Patent US5607868A successfully refreshed from Google Patents.
US5607868A
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Method of fabricating semiconductor device with channel ion implantation through a conductive layer
Assignee: Toshiba Corp
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Filing: 1995-06-13
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Granted: 1997-03-04
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Expires: 2015-06-13
Abstract
Abstract In a method of fabricating a semiconductor device in which at least one of a first conductive layer (polysilicon film) and a second conductive layer (polysilicon film) on a semiconductor substrate is used as a gate electrode of a MOS transistor to be formed on the semiconductor substrate, channel ion implantation for controlling the threshold voltages of the MOS transistors is performed by using the first conductive layer (polysilicon film) as a buffer film. Since the first conductive layer used as the gate electrode is also used as the buffer film, a dummy gate oxide film need not be provided, which is used as a buffer film for the channel ion implantation. Removal of the dummy gate oxide film is also unnecessary. Thus, it is possible to reduce the number of times of a dilute HF treatment which is performed to remove a dummy gate oxide film. The result is that a decrease in thickness of the field oxide film is reduced.
Inventors
- 👤 Nobuyoshi Chida
- 👤 Masayuki Yoshida
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 22:40
CPC Classifications
H; H10; H10B; H10B41/00; H10B41/40; H10B41/42; H10B41/49
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
249 words
A method of fabricating a semiconductor device, comprising the steps of: forming a field oxide film on a semiconductor substrate and providing element formation regions and an element isolation region on a major surface of said semiconductor substrate; forming a first gate oxide film on an entire surface of said element formation regions on the major surface of said semiconductor substrate; forming a first conductive layer on the entire major surface of said semiconductor substrate so as to cover said first gate oxide film; performing, in a second region of said element formation regions on the major surface of said semiconductor substrate, channel ion implantation for controlling a threshold voltage of a MOS transistor to be formed in said second region, by using said first conductive layer as a buffer film; removing said first conductive layer and said first gate oxide film from said element formation regions, excluding a first region and including said second region, on the major surface of said semiconductor substrate, thereby using said first conductive layer in said first region as a first gate electrode of a M0S transistor to be formed in said first region; forming a second gate oxide film in said second region; forming a second conductive layer on the entire major surface of said semiconductor substrate so as to cover said second gate oxide film; and using said second conductive layer in said second region as a second gate electrode of said MOS transistor to be formed in said second region.
Claim 2
Independent Claim
249 words
A method of fabricating a semiconductor device, comprising the steps of: forming a field oxide film on a semiconductor substrate and providing element formation regions and an element isolation region on a major surface of said semiconductor substrate; forming a first gate oxide film on an entire surface of said element formation regions on the major surface of said semiconductor substrate; forming a first conductive layer on the entire major surface of said semiconductor substrate so as to cover said first gate oxide film; performing, in a second region of said element formation regions on the major surface of said semiconductor substrate, channel ion implantation for controlling a threshold voltage of a MOS transistor to be formed in said second region, by using said first conductive layer as a buffer film; removing said first conductive layer and said first gate oxide film from said element formation regions, excluding a first region and including said second region, on the major surface of said semiconductor substrate, thereby using said first conductive layer in said first region as a first gate electrode of a M0S transistor to be formed in said first region; forming a second gate oxide film in said second region; forming a second conductive layer on the entire major surface of said semiconductor substrate so as to cover said second gate oxide film; and using said second conductive layer in said second region as a second gate electrode of said MOS transistor to be formed in said second region.
Claim 3
Dependent Claim
25 words
A method according to claim 1, wherein a thickness of said first gate oxide film differs from a thickness of said second gate oxide film.
Claim 4
Dependent Claim
52 words
A method according to claim 1, further comprising the step of forming, in said first region, a memory cell with a layered gate structure which uses said first conductive layer as a floating gate and said second conductive layer, formed on said floating gate via an insulating interlayer, as a control gate.
Claim 5
Dependent Claim
27 words
A method according to claim 1, wherein said first conductive layer is made of a polysilicon film with a film thickness of not more than 100 nm.
Claim 6
Dependent Claim
27 words
A method according to claim 3, wherein said first conductive layer is made of a polysilicon film with a film thickness of not more than 100 nm.
Claim 7
Independent Claim
342 words
A method of fabricating a semiconductor device, comprising the steps of: forming a field oxide film on a semiconductor substrate and providing element formation regions and an element isolation region on a major surface of said semiconductor substrate; forming a first gate oxide film on an entire surface of said element formation regions on the major surface of said semiconductor substrate; forming a first conductive layer on the entire major surface of said semiconductor substrate so as to cover said first gate oxide film; performing, in a second region of said element formation regions on the major surface of said semiconductor substrate, channel ion implantation for controlling a threshold voltage of a MOS transistor to be formed in said second region, by using said first conductive layer as a buffer film; performing, in a third region of said element formation regions on the major surface of said semiconductor substrate, channel ion implantation for controlling a threshold voltage of a MOS transistor to be formed in said third region, by using said first conductive layer as a buffer film; removing said first conductive layer and said first gate oxide film formed below said first conductive layer from said element formation regions, excluding a first region and including said second and third regions, on the major surface of said semiconductor substrate, thereby using said first conductive layer in said first region as a first gate electrode of a MOS transistor to be formed in said first region; forming a second gate oxide film in said second region; forming a third gate oxide film in said second and third regions such that said third gate oxide film overlaps said second gate oxide film in said second region; forming a second conductive layer on the entire major surface of said semiconductor substrate so as to cover said third gate oxide film; and using said second conductive layer in said second and third regions as a second gate electrode and a third gate electrode of said MOS transistors to be formed in said second and third regions.
