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US5804499A Expired / Lapsed US ⏱️ 0.0 years remaining

Prevention of abnormal WSix oxidation by in-situ amorphous silicon deposition

Assignee: Polaris Innovations Ltd
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Filing: 1996-05-03
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Granted: 1998-09-08
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Expires: 2016-05-03
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Abstract

Abstract A process which prevents abnormal WSi x oxidation during subsequent LPCVD insulator deposition and gate sidewall oxidation, uses an in-situ deposition of a thin amorphous silicon layer on top of the tungsten silicide as well as the deposition of an amorphous spacer after gate stack patterning, respectively.

Inventors

  • 👤 Christine Dehm
  • 👤 Reinhard J. Stengl
  • 👤 Hans-Joerg Timme

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 07:29
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10D; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01304; H10D64/01306; H10D64/01308; H10D64/01312; H10D64/01354

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 67 words
A process which prevents abnormal WSi x oxidation and provides Si by homogenous WSi x formation in the manufacturing of integrated circuit devices comprising the steps of: forming in a vacuum DCS WSi x /doped polysilicon interconnect structures for the integrated circuit devices; without breaking said vacuum, depositing an amorphous silicon layer on the interconnect structures; and, forming a native oxide on said deposited amorphous silicon layer.
Claim 2
Dependent Claim 67 words
A process which prevents abnormal WSi x oxidation and provides Si by homogenous WSi x formation in the manufacturing of integrated circuit devices comprising the steps of: forming in a vacuum DCS WSi x /doped polysilicon interconnect structures for the integrated circuit devices; without breaking said vacuum, depositing an amorphous silicon layer on the interconnect structures; and, forming a native oxide on said deposited amorphous silicon layer.
Claim 3
Dependent Claim 28 words
The process according to claim 1 further comprising the step of depositing an insulating material at temperatures between 700° and 900° C. over the native oxide/amorphous silicon layer.
Claim 4
Dependent Claim 14 words
The process according to claim 2 wherein the insulating material is a LPCVD nitride.
Claim 5
Dependent Claim 19 words
The process according claim 1 further comprising the step of depositing a LPCVD nitride over the amorphous silicon layer.
Claim 6
Dependent Claim 95 words
A process which prevents abnormal WSi x oxidation and provides Si by homogenous WSi x formation in the manufacturing of integrated circuit devices comprising the step of: growing agate oxide; depositing on said gate oxide DCS WSi x /doped polysilicon interconnect structures for the integrated circuit devices, wherein said interconnect structure serves as a gate for an electronic device; depositing an amorphous silicon layer on the interconnect structures; and depositing by CVD deposition an amorphous silicon spacer on gate sidewalls after gate stack patterning to avoid abnormal DCS WSi x oxidation during gate sidewalls oxidation.
Claim 7
Dependent Claim 95 words
A process which prevents abnormal WSi x oxidation and provides Si by homogenous WSi x formation in the manufacturing of integrated circuit devices comprising the step of: growing agate oxide; depositing on said gate oxide DCS WSi x /doped polysilicon interconnect structures for the integrated circuit devices, wherein said interconnect structure serves as a gate for an electronic device; depositing an amorphous silicon layer on the interconnect structures; and depositing by CVD deposition an amorphous silicon spacer on gate sidewalls after gate stack patterning to avoid abnormal DCS WSi x oxidation during gate sidewalls oxidation.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-09-07 2002-03-09 2002-09-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-09-07 2006-03-09 2006-09-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-09-07 2010-03-09 2010-09-08 $7700.00 Window Closed / Lapsed

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