US5406445A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Thin film capacitor and method of manufacturing the same
Assignee: Panasonic Holdings Corp
•
Filing: 1994-03-24
•
Granted: 1995-04-11
•
Expires: 2014-03-24
Abstract
Abstract A NaCl oxide thin layer oriented to (100) face or a spinel oxide thin layer oriented to (100) face, a perovskite dielectric thin layer oriented to (100) face and a metal electrode are sequentially laminated on a metal electrode, thus providing a thin film capacitor. Or alternatively, a thin film capacitor is manufactured by sequentially laminating a NaCl oxide thin layer oriented to (100) face or a spinel oxide thin layer oriented to (100) face, a platinum thin layer as a lower electrode oriented to (100) face, a perovskite dielectric thin layer oriented to (100) face and a metal thin layer as an upper electrode on a substrate. A plasma-enhanced CVD method is applied to form a NaCl oxide thin layer, a spinel oxide thin layer and a perovskite dielectric thin layer while a vacuum deposition method, a sputtering method, a CVD method or a plasma-enhanced CVD method is applied for the formation of a metal electrode.
Inventors
- 👤 Eiji Fujii
- 👤 Atsushi Tomozawa
- 👤 Hideo Torii
- 👤 Masumi Hattori
- 👤 Ryoichi Takayama
- 👤 Satoru Fujii
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 16:46
CPC Classifications
H; H01; H01G; H01G4/00; H01G4/002; H01G4/018; H01G4/20; H10; H10W; H10W72/00; H10W72/071; H10W72/075; H10W72/07551; H10W72/07554; H10W74/00
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
96 words
A thin film capacitor comprising a lower electrode directly or indirectly formed on a metal electrode substrate or a nonelectrode substrate, a dielectric thin layer directly or indirectly formed on said lower electrode and an upper electrode formed on said dielectric thin layer, wherein said dielectric thin layer is a perovskite dielectric thin layer oriented to (100) face, and wherein at least one layer selected from the group consisting of a NaCl oxide thin layer oriented to (100) face and a spinel oxide thin layer oriented to (100) face is formed below said dielectric thin layer.
Claim 2
Dependent Claim
96 words
A thin film capacitor comprising a lower electrode directly or indirectly formed on a metal electrode substrate or a nonelectrode substrate, a dielectric thin layer directly or indirectly formed on said lower electrode and an upper electrode formed on said dielectric thin layer, wherein said dielectric thin layer is a perovskite dielectric thin layer oriented to (100) face, and wherein at least one layer selected from the group consisting of a NaCl oxide thin layer oriented to (100) face and a spinel oxide thin layer oriented to (100) face is formed below said dielectric thin layer.
Claim 3
Dependent Claim
51 words
A thin film capacitor according to claim 1, wherein the at least one layer selected from the group consisting of the NaCl oxide thin layer oriented to (100) face and the spinel oxide thin layer oriented to (100) face is formed between the lower electrode and the perovskite dielectric thin layer.
Claim 4
Dependent Claim
41 words
A thin film capacitor according to claim 1, wherein the perovskite dielectric thin layer is selected from the group consisting of (Ba 1-X Sr)TiO 3 where 0≦X≦1.0 and Pb{(Mg 1/3 , Nb 2/3 ) 1-Y Ti Y }O 3 where 0≦Y≦1.0.
Claim 5
Dependent Claim
41 words
A thin film capacitor according to claim 1, wherein the NaCl oxide thin layer is at least one layer selected from the group consisting of a magnesium oxide thin layer, a cobalt oxide thin layer and a nickel oxide thin layer.
Claim 6
Dependent Claim
30 words
A thin film capacitor according to claim 1, wherein the spinel oxide thin layer mainly comprises at least one element selected from the group consisting of iron, cobalt and aluminum.
Claim 7
Dependent Claim
41 words
A thin film capacitor according to claim 1, wherein the lower electrode, the NaCl oxide thin layer oriented to (100) face, the perovskite dielectric thin layer oriented to (100) face and the upper electrode are sequentially laminated on the nonelectrode substrate.
Claim 8
Dependent Claim
50 words
A thin film capacitor according to claim 1, wherein the lower electrode, the spinel oxide thin layer oriented to (100) face, the NaCl oxide thin layer oriented to (100) face, the perovskite dielectric thin layer oriented to (100) face and the upper electrode are sequentially laminated on the nonelectrode substrate.
