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US5798903A Expired / Lapsed US ⏱️ 0.0 years remaining

Electrode structure for ferroelectric capacitor integrated on silicon

Assignee: University of Maryland, Baltimore
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Filing: 1995-12-26
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Granted: 1998-08-25
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Expires: 2015-12-26
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Abstract

Abstract A ferroelectric capacitor structure and its method of making in which a ferroelectric stack of two metal-oxide electrodes sandwiching a ferroelectric layer is fabricated on a silicon substrate with an intervening barrier layer, preferably of TiN. In one embodiment, a platinum layer is grown between the TiN and the lower metal-oxide electrode at a sufficiently high temperature that provides crystallographically ordered growth of the ferroelectric stack. In another embodiment, the platinum layer was completely eliminated with the lower electrode being grown directly on the TiN. Although the conventional conductive metal-oxide used in the electrode is lanthanum strontium cobalt oxide (LSCO), lanthanum nickel oxide provides good electrical and lifetime characteristics in a ferroelectric cell. Alternatively, the electrodes can be formed of the rock-salt metal oxides, such as neodymium oxide (NdO).

Inventors

  • 👤 Anil M. Dhote
  • 👤 Ramamoorthy Ramesh

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 18:53
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/692; H10D1/696; H10D1/682; H10P; H10P14/00; H10P14/40; H10P14/418

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 148 words
A ferroelectric capacitor, comprising: a substrate; a lower electrode formed on said substrate and including a conductive metal-oxide layer, said lower electrode forming a mesa over said substrate; an insulating layer comprising a perovskite material overlying an outer peripheral portion of a top of said mesa, overlying the sides of said mesa, and overlying a portion of an upper surface of said substrate surrounding said mesa, an aperture through said insulating layer being formed in a center of said top of said mesa; a ferroelectric layer formed over a portion of said electrode exposed in said aperture of said insulating layer and over portions of said insulating layer on said top of said mesa, on said sides of said mesa, and on at least part of said insulating layer overlying said portion of said upper surface of said substrate; and an upper electrode formed over said ferroelectric layer.
Claim 2
Dependent Claim 148 words
A ferroelectric capacitor, comprising: a substrate; a lower electrode formed on said substrate and including a conductive metal-oxide layer, said lower electrode forming a mesa over said substrate; an insulating layer comprising a perovskite material overlying an outer peripheral portion of a top of said mesa, overlying the sides of said mesa, and overlying a portion of an upper surface of said substrate surrounding said mesa, an aperture through said insulating layer being formed in a center of said top of said mesa; a ferroelectric layer formed over a portion of said electrode exposed in said aperture of said insulating layer and over portions of said insulating layer on said top of said mesa, on said sides of said mesa, and on at least part of said insulating layer overlying said portion of said upper surface of said substrate; and an upper electrode formed over said ferroelectric layer.
Claim 3
Dependent Claim 14 words
The ferroelectric capacitor of claim 1, wherein said perovskite material comprises a layered perovskite.
Claim 4
Dependent Claim 13 words
The ferroelectric capacitor of claim 2, wherein said perovskite material comprises bismuth titanate.

References Cited (Backward Citations)

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US5406445A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-08-24 2002-02-23 2002-08-25 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-08-24 2006-02-23 2006-08-25 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-08-24 2010-02-23 2010-08-25 $7700.00 Window Closed / Lapsed

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