US5151381A
Expired / Lapsed
US
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Method for local oxidation of silicon employing two oxidation steps
Assignee: Advanced Micro Devices Inc
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Filing: 1989-11-15
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Granted: 1992-09-29
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Expires: 2009-11-15
Abstract
Abstract A process of forming field oxide regions using a field oxidation performed in a dry oxidation environment in a temperature equal to or greater than approximately 1000° C. The dry oxidation reduces or eliminates the formation of Kooi ribbons, and the high temperature field oxidation allows the field oxide to flow, thereby reducing physical stresses normally associated with field oxidation performed at temperatures below 1000° C. The high temperature field oxidation also greatly reduces the ratio of the length of the bird's beaks formed during the field oxidation to the thickness of the field oxide, allowing smaller active regions to be formed. The thinner field oxide regions, in turn, make it possible to perform the field implant after the field oxidation, thereby avoiding the lateral encroachment problem and controlling source to drain or drain to source punch-through under the gate. Further, the high temperature field oxidation allows the well implant drive and the field oxidation to be performed simultaneously.
Inventors
- 👤 Yowjuang B. Liu
- 👤 Steven W. Longcor
- 👤 Jih-Chang Lein
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 10:28
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/61; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/012; H10W10/0125; H10W10/0126; H10W10/0127; H10W10/10; H10W10/13
Claims Analysis
Total Claims: 25
Claim 1
Independent Claim
84 words
A method of forming field oxide regions in a semiconductor substrate, comprising the steps of: (a) providing a barrier oxide layer overlying the substrate; (b) providing a non-oxidizable masking layer overlying portions of the barrier oxide layer corresponding to active regions; (c) oxidizing the substrate in a dry oxygen environment at a temperature less than 1,050° C. after said step (b); and (d) oxidizing the substrate in a dry oxygen environment including HCl at a temperature greater than 1,050° C. after said step (c).
Claim 2
Independent Claim
84 words
A method of forming field oxide regions in a semiconductor substrate, comprising the steps of: (a) providing a barrier oxide layer overlying the substrate; (b) providing a non-oxidizable masking layer overlying portions of the barrier oxide layer corresponding to active regions; (c) oxidizing the substrate in a dry oxygen environment at a temperature less than 1,050° C. after said step (b); and (d) oxidizing the substrate in a dry oxygen environment including HCl at a temperature greater than 1,050° C. after said step (c).
Claim 3
Dependent Claim
43 words
A method according to claim 1, wherein: said step (a) comprises providing a barrier oxide layer having a thickness x; said step (b) comprises providing a masking layer having a thickness y; and the ratio y/x is equal to or greater than 5.
Claim 4
Dependent Claim
57 words
A method according to claim 1, wherein: said step (a) comprises providing a barrier oxide layer having a thickness x, where x is greater than approximately 50Å; said step (b) comprises providing a masking layer having a thickness y, where y is greater than approximately 1,000Å; and the ratio y/x is equal to or greater than 10.
Claim 5
Dependent Claim
26 words
A method according to claim 1, wherein said step (d) comprises oxidizing the substrate at a temperature ranging from approximately 1,100° C. to approximately 1,250° C.
Claim 6
Dependent Claim
20 words
A method according to claim 1, further comprising the step (e) of performing a field implant after said step (d).
Claim 7
Dependent Claim
58 words
A method according to claim 1, further comprising the step of (e) implanting a dopant having a conductivity type opposite to the conductivity type of the substrate in a portion of the substrate prior to said step (c), wherein said steps (c) and (d) comprise driving the dopant implanted in said step (e) and concurrently oxidizing the substrate.
Claim 8
Dependent Claim
37 words
A method according to claim 1, wherein: said step (c) comprises oxidizing the substrate in a dry oxygen environment including HCl; and said step (d) comprises oxidizing the substrate at a temperature greater than approximately 1,100° C.
Claim 9
Dependent Claim
116 words
An improved method of forming field oxide regions in a substrate includes the steps of providing an oxide layer overlying the substrate, providing a nitride layer overlying portions of the barrier layer corresponding to selected first regions of the substrate, and oxidizing second regions of the substrate to forms field oxide regions, the improvement comprising the steps of: (a) oxidizing the substrate in a dry oxygen environment including HCl at a temperature less than 1,050° C.; and (b) oxidizing the substrate in a dry oxygen environment comprising O 2 and including HCl at a temperature greater than approximately 1,100° C., after said step (a), said steps (a) and (b) being performed prior to a field implant.
