A method for fabricating a ferroelectric capacitor in a semiconductor device comprising: providing a substrate having a first electrode layer disposed thereon; forming a ferroelectric layer overlying the first electrode; forming a second electrode layer overlying the ferroelectric layer; selectively etching the second electrode layer in a first aqueous solution including hydrochloric acid, nitric acid, and a metal etching compound having phosphoric acid, nitric acid, and acetic acid, wherein the ferroelectric layer is not substantially etched; and selectively etching the ferroelectric layer in a second aqueous solution including hydrogen peroxide, hydrofluoric acid, and nitric acid.
Claim 3
Dependent Claim
82 words
The process of claim 1, wherein the first aqueous solution comprises from about 55 to 79 weight % water, and from about 12 to 23 weight % hydrochloric acid, and from about 4 to 10 weight % nitric acid, and from about 5 to 12 weight % metal etching compound, wherein the metal etching compound includes about 60 to 80 weight % phosphoric acid, about 10 to 25 weight % acetic acid, about 0.1 to 5.0 weight % nitric acid, and water.
Claim 4
Dependent Claim
25 words
The process of claim 2, wherein the first aqueous solution is maintained at a temperature of about 70° to 80° C. during the etching process.
Claim 5
Dependent Claim
50 words
The process of claim 1, wherein the second aqueous solution comprises from about 0.02 to 0.7 weight % hydrofluoric acid, and and from about 1 to 5 weight % nitric acid, and from about 0 to 50 weight % hydrogen peroxide, and from about 44.3 to 98.98 weight % water.
Claim 6
Dependent Claim
33 words
The process of claim 1 further comprising the step of monitoring the selective etching of the ferroelectric compound to detect the evolution of gaseous reaction products signifying the endpoint of the selective etch.
Claim 7
Dependent Claim
150 words
A process for fabricating a ferroelectric capacitor in a semiconductor device comprising the steps of: providing a substrate having a platinum layer and a crystallized ferroelectric layer, wherein the platinum layer lies over the substrate and the crystallized ferroelectric layer lies over the platinum layer; forming a photoresist pattern on the platinum layer; and selectively etching the platinum layer in an aqueous solution including from about 55 to 79 weight % water, and from about 12 to 23 weight % hydrochloric acid, and from about 4 to 10 weight % nitric acid, and from about 5 to 12 weight % metal etching compound, wherein the metal etching compound has about 60 to 80 weight % phosphoric acid, about 10 to 25 weight % acetic acid, about 0.1 to 5.0 weight % nitric acid, and water, wherein the aqueous solution does not substantially etch the photoresist layer or the ferroelectric layer.
Claim 8
Dependent Claim
150 words
A process for fabricating a ferroelectric capacitor in a semiconductor device comprising the steps of: providing a substrate having a platinum layer and a crystallized ferroelectric layer, wherein the platinum layer lies over the substrate and the crystallized ferroelectric layer lies over the platinum layer; forming a photoresist pattern on the platinum layer; and selectively etching the platinum layer in an aqueous solution including from about 55 to 79 weight % water, and from about 12 to 23 weight % hydrochloric acid, and from about 4 to 10 weight % nitric acid, and from about 5 to 12 weight % metal etching compound, wherein the metal etching compound has about 60 to 80 weight % phosphoric acid, about 10 to 25 weight % acetic acid, about 0.1 to 5.0 weight % nitric acid, and water, wherein the aqueous solution does not substantially etch the photoresist layer or the ferroelectric layer.
Claim 9
Dependent Claim
48 words
The process of claim 6 further comprising the step of exposing the platinum layer to a cleaning solution prior to selective etching the platinum layer, wherein the cleaning solution includes from about 3 to 12 weight % hydrogen peroxide, and from about 97 to 88 weight % water.
Claim 10
Dependent Claim
20 words
The process of claim 7, wherein the cleaning solution is maintained at a temperature of about 30° to 50° C.
Claim 11
Dependent Claim
24 words
The process of claim 6, wherein the aqueous solution is maintained at a temperature of about 70° to 80° C. during the etching process.
