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Method for making heterojunction bipolar transistor with self-aligned retrograde emitter profile

Assignee: GlobalFoundries Inc
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Filing: 1994-11-22
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Granted: 1997-08-12
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Expires: 2014-11-22
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Abstract

Abstract A high gain, high frequency transistor is formed having a combination of a moderately doped retrograde emitter and a collector which is formed by self-aligned implantation through an emitter opening window. This combination allows continued base width scaling and ensures high current capability yet limits the electric field at the emitter-base junction, particularly near the base contacts, in order to reduce leakage and capacitance and to enhance breakdown voltage. Cut-off frequencies on the order of 100 GHz can thus be obtained in the performance of a transistor with a 30 nm base width in a SiGe device.

Inventors

  • 👤 David Ahlgren
  • 👤 Jack Chu
  • 👤 Martin Revitz
  • 👤 Paul Ronsheim
  • 👤 Mary Saccamango
  • 👤 David Sunderland

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 05:21
CPC Classifications
H; H10; H10D; H10D10/00; H10D10/01; H10D10/021; Y; Y10; Y10S; Y10S438/00; Y10S438/936

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 104 words
A method of making a transistor structure including an emitter-base heterojunction and a retrograde emitter including the steps of depositing a layer over a collector region, said layer including an emitter-base heterojunction having a concentration profile of at least one band gap determining alloying material, said step of depositing a layer including the step of depositing impurities in said layer in accordance with an impurity concentration profile, forming an emitter opening in an insulator over said layer including said emitter-base heterojunction, and forming an emitter of said transistor structure by impurity implantation in said layer including said emitter-base heterojunction self-aligned with said emitter opening.
Claim 2
Independent Claim 104 words
A method of making a transistor structure including an emitter-base heterojunction and a retrograde emitter including the steps of depositing a layer over a collector region, said layer including an emitter-base heterojunction having a concentration profile of at least one band gap determining alloying material, said step of depositing a layer including the step of depositing impurities in said layer in accordance with an impurity concentration profile, forming an emitter opening in an insulator over said layer including said emitter-base heterojunction, and forming an emitter of said transistor structure by impurity implantation in said layer including said emitter-base heterojunction self-aligned with said emitter opening.
Claim 3
Dependent Claim 25 words
A method as recited in claim 1, including the further step of forming a gradually varying alloy composition effective to produce an accelerating quasi-electric field.
Claim 4
Dependent Claim 29 words
A method as recited in claim 1, wherein said depositing impurities step includes the further step of forming a collector region by impurity implantation self-aligned with said emitter opening.
Claim 5
Dependent Claim 24 words
A method recited in claim 1, wherein said layer including said emitter-base heterojunction is composed primarily of silicon and said alloying material is germanium.
Claim 6
Dependent Claim 43 words
A method recited in claim 1, wherein said process includes the further steps of forming a deposit of heavily doped polysilicon to said layer including said emitter-base heterojunction, and diffusing impurities from said heavily doped polysilicon into said layer including said emitter-base heterojunction.
Claim 7
Dependent Claim 36 words
A method as recited in claim 1, including the further steps of implanting impurities to a shallow depth in said layer including said emitter-base heterojunction and depositing a layer of metal to form an emitter contact.
Claim 8
Dependent Claim 31 words
A method as recited in claim 2, including the further steps of forming a deposit of heavily doped polysilicon to said layer including said emitter-base heterojunction to form an emitter contact.
Claim 9
Dependent Claim 28 words
A method as recited in claim 7, wherein said layer including said emitter base heterojunction is composed primarily of silicon and said band gap determining material is germanium.

References Cited (Backward Citations)

US4319932A Cited
US5006912A Cited
US4967254A Cited
US5063427A Cited
US5346840A Cited
US5106767A Cited
US5323032A Cited
US5389803A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2000-08-11 2001-02-10 2001-08-12 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2004-08-11 2005-02-10 2005-08-12 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2008-08-11 2009-02-10 2009-08-12 $7700.00 Window Closed / Lapsed

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