Claim 10
Dependent Claim
116 words
An improved method of forming field oxide regions in a substrate includes the steps of providing an oxide layer overlying the substrate, providing a nitride layer overlying portions of the barrier layer corresponding to selected first regions of the substrate, and oxidizing second regions of the substrate to forms field oxide regions, the improvement comprising the steps of: (a) oxidizing the substrate in a dry oxygen environment including HCl at a temperature less than 1,050° C.; and (b) oxidizing the substrate in a dry oxygen environment comprising O 2 and including HCl at a temperature greater than approximately 1,100° C., after said step (a), said steps (a) and (b) being performed prior to a field implant.
Claim 11
Dependent Claim
52 words
A method according to claim 8, wherein the improvement further comprises the step of; (c) implanting a well dopant in a selected portion of the substrate prior to said step (a), wherein said steps (a) and (b) comprise concurrently oxidizing the substrate and driving the well dopant implanted in said step (c).
Claim 12
Independent Claim
125 words
A method of forming field oxide FOX, regions in a semiconductor substrate, comprising the steps of: (a) implanting a well dopant in a selected well region of the substrate; (b) providing a barrier oxide layer overlying the substrate; (c) providing a nitride layer overlying portions of the barrier oxide corresponding to active regions of the substrate; (d) forming FOX regions and driving the well dopant implanted in said step (a) by (i) oxidizing the substrate in a dry oxygen environment at a temperature less than 1,050° C. after said step (c) and (ii) oxidizing the substrate in a dry oxygen environment including HCl at a temperature greater than 1,050° C. after said step (d)(i); and (e) of performing a field implant after said step (d).
Claim 13
Independent Claim
125 words
A method of forming field oxide FOX, regions in a semiconductor substrate, comprising the steps of: (a) implanting a well dopant in a selected well region of the substrate; (b) providing a barrier oxide layer overlying the substrate; (c) providing a nitride layer overlying portions of the barrier oxide corresponding to active regions of the substrate; (d) forming FOX regions and driving the well dopant implanted in said step (a) by (i) oxidizing the substrate in a dry oxygen environment at a temperature less than 1,050° C. after said step (c) and (ii) oxidizing the substrate in a dry oxygen environment including HCl at a temperature greater than 1,050° C. after said step (d)(i); and (e) of performing a field implant after said step (d).
Claim 14
Dependent Claim
43 words
A method according to claim 10, wherein: said step (b) comprises providing a barrier oxide layer having a thickness x; said step (c) comprises providing a nitride layer having a thickness y; and the ratio y/x is equal to or greater than 10.
Claim 15
Dependent Claim
53 words
A method according to claim 10, wherein: said step (b) comprises providing a barrier oxide layer having a thickness x, where x is approximately 50-250Å; said step (c) comprises providing a nitride layer having a thickness y, where y is approximately 1,000-3,000Å; and the ratio y/x is equal to or greater than 10.
Claim 16
Independent Claim
220 words
A method of fabricating a plurality of field effect transistors in a semiconductor substrate having a conductivity type, the field effect transistors being electrically isolated by field oxide regions, comprising the sequential steps of: (a) implanting a dopant of the opposite conductivity type to form at least one well in the substrate; (b) providing a barrier oxide layer overlying the substrate; (c) providing a nitride layer overlying portions of the barrier oxide corresponding to active regions of the substrate, at least one active region being located in the well; (d) oxidizing the substrate in an environment comprising O 2 and HCl at a temperature less than approximately 1,050° C. and then oxidizing the substrate in an environment comprising O 2 and HCl at a temperature greater than approximately 1,100° C. to form field oxide regions and to drive the dopant implanted in said step (a); (e) removing the nitride layer; (f) implanting a field dopant in the substrate, said implant being performed through the field oxide regions; (g) providing a plurality of gates overlying respective ones of the active regions of the substrate; and (h) implanting source and drain regions in each of the active regions utilizing the corresponding gates as masks so that each pair of source and drain regions are spaced apart and define a channel region therebetween.
