Patent US5648730A successfully refreshed from Google Patents.
US5648730A
Expired / Lapsed
US
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Large integrated circuit with modular probe structures
Assignee: Texas Instruments Inc
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Filing: 1994-11-30
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Granted: 1997-07-15
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Expires: 2014-11-30
Abstract
Abstract A large integrated circuit (10) of modular design, each module (12,14,16) having a circuit section (22,24,34) and a separate dedicated testing pad section (20). Each circuit module (12,14,16) can be individually functionally tested as an independent circuit with conventional prober equipment for defects. Each testing pad section (20) facilitates controlling the entire integrated circuit (10) so that the respective module circuit section (12,14,16) can be tested. Control circuitry (26) comprised of pass gates is provided to isolate the testing pad sections (20) from the operational portion (22,24,34) of the integrated circuit (10) when not under test. The present invention is ideally suited for large spatial light modulators, memory devices and other large sophisticated integrated circuits.
Inventors
- 👤 Rohit L. Bhuva
- 👤 Bao Tran
- 👤 James L. Conner
- 👤 Michael Overlaur
- 👤 Tracy S. Paulsen
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 08:34
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/31712; G01R31/31715; G01R31/3181; G01R31/3185; G01R31/318505; G02; G02B; G02B26/00; G02B26/08; G02B26/0816; G02B26/0833; G02B26/0841; G06; G06F; G06F11/00; G06F11/22; G06F11/26; G06F11/273; G06F11/2733
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
85 words
A semiconductor integrated circuit comprised of a plurality of interconnected circuit modules, each said module having a circuit section and a dedicated testing pad section coupled to said circuit section, said integrated circuit having a control circuit connected to both a first said testing pad section of a first said module and to said circuit section of a second said module, said control circuit facilitating operation of said second module circuit section to test said first module circuit section from said first testing pad section.
Claim 2
Dependent Claim
85 words
A semiconductor integrated circuit comprised of a plurality of interconnected circuit modules, each said module having a circuit section and a dedicated testing pad section coupled to said circuit section, said integrated circuit having a control circuit connected to both a first said testing pad section of a first said module and to said circuit section of a second said module, said control circuit facilitating operation of said second module circuit section to test said first module circuit section from said first testing pad section.
Claim 3
Dependent Claim
40 words
The integrated circuit as specified in claim 1 wherein one said testing pad section is identical to at least one other said module testing pad section to permit testing of said circuit modules with a single piece of testing equipment.
Claim 4
Dependent Claim
27 words
The integrated circuit as specified in claim 1 wherein at least two said circuit modules have commonly located said testing pad sections relative to said circuit modules.
Claim 5
Dependent Claim
33 words
The integrated circuit as specified in claim 1 wherein said control circuit selectively electrically isolates said first testing pad section of said first module from said circuit section of said second circuit module.
Claim 6
Dependent Claim
21 words
The integrated circuit as specified in claim 1 wherein at least two said circuit modules are not identical to each other.
Claim 7
Dependent Claim
20 words
The integrated circuit as specified in claim 1 wherein at least two said circuit modules are identical to one another.
Claim 8
Dependent Claim
22 words
The integrated circuit as specified in claim 6 wherein said two identical circuit modules are coupled to a non-identical said circuit module.
Claim 9
Dependent Claim
26 words
The integrated circuit as specified in claim 1 wherein said circuit modules form an elongated said integrated circuit having a length greater than about 1 inch.
Claim 10
Dependent Claim
18 words
The integrated circuit as specified in claim 6 wherein said identical circuit modules comprise a spatial light modulator.
Claim 11
Dependent Claim
21 words
The integrated circuit as specified in claim 9 wherein said spatial light modulator is comprised of a plurality of micro mirrors.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-07-14 | 2001-01-13 | 2001-07-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-07-14 | 2005-01-13 | 2005-07-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-07-14 | 2009-01-13 | 2009-07-15 | $7700.00 | Window Closed / Lapsed |