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US5700714A
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Diffusion mask and fabrication method for forming pn-junction elements in a compound semiconductor substrate
Assignee: Oki Electric Industry Co Ltd
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Filing: 1996-01-19
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Granted: 1997-12-23
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Expires: 2016-01-19
Abstract
Abstract A pn-junction element is formed in a compound semiconductor substrate by depositing an aluminum-nitride film on the surface of the substrate, patterning the aluminum-nitride film to form a diffusion mask, depositing a diffusion source film on the diffusion mask, diffusing an impurity from the diffusion source film into the substrate, and removing the diffusion source film with buffered hydrofluoric acid. Electrode lines can then be formed directly on the aluminum-nitride diffusion mask, which is not etched by buffered hydrofluoric acid.
Inventors
- 👤 Mitsuhiko Ogihara
- 👤 Yukio Nakamura
- 👤 Masumi Koizumi
- 👤 Masumi Taninaka
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 13:10
CPC Classifications
H; H10; H10H; H10H20/00; H10H20/80; H10H20/81; H10P; H10P32/00; H10P32/10; H10P32/14; H10P32/17; H10P32/174
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
86 words
A method of fabricating a pn-junction element in a compound semiconductor substrate, comprising the steps of: forming an aluminum-nitride film on said compound semiconductor substrate; patterning said aluminum-nitride film to create a diffusion mask with windows; forming a diffusion source film comprising an impurity on said diffusion mask and windows; diffusing said impurity from said diffusion source film into said compound semiconductor substrate through said windows by annealing; and removing said diffusion source film entirely from said diffusion mask and windows, by etching with hydrofluoric acid.
Claim 2
Independent Claim
86 words
A method of fabricating a pn-junction element in a compound semiconductor substrate, comprising the steps of: forming an aluminum-nitride film on said compound semiconductor substrate; patterning said aluminum-nitride film to create a diffusion mask with windows; forming a diffusion source film comprising an impurity on said diffusion mask and windows; diffusing said impurity from said diffusion source film into said compound semiconductor substrate through said windows by annealing; and removing said diffusion source film entirely from said diffusion mask and windows, by etching with hydrofluoric acid.
Claim 3
Dependent Claim
36 words
The method of claim 1, comprising the further steps of: forming an anneal cap on said diffusion source film before said step of diffusing; and removing said anneal cap by etching, after said step of diffusing.
Claim 4
Dependent Claim
12 words
The method of claim 2, wherein said anneal cap comprises aluminum nitride.
Claim 5
Dependent Claim
25 words
The method of claim 1, comprising the further step of forming electrode lines on said diffusion mask after said diffusion source film has been removed.
Claim 6
Dependent Claim
15 words
The method of claim 1, wherein said diffusion source film comprises zinc as said impurity.
Claim 7
Dependent Claim
14 words
The method of claim 5, wherein said diffusion source film comprises a zinc-doped oxide.
Claim 8
Dependent Claim
15 words
The method of claim 1, wherein said compound semiconductor substrate comprises a III-V compound semiconductor.
Claim 9
Dependent Claim
12 words
The method of claim 7, wherein said compound semiconductor substrate comprises gallium-arsenide-phosphide.
Claim 10
Dependent Claim
16 words
The method of claim 1, wherein the hydrofluoric acid used in the removing step is buffered.
Claim 11
Independent Claim
113 words
A method of fabricating an electrical element which includes a doped diffusion region, said method comprising the steps of: (a) forming a film that is impervious to hydrofluoric acid above a III-V compound semiconductor substrate, the film comprising aluminum nitride; (b) patterning the film to create a diffusion mask with a window; (c) forming a diffusion source film comprising a doping agent on the diffusion mask and the window; (d) diffusing doping agent from the diffusion source film into the III-V compound semiconductor substrate through the window to create the doped diffusion region; and (e) removing the diffusion source film entirely by etching it away with hydrofluoric acid without altering the diffusion mask.
Claim 12
Independent Claim
113 words
A method of fabricating an electrical element which includes a doped diffusion region, said method comprising the steps of: (a) forming a film that is impervious to hydrofluoric acid above a III-V compound semiconductor substrate, the film comprising aluminum nitride; (b) patterning the film to create a diffusion mask with a window; (c) forming a diffusion source film comprising a doping agent on the diffusion mask and the window; (d) diffusing doping agent from the diffusion source film into the III-V compound semiconductor substrate through the window to create the doped diffusion region; and (e) removing the diffusion source film entirely by etching it away with hydrofluoric acid without altering the diffusion mask.
Claim 13
Dependent Claim
17 words
The method of claim 10, wherein the film formed in step (a) consists essentially of aluminum nitride.
Claim 14
Dependent Claim
24 words
The method of claim 10, further comprising the step of forming an anneal cap on the diffusion source film before step (d) is conducted.
Claim 15
Dependent Claim
34 words
The method of claim 12, wherein the anneal cap film comprises a material that is etchable by hydrofluoric acid, and wherein step (e) further comprises etching the anneal cap away with the hydrofluoric acid.
Claim 16
Dependent Claim
17 words
The method of claim 12, wherein the material that is etchable by hydrofluoric acid comprises silicon nitride.
Claim 17
Dependent Claim
23 words
The method of claim 10, further comprising the step of forming an electrode line on the diffusion mask after step (e) is conducted.
Claim 18
Dependent Claim
13 words
The method of claim 10, wherein the III-V compound semiconductor substrate comprises gallium-arsenide-phosphide.
Claim 19
Dependent Claim
11 words
The method of claim 16, wherein the doping agent comprises zinc.
Claim 20
Dependent Claim
17 words
The method of claim 17, wherein the electrical element is a light-emitting element having a pn junction.
Claim 21
Independent Claim
125 words
A method of fabricating an electrical element which includes a doped diffusion region, said method comprising the steps of: (a) forming a film consisting essentially of aluminum nitride on a gallium arsenide substrate; (b) patterning the film to create a diffusion mask with a window; (c) forming a diffusion source film comprising a doping agent on the diffusion mask and the window; (d) diffusing doping agent from the diffusion source film into the gallium arsenide substrate through the window to create the doped region; (e) removing the diffusion source film entirely by etching it away with hydrofluoric acid without altering the diffusion mask; and (f) forming an electrode line on the diffusion mask, the electrode line extending through the window and contacting the doped region.
Claim 22
Independent Claim
125 words
A method of fabricating an electrical element which includes a doped diffusion region, said method comprising the steps of: (a) forming a film consisting essentially of aluminum nitride on a gallium arsenide substrate; (b) patterning the film to create a diffusion mask with a window; (c) forming a diffusion source film comprising a doping agent on the diffusion mask and the window; (d) diffusing doping agent from the diffusion source film into the gallium arsenide substrate through the window to create the doped region; (e) removing the diffusion source film entirely by etching it away with hydrofluoric acid without altering the diffusion mask; and (f) forming an electrode line on the diffusion mask, the electrode line extending through the window and contacting the doped region.
Claim 23
Dependent Claim
38 words
The method of claim 19, further comprising the step of forming an anneal cap on the diffusion layer before step (d) is conducted, and wherein step (e) further comprises etching the anneal cap away with the hydrofluoric acid.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-12-22 | 2001-06-23 | 2001-12-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-12-22 | 2005-06-23 | 2005-12-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-12-22 | 2009-06-23 | 2009-12-23 | $7700.00 | Window Closed / Lapsed |