Claim 17
Independent Claim
220 words
A method of fabricating a plurality of field effect transistors in a semiconductor substrate having a conductivity type, the field effect transistors being electrically isolated by field oxide regions, comprising the sequential steps of: (a) implanting a dopant of the opposite conductivity type to form at least one well in the substrate; (b) providing a barrier oxide layer overlying the substrate; (c) providing a nitride layer overlying portions of the barrier oxide corresponding to active regions of the substrate, at least one active region being located in the well; (d) oxidizing the substrate in an environment comprising O 2 and HCl at a temperature less than approximately 1,050° C. and then oxidizing the substrate in an environment comprising O 2 and HCl at a temperature greater than approximately 1,100° C. to form field oxide regions and to drive the dopant implanted in said step (a); (e) removing the nitride layer; (f) implanting a field dopant in the substrate, said implant being performed through the field oxide regions; (g) providing a plurality of gates overlying respective ones of the active regions of the substrate; and (h) implanting source and drain regions in each of the active regions utilizing the corresponding gates as masks so that each pair of source and drain regions are spaced apart and define a channel region therebetween.
Claim 18
Dependent Claim
38 words
A method according to claim 13, further comprising the step of: (i) etching the nitride and the field oxide regions to reduce the step height of the field oxide after said step (d) and before said step (e).
Claim 19
Dependent Claim
59 words
A method according to claim 13, further comprising the step of: (i) etching the nitride and the field oxide regions with a plasma etchant, including CF 4 , which etches the nitride and the field oxide at approximately the same rate to reduce the step height of the field oxide after said step (d) and before said step (e).
Claim 20
Dependent Claim
43 words
A method according to claim 13, wherein: said step (b) comprises providing a barrier oxide layer having a thickness x; said step (c) comprises providing a nitride layer having a thickness y; and the ratio y/x is equal to or greater than 10.
Claim 21
Dependent Claim
53 words
A method according to claim 13, wherein: said step (b) comprises providing a barrier oxide layer having a thickness x, where x is approximately 50-250Å; said step (c) comprises providing a nitride layer having a thickness y, where y is approximately 1,000-3,000Å; and the ratio y/x is equal to or greater than 10.
Claim 22
Dependent Claim
29 words
A method according to claim 13, wherein said step (f) comprises implanting a field dopant in active regions defined by the field oxide regions formed in said step (d).
Claim 23
Independent Claim
138 words
A method of forming field oxide regions in a substrate, the method comprising the steps of: providing a barrier oxide layer overlying the substrate, the barrier oxide layer having a thickness x; providing a nitride layer overlying portions of the barrier oxide layer corresponding to selected first regions of the substrate, the nitride layer having a thickness y, wherein the ratio y/x is equal to or greater than approximately 10; first oxidizing second regions of the substrate to forms field oxide regions; first oxidizing the substrate in a dry oxygen environment at a temperature less than approximately 1,050° C.; and second oxidizing the substrate in a dry oxygen environment including O 2 and HCl at a temperature less than approximately 1,050° C.; wherein said first and second oxidizing steps are performed prior to any subsequent field implantation step.
Claim 24
Independent Claim
138 words
A method of forming field oxide regions in a substrate, the method comprising the steps of: providing a barrier oxide layer overlying the substrate, the barrier oxide layer having a thickness x; providing a nitride layer overlying portions of the barrier oxide layer corresponding to selected first regions of the substrate, the nitride layer having a thickness y, wherein the ratio y/x is equal to or greater than approximately 10; first oxidizing second regions of the substrate to forms field oxide regions; first oxidizing the substrate in a dry oxygen environment at a temperature less than approximately 1,050° C.; and second oxidizing the substrate in a dry oxygen environment including O 2 and HCl at a temperature less than approximately 1,050° C.; wherein said first and second oxidizing steps are performed prior to any subsequent field implantation step.
Claim 25
Dependent Claim
21 words
A method according to claim 19 wherein: said second oxidizing step comprises oxidizing at a temperature greater than approximately 1,100° C.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-09-29 | 1996-03-30 | 1996-09-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-09-29 | 2000-03-30 | 2000-09-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-09-29 | 2004-03-30 | 2004-09-29 | $7700.00 | Window Closed / Lapsed |