US5780352A
Expired / Lapsed
US
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Method of forming an isolation oxide for silicon-on-insulator technology
Assignee: NXP USA Inc
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Filing: 1995-10-23
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Granted: 1998-07-14
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Expires: 2015-10-23
Abstract
Abstract A method of forming an isolation oxide (30) on a silicon-on-insulator (SOI) substrate (21) includes disposing a mask layer (26, 27) over a region of a silicon layer (24) of the SOI substrate (21). The isolation oxide (30) is grown in a different region (28) of the silicon layer (24). The isolation oxide (30) is grown to a depth (32) within the silicon layer (24) of less than or equal to a thickness (29) of the silicon layer (24). After removing the mask layer (26, 27), the isolation oxide (30) is further grown in the different region (28) of the silicon layer (24) such that the isolation oxide (30) is coupled to a buried electrically insulating layer (23) within the SOI substrate (21). The buried electrically insulating layer (23) and the isolation oxide (30) electrically isolate an active region (43) of a semiconductor device (20).
Inventors
- 👤 Heemyong Park
- 👤 Wen-Ling Margaret Huang
- 👤 Juergen Foerstner
- 👤 Marco Racanelli
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 14:40
CPC Classifications
H; H10; H10W; H10W10/00; H10P; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10P14/00; H10P14/60; H10P14/61; H10W10/01; H10W10/061; H10W10/10; H10W10/181; H10W10/011; H10W10/012; H10W10/13
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
137 words
A method of forming a semiconductor device comprising: providing a silicon-on-insulator substrate with an insulator layer beneath a silicon layer, the silicon layer having a thickness; disposing a mask layer over a first region of the silicon layer; forming a first portion of the isolation oxide in a second region of the silicon layer after disposing the mask layer, the first portion of the isolation oxide formed to a depth into the silicon layer of less than or equal to the thickness of the silicon layer; removing the mask layer after forming the first portion of the isolation oxide; and forming a second portion of the isolation oxide in the second region of the silicon layer after removing the mask layer wherein the second portion of the isolation oxide contacts the first portion of the isolation oxide.
Claim 2
Independent Claim
137 words
A method of forming a semiconductor device comprising: providing a silicon-on-insulator substrate with an insulator layer beneath a silicon layer, the silicon layer having a thickness; disposing a mask layer over a first region of the silicon layer; forming a first portion of the isolation oxide in a second region of the silicon layer after disposing the mask layer, the first portion of the isolation oxide formed to a depth into the silicon layer of less than or equal to the thickness of the silicon layer; removing the mask layer after forming the first portion of the isolation oxide; and forming a second portion of the isolation oxide in the second region of the silicon layer after removing the mask layer wherein the second portion of the isolation oxide contacts the first portion of the isolation oxide.
Claim 3
Dependent Claim
38 words
The method according to claim 1, further including growing the second portion of the isolation oxide at a first temperature greater than a second temperature at which viscous flow of the isolation oxide occurs within the silicon layer.
Claim 4
Dependent Claim
21 words
The method according to claim 2, further including growing the second portion of the isolation oxide in a dry oxygen ambient.
Claim 5
Dependent Claim
19 words
The method according to claim 2, further including providing a temperature of approximately 960° C. for the second temperature.
Claim 6
Dependent Claim
30 words
The method according to claim 2, further comprising growing the first portion of the isolation oxide in a wet oxygen ambient at a third temperature greater than the second temperature.
Claim 7
Dependent Claim
28 words
The method according to claim 1, further including: providing a silicon nitride layer for the mask layer; and providing a pad oxide layer under the silicon nitride layer.
Claim 8
Dependent Claim
18 words
The method according to claim 6, further including providing a polycrystalline silicon layer under the silicon nitride layer.
Claim 9
Dependent Claim
43 words
The method according to claim 1, further comprising: providing approximately 500 to 3,000 angstroms for the thickness of the silicon layer; and growing the first portion of the isolation oxide to within approximately 600 angstroms less than the thickness of the silicon layer.
Claim 10
Independent Claim
177 words
A method of manufacturing a semiconductor device comprising: providing a substrate having a semiconductor layer over an insulator layer, the semiconductor layer containing an active region; disposing an oxidation barrier over the active region; thermally forming a first portion of an isolation oxide in a region of the semiconductor layer contiguous to the active region, the first portion of the isolation oxide separated from the insulator layer and adjacent to the oxidation barrier; removing the oxidation barrier after thermally forming the first portion of the isolation oxide; and thermally forming a second portion of the isolation oxide in the region of the semiconductor layer at a first temperature greater than a second temperature at which viscous flow of the isolation oxide in the semiconductor layer occurs, the second portion of the isolation oxide coupled to the insulator layer to electrically isolate the active region of the semiconductor device wherein the step of thermally forming the second portion of the isolation oxide occurs after removing the oxidation barrier and before disposing another oxidation barrier over the active region.
