US5389803A
Expired / Lapsed
US
⏱️ 0.0 years remaining
High-gain Si/SiGe MIS heterojunction bipolar transistors
Assignee: International Business Machines Corp
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Filing: 1993-03-29
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Granted: 1995-02-14
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Expires: 2013-03-29
Abstract
Abstract A Metal Insulator Semiconductor (MIS) heterojunction transistor. The MIS transistor is in a layered wafer having a n + Si substrate, n Si collector layer, and a p Si/SiGe base. The base Si/SiGe interface may be vertical or horizontal. A thin oxide layer separates the base from the emitter, which is of a low work function metal such as Al, Mg, Mn, or Ti.
Inventors
- 👤 S. Noor Mohammad
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 11:17
CPC Classifications
H; H10; H10D; H10D10/00; H10D10/01; H10D10/021; H10D10/231; H10D10/80; H10D10/821; H10D10/891
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
105 words
A MIS transistor comprising: an isolating substrate; a collector layer of a first conduction type and of a first semiconductor material on said substrate; a base layer of said first semiconductor material on said collector layer, said base layer of a second conduction type; a thin oxide layer on said base layer; a plug of a second semiconductor material forming a discrete area in said base layer, said plug and a portion of said base layer of said first semiconductor material formed on and extending from said collector layer to said thin oxide layer; and a low work function metal on said thin oxide layer.
Claim 2
Dependent Claim
105 words
A MIS transistor comprising: an isolating substrate; a collector layer of a first conduction type and of a first semiconductor material on said substrate; a base layer of said first semiconductor material on said collector layer, said base layer of a second conduction type; a thin oxide layer on said base layer; a plug of a second semiconductor material forming a discrete area in said base layer, said plug and a portion of said base layer of said first semiconductor material formed on and extending from said collector layer to said thin oxide layer; and a low work function metal on said thin oxide layer.
Claim 3
Dependent Claim
20 words
The MIS transistor of claim 1 wherein said first semiconductor material is Si and said second semiconductor material is SiGe.
Claim 4
Dependent Claim
22 words
The MIS transistor of claim 2 wherein said first conduction type is n type and said second conduction type is p type.
Claim 5
Dependent Claim
42 words
The base layer of the MIS transistor of claim 3 including a first base contact diffusion area adjacent said plug and said portion of said base layer of said first semiconductor material between said plug and a second base contact diffusion area.
Claim 6
Dependent Claim
56 words
The MIS transistor of claim 4 wherein the collector layer comprises a first layer of a first dopant concentration and a second layer of a second dopant concentration at least an order of magnitude less than said first dopant concentration, said first collector layer adjacent said substrate and said second collector layer adjacent said base layer.
Claim 7
Dependent Claim
16 words
The MIS transistor of claim 5 wherein the low work function metal is comprised of Al.
Claim 8
Dependent Claim
16 words
The MIS transistor of claim 5 wherein the low work function metal is comprised of Mn.
Claim 9
Dependent Claim
16 words
The MIS transistor of claim 5 wherein the low work function metal is comprised of Mg.
Claim 10
Dependent Claim
16 words
The MIS transistor of claim 5 wherein the low work function metal is comprised of Ti.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-02-13 | 1998-08-15 | 1999-02-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-02-13 | 2002-08-15 | 2003-02-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-02-13 | 2006-08-15 | 2007-02-14 | $7700.00 | Window Closed / Lapsed |