Claim 8
Independent Claim
342 words
A method of fabricating a semiconductor device, comprising the steps of: forming a field oxide film on a semiconductor substrate and providing element formation regions and an element isolation region on a major surface of said semiconductor substrate; forming a first gate oxide film on an entire surface of said element formation regions on the major surface of said semiconductor substrate; forming a first conductive layer on the entire major surface of said semiconductor substrate so as to cover said first gate oxide film; performing, in a second region of said element formation regions on the major surface of said semiconductor substrate, channel ion implantation for controlling a threshold voltage of a MOS transistor to be formed in said second region, by using said first conductive layer as a buffer film; performing, in a third region of said element formation regions on the major surface of said semiconductor substrate, channel ion implantation for controlling a threshold voltage of a MOS transistor to be formed in said third region, by using said first conductive layer as a buffer film; removing said first conductive layer and said first gate oxide film formed below said first conductive layer from said element formation regions, excluding a first region and including said second and third regions, on the major surface of said semiconductor substrate, thereby using said first conductive layer in said first region as a first gate electrode of a MOS transistor to be formed in said first region; forming a second gate oxide film in said second region; forming a third gate oxide film in said second and third regions such that said third gate oxide film overlaps said second gate oxide film in said second region; forming a second conductive layer on the entire major surface of said semiconductor substrate so as to cover said third gate oxide film; and using said second conductive layer in said second and third regions as a second gate electrode and a third gate electrode of said MOS transistors to be formed in said second and third regions.
Claim 9
Dependent Claim
52 words
A method according to claim 5, further comprising the step of forming, in said first region, a memory cell with a layered gate structure which uses said first conductive layer as a floating gate and said second conductive layer, formed on said floating gate via an insulating interlayer, as a control gate.
Claim 10
Dependent Claim
27 words
A method according to claim 7, wherein said first conductive layer is made of a polysilicon film with a film thickness of not more than 100 nm.
Claim 11
Dependent Claim
27 words
A method according to claim 5, wherein said first conductive layer is made of a polysilicon film with a film thickness of not more than 100 nm.
Claim 12
Independent Claim
357 words
A method of fabricating a semiconductor device, comprising the steps of: forming a field oxide film on a semiconductor substrate and providing element formation regions and an element isolation region on a major surface of said semiconductor substrate; forming a first gate oxide film on an entire surface of said element formation regions on the major surface of said semiconductor substrate; forming a first conductive layer on the entire major surface of said semiconductor substrate so as to cover said first gate oxide film; performing, in a second region of said element formation regions on the major surface of said semiconductor substrate, channel ion implantation for controlling a threshold voltage of a M0S transistor to be formed in said second region, by using said first conductive layer as a buffer film; removing said first conductive layer and said first gate oxide film formed below said first conductive layer from said element formation regions, excluding a first region and including said second region and a third region, on the major surface of said semiconductor substrate, thereby using said first conductive layer in said first region as a first gate electrode of a MOS transistor to be formed in said first region; forming a second gate oxide film in said second and third regions; performing, in said third region of said element formation regions on the major surface of said semiconductor substrate, channel ion implantation for controlling a threshold voltage of a MOS transistor to be formed in said third region, by using said second gate oxide film as a buffer film; removing said second gate oxide film from said third region; forming a third gate oxide film in said second and third regions such that said third gate oxide film overlaps said second gate oxide film in said second region; forming a second conductive layer on the entire major surface of said semiconductor substrate so as to cover said third gate oxide film; and using said second conductive layer in said second and third regions as a second gate electrode and a third gate electrode of said MOS transistors to be formed in said second and third regions.
Claim 13
Independent Claim
357 words
A method of fabricating a semiconductor device, comprising the steps of: forming a field oxide film on a semiconductor substrate and providing element formation regions and an element isolation region on a major surface of said semiconductor substrate; forming a first gate oxide film on an entire surface of said element formation regions on the major surface of said semiconductor substrate; forming a first conductive layer on the entire major surface of said semiconductor substrate so as to cover said first gate oxide film; performing, in a second region of said element formation regions on the major surface of said semiconductor substrate, channel ion implantation for controlling a threshold voltage of a M0S transistor to be formed in said second region, by using said first conductive layer as a buffer film; removing said first conductive layer and said first gate oxide film formed below said first conductive layer from said element formation regions, excluding a first region and including said second region and a third region, on the major surface of said semiconductor substrate, thereby using said first conductive layer in said first region as a first gate electrode of a MOS transistor to be formed in said first region; forming a second gate oxide film in said second and third regions; performing, in said third region of said element formation regions on the major surface of said semiconductor substrate, channel ion implantation for controlling a threshold voltage of a MOS transistor to be formed in said third region, by using said second gate oxide film as a buffer film; removing said second gate oxide film from said third region; forming a third gate oxide film in said second and third regions such that said third gate oxide film overlaps said second gate oxide film in said second region; forming a second conductive layer on the entire major surface of said semiconductor substrate so as to cover said third gate oxide film; and using said second conductive layer in said second and third regions as a second gate electrode and a third gate electrode of said MOS transistors to be formed in said second and third regions.
Claim 14
Dependent Claim
52 words
A method according to claim 10, further comprising the step of forming, in said first region, a memory cell with a layered gate structure which uses said first conductive layer as a floating gate and said second conductive layer, formed on said floating gate via an insulating interlayer, as a control gate.
Claim 15
Dependent Claim
27 words
A method according to claim 11, wherein said first conductive layer is made of a polysilicon film with a film thickness of not more than 100 nm.
Claim 16
Dependent Claim
27 words
A method according to claim 10, wherein said first conductive layer is made of a polysilicon film with a film thickness of not more than 100 nm.
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