Claim 11
Independent Claim
177 words
A method of manufacturing a semiconductor device comprising: providing a substrate having a semiconductor layer over an insulator layer, the semiconductor layer containing an active region; disposing an oxidation barrier over the active region; thermally forming a first portion of an isolation oxide in a region of the semiconductor layer contiguous to the active region, the first portion of the isolation oxide separated from the insulator layer and adjacent to the oxidation barrier; removing the oxidation barrier after thermally forming the first portion of the isolation oxide; and thermally forming a second portion of the isolation oxide in the region of the semiconductor layer at a first temperature greater than a second temperature at which viscous flow of the isolation oxide in the semiconductor layer occurs, the second portion of the isolation oxide coupled to the insulator layer to electrically isolate the active region of the semiconductor device wherein the step of thermally forming the second portion of the isolation oxide occurs after removing the oxidation barrier and before disposing another oxidation barrier over the active region.
Claim 12
Dependent Claim
31 words
The method according to claim 9, further including thermally growing the first portion of the isolation oxide in a wet oxygen ambient at a third temperature greater than the second temperature.
Claim 13
Dependent Claim
22 words
The method according to claim 9, further including thermally growing the second portion of the isolation oxide in a dry oxygen ambient.
Claim 14
Dependent Claim
53 words
The method according to claim 9, further comprising: providing a pad oxide layer over the active region before thermally forming the first portion of the isolation oxide; and providing a layer of polycrystalline silicon between the pad oxide layer and the oxidation barrier before thermally forming the first portion of the isolation oxide.
Claim 15
Dependent Claim
17 words
The method according to claim 9, further comprising providing a silicon nitride layer for the oxidation barrier.
Claim 16
Dependent Claim
40 words
The method according to claim 9, further comprising providing a second region of the semiconductor layer separating the first portion of the isolation oxide from the insulator layer, the second region having a thickness of less than approximately 600 Å.
Claim 17
Independent Claim
209 words
A method of forming a semiconductor device comprising: providing a silicon-on-insulator substrate comprising a buried oxide layer beneath a silicon layer having a first thickness; growing a pad oxide layer over the silicon-on-insulator substrate; depositing a silicon nitride layer to cover a first region of the pad oxide layer and a first region of the silicon layer; growing a first portion of the isolation oxide in a second region of the silicon layer over the buried oxide layer, the first portion of the isolation oxide grown to a depth into the silicon layer of less than or equal to the first thickness of the silicon layer; removing the silicon nitride layer after growing the first portion of the isolation oxide; and simultaneously thermally growing an other oxide layer and a second portion of the isolation oxide at a first temperature greater than approximately 960° C. and in a dry oxygen ambient and after removing the silicon nitride layer, the second portion of the isolation oxide located in the second region of the silicon layer and contacting the buried oxide layer and contacting the first portion of the isolation oxide, the other oxide layer located over the first region of the silicon layer and thermally grown to a second thickness.
Claim 18
Independent Claim
209 words
A method of forming a semiconductor device comprising: providing a silicon-on-insulator substrate comprising a buried oxide layer beneath a silicon layer having a first thickness; growing a pad oxide layer over the silicon-on-insulator substrate; depositing a silicon nitride layer to cover a first region of the pad oxide layer and a first region of the silicon layer; growing a first portion of the isolation oxide in a second region of the silicon layer over the buried oxide layer, the first portion of the isolation oxide grown to a depth into the silicon layer of less than or equal to the first thickness of the silicon layer; removing the silicon nitride layer after growing the first portion of the isolation oxide; and simultaneously thermally growing an other oxide layer and a second portion of the isolation oxide at a first temperature greater than approximately 960° C. and in a dry oxygen ambient and after removing the silicon nitride layer, the second portion of the isolation oxide located in the second region of the silicon layer and contacting the buried oxide layer and contacting the first portion of the isolation oxide, the other oxide layer located over the first region of the silicon layer and thermally grown to a second thickness.
Claim 19
Dependent Claim
30 words
The method according to claim 15, further comprising growing the first portion of the isolation oxide to within approximately 600 Å of the buried oxide layer of the silicon-on-insulator substrate.
Claim 20
Dependent Claim
30 words
The method according to claim 15, further comprising growing the first portion of the isolation oxide at a second temperature greater than 960° C. and in a wet oxygen ambient.
Claim 21
Dependent Claim
50 words
The method according to claim 15, further comprising: disposing a polycrystalline silicon layer over the first region of the pad oxide layer before depositing the silicon nitride layer; and removing the polycrystalline silicon layer before simultaneously thermally growing the other oxide layer and the second portion of the isolation oxide.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-07-13 | 2002-01-12 | 2002-07-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-07-13 | 2006-01-12 | 2006-07-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-07-13 | 2010-01-12 | 2010-07-14 | $7700.00 | Window Closed / Lapsed |