Claim 9
Dependent Claim
41 words
A thin film capacitor according to claim 1, wherein the NaCl oxide thin layer oriented to (100) face, the lower electrode, the perovskite dielectric thin layer oriented to (100) face and the upper electrode are sequentially laminated on the nonelectrode substrate.
Claim 10
Dependent Claim
41 words
A thin film capacitor according to claim 1, wherein the spinel oxide thin layer oriented to (100) face, the lower electrode, the perovskite dielectric thin layer oriented to (100) face and the upper electrode are sequentially laminated on the nonelectrode substrate.
Claim 11
Independent Claim
181 words
A method of manufacturing a thin film capacitor comprising the steps of: forming a lower electrode directly or indirectly on a metal substrate or a nonelectrode substrate by at least one method selected from the group consisting of a sputtering method, a vacuum deposition method, a CVD method and a plasma-enhanced CVD method; forming a dielectric thin layer directly or indirectly on the surface of said lower electrode by a plasma-enhanced CVD method; forming an upper electrode on the surface of said dielectric thin layer by at least one method selected from the group consisting of a sputtering method, a vacuum deposition method, a CVD method and a plasma-enhanced CVD method; wherein at least one layer selected from the group consisting of a NaCl oxide thin layer oriented to (100) face and a spinel oxide thin layer oriented to (100) face is formed on the top or the bottom surface of said lower electrode by a plasma-enhanced CVD method, and wherein a perovskite dielectric thin layer oriented to (100) face is formed below the upper electrode by a plasma-enhanced CVD method.
Claim 12
Independent Claim
181 words
A method of manufacturing a thin film capacitor comprising the steps of: forming a lower electrode directly or indirectly on a metal substrate or a nonelectrode substrate by at least one method selected from the group consisting of a sputtering method, a vacuum deposition method, a CVD method and a plasma-enhanced CVD method; forming a dielectric thin layer directly or indirectly on the surface of said lower electrode by a plasma-enhanced CVD method; forming an upper electrode on the surface of said dielectric thin layer by at least one method selected from the group consisting of a sputtering method, a vacuum deposition method, a CVD method and a plasma-enhanced CVD method; wherein at least one layer selected from the group consisting of a NaCl oxide thin layer oriented to (100) face and a spinel oxide thin layer oriented to (100) face is formed on the top or the bottom surface of said lower electrode by a plasma-enhanced CVD method, and wherein a perovskite dielectric thin layer oriented to (100) face is formed below the upper electrode by a plasma-enhanced CVD method.
Claim 13
Dependent Claim
68 words
A method according to claim 10, wherein at least one layer selected from the group consisting of the NaCl oxide thin layer oriented to (100) face and the spinel oxide thin layer oriented to (100) face is formed on the lower electrode by a plasma-enhanced CVD method, and wherein the perovskite dielectric thin layer is formed on said NaCl oxide thin layer or said spinel oxide thin layer.
Claim 14
Dependent Claim
41 words
A method according to claim 10, wherein the perovskite dielectric thin layer is selected from the group consisting of (Ba 1-X Sr X )TiO 3 where 0≦X≦1.0 and Pb{(Mg 1/3 , Nb 2/3 ) 1-Y Ti Y }O 3 where 0≦Y≦1.0.
Claim 15
Dependent Claim
37 words
A method according to claim 10, wherein the NaCl oxide thin layer is a layer selected from the group consisting of a magnesium oxide thin layer, a cobalt oxide thin layer and a nickel oxide thin layer.
Claim 16
Dependent Claim
28 words
A method according to claim 10, wherein the spinel oxide thin layer mainly comprises at least one element selected from the group consisting of iron, cobalt and aluminum.
References Cited (Backward Citations)
JPS63237514A
Cited
US5006363A
Cited
JPH04184911A
Cited
US5142437A
Cited
US5331187A
Cited
US5212620A
Cited
US5323023A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-04-10 | 1998-10-10 | 1999-04-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-04-10 | 2002-10-10 | 2003-04-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-04-10 | 2006-10-10 | 2007-04-11 | $7700.00 | Window Closed / Lapsed |