Claim 12
Dependent Claim
122 words
A process for fabricating a ferroelectric capacitor in a semiconductor device comprising the steps of: providing a substrate having a platinum layer and a crystallized ferroelectric layer, wherein the platinum layer lies over the substrate and the crystallized ferroelectric layer lies over the platinum layer; forming an etching mask on the ferroelectric layer; selectively etching the ferroelectric layer in an aqueous solution including from about 0.02 to 0.7 weight % hydrofluoric acid, and from about 1 to 5 weight % nitric acid, and from about 1 to 50 weight % hydrogen peroxide, and from about 43.3 to 98.98 weight % water; and monitoring the selective etching process to detect the evolution of gaseous reaction products signifying the endpoint of the selective etch.
Claim 13
Dependent Claim
122 words
A process for fabricating a ferroelectric capacitor in a semiconductor device comprising the steps of: providing a substrate having a platinum layer and a crystallized ferroelectric layer, wherein the platinum layer lies over the substrate and the crystallized ferroelectric layer lies over the platinum layer; forming an etching mask on the ferroelectric layer; selectively etching the ferroelectric layer in an aqueous solution including from about 0.02 to 0.7 weight % hydrofluoric acid, and from about 1 to 5 weight % nitric acid, and from about 1 to 50 weight % hydrogen peroxide, and from about 43.3 to 98.98 weight % water; and monitoring the selective etching process to detect the evolution of gaseous reaction products signifying the endpoint of the selective etch.
Claim 14
Dependent Claim
24 words
The process of claim 10, wherein the aqueous solution is maintained at a temperature of about 70° to 80° C. during the etching process.
Claim 15
Dependent Claim
204 words
A process for fabricating a ferroelectric capacitor in a semiconductor device comprising the steps of: providing a substrate having a crystallized ferroelectric capacitor, wherein the crystallized ferroelectric capacitor includes a platinum layer and a crystallized ferroelectric layer, wherein the crystallized ferroelectric layer lies over the platinum layer; etching the ferroelectric layer in a dry etching process selected from a group consisting of ion milling and plasma etching; and cleaning the surface of the substrate with an aqueous solution selected from the group consisting of a dielectric etching solution containing from about 0.02 to 0.7 weight % hydrofluoric acid, and from about 1 to 5 weight % nitric acid, and from about 1 to 50 weight % hydrogen peroxide, and from about 43.3 to 98.98 weight % water, and a platinum etching solution including from about 55 to 79 weight % water, and from about 12 to 23 weight % hydrochloric acid, and from about 4 to 10 weight % nitric acid, and from about 5 to 12 weight % metal etching compound, wherein the metal etching compound has about 60 to 80 weight % phosphoric acid, about 10 to 25 weight % acetic acid, about 0.1 to 5.0 weight % nitric acid, and water.
Claim 16
Dependent Claim
204 words
A process for fabricating a ferroelectric capacitor in a semiconductor device comprising the steps of: providing a substrate having a crystallized ferroelectric capacitor, wherein the crystallized ferroelectric capacitor includes a platinum layer and a crystallized ferroelectric layer, wherein the crystallized ferroelectric layer lies over the platinum layer; etching the ferroelectric layer in a dry etching process selected from a group consisting of ion milling and plasma etching; and cleaning the surface of the substrate with an aqueous solution selected from the group consisting of a dielectric etching solution containing from about 0.02 to 0.7 weight % hydrofluoric acid, and from about 1 to 5 weight % nitric acid, and from about 1 to 50 weight % hydrogen peroxide, and from about 43.3 to 98.98 weight % water, and a platinum etching solution including from about 55 to 79 weight % water, and from about 12 to 23 weight % hydrochloric acid, and from about 4 to 10 weight % nitric acid, and from about 5 to 12 weight % metal etching compound, wherein the metal etching compound has about 60 to 80 weight % phosphoric acid, about 10 to 25 weight % acetic acid, about 0.1 to 5.0 weight % nitric acid, and water.
Claim 17
Dependent Claim
21 words
The process of claim 12 further comprising forming a mask to protect the ferroelectric capacitor prior to cleaning the substrate surface.
References Cited (Backward Citations)
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