US4551910A
Expired / Lapsed
US
⏱️ 0.0 years remaining
MOS Isolation processing
Assignee: Intel Corp
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Filing: 1984-11-27
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Granted: 1985-11-12
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Expires: 2004-11-27
Abstract
Abstract A process for growing field oxide regions in an MOS circuit. An initial thermally grown layer of silicon nitride seals the substrate surface and reduces lateral oxidation, or bird's beak formation along the substrate-nitride interface. Field oxidation takes place in two steps, with the first step being a dry oxidation in HCL and the second taking place in steam.
Inventors
- 👤 Elizabeth L. Patterson
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 15:39
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/61; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/012; H10W10/0128; H10W10/10; H10W10/13; H10P14/63; H10P14/6302; H10P14/6304; H10P14/6306; H10P14/6308; H10P14/6309; H10P14/6316; H10P14/6322; H10P14/6326; H10P14/6328; H10P14/6334; H10P14/69; H10P14/694; H10P14/6943; H10P14/69433; Y; Y10; Y10S; Y10S148/00; Y10S148/117
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
129 words
A process for the isolation of semiconductor elements on a silicon substrate comprising the steps of: thermally growing a first silicon nitride layer of a first thickness on the surface of said substrate; depositing a second layer of silicon nitride of a second thickness on said first layer; exposing predetermined regions of said substrate by removing portion of said first and second layers; forming an oxide on said exposed regions by subjecting said substrate to an atmosphere of chlorine ambient at a temperature above that of the flow point of silicon dioxide; further oxidizing said exposed regions in a pressurized atmosphere in the presence of oxygen; whereby the formation of oxide at the nitride-substrate interface is reduced, and electrical isolation of semiconductor elements is achieved in a reduced area.
Claim 2
Dependent Claim
129 words
A process for the isolation of semiconductor elements on a silicon substrate comprising the steps of: thermally growing a first silicon nitride layer of a first thickness on the surface of said substrate; depositing a second layer of silicon nitride of a second thickness on said first layer; exposing predetermined regions of said substrate by removing portion of said first and second layers; forming an oxide on said exposed regions by subjecting said substrate to an atmosphere of chlorine ambient at a temperature above that of the flow point of silicon dioxide; further oxidizing said exposed regions in a pressurized atmosphere in the presence of oxygen; whereby the formation of oxide at the nitride-substrate interface is reduced, and electrical isolation of semiconductor elements is achieved in a reduced area.
Claim 3
Dependent Claim
18 words
The process as described in claim 1 wherein said first layer of silicon nitride is approximately 25-30A thick.
Claim 4
Dependent Claim
18 words
The process as described in claim 1 wherein said second layer of silicon nitride is approximately 250A thick.
Claim 5
Dependent Claim
19 words
The process as described in claim 1 wherein said second layer is formed by low pressure chemical vapor deposition.
Claim 6
Dependent Claim
20 words
The process as described in claim 1 wherein said substrate is exposed to a chlorine atmosphere at 1000 degrees C.
Claim 7
Dependent Claim
19 words
The process as described in claim 1 wherein said layer grown in a chlorine ambient is approximately 500A thick.
Claim 8
Dependent Claim
20 words
The process as described in claim 1 wherein said layer grown in the presence of oxygen is approximately 6000A thick.
Claim 9
Dependent Claim
17 words
The process as described in claim 1 wherein said further oxidation is accomplished in a wet atmosphere.
Claim 10
Dependent Claim
17 words
The process as defined by claim 1 wherein said further oxidation takes place at approximately 920° C.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1988-11-11 | 1989-05-13 | 1989-11-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-11-11 | 1993-05-13 | 1993-11-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-11-11 | 1997-05-13 | 1997-11-12 | $7700.00 | Window Closed / Lapsed |