US5591678A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process of manufacturing a microelectric device using a removable support substrate and etch-stop
Assignee: Raytheon Co
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Filing: 1995-06-07
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Granted: 1997-01-07
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Expires: 2015-06-07
Abstract
Abstract A microelectronic device is fabricated by furnishing a first substrate (40) having a silicon etchable layer (42), a silicon dioxide etch-stop layer (44) overlying the silicon layer (42), and a single-crystal silicon wafer (46) overlying the etch-stop layer (44), the wafer (46) having a front surface (52) not contacting the etch stop layer (44). A microelectronic circuit element (50) is formed in the single-crystal silicon wafer (46). The method further includes attaching the front surface (52) of the single-crystal silicon wafer (46) to a second substrate (58), and etching away the silicon layer (42) of the first substrate (40) down to the etch-stop layer (44). The second substrate (58) may also have a microelectronic circuit element (58') therein that can be electrically interconnected to the microelectronic circuit element (50).
Inventors
- 👤 Joseph J. Bendik
- 👤 Gerard T. Malloy
- 👤 Ronald M. Finnila
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 05:53
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/70; H10P72/74; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10P90/1914; H10W; H10W90/00; H10P72/743; H10P72/7432; H10W72/00; H10W72/851; H10W72/874; H10W72/884; H10W90/701; H10W90/751; H10W90/754; Y; Y10; Y10S; Y10S148/00; Y10S148/135; Y10S148/15; Y10S438/00; Y10S438/977
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
83 words
A method of fabricating a microelectronic device, comprising the steps of: furnishing a first substrate having an etchable layer, an etch-stop layer overlying the etchable layer, and a wafer overlying the etch-stop layer; forming a microelectronic circuit element in the exposed side of the wafer of the first substrate opposite to the side overlying the etch-stop layer; attaching the wafer of the first substrate to a second substrate; and etching away the etchable layer of the first substrate down to the etch-stop layer.
Claim 2
Independent Claim
83 words
A method of fabricating a microelectronic device, comprising the steps of: furnishing a first substrate having an etchable layer, an etch-stop layer overlying the etchable layer, and a wafer overlying the etch-stop layer; forming a microelectronic circuit element in the exposed side of the wafer of the first substrate opposite to the side overlying the etch-stop layer; attaching the wafer of the first substrate to a second substrate; and etching away the etchable layer of the first substrate down to the etch-stop layer.
Claim 3
Dependent Claim
20 words
The method of claim 1, further including an additional step, after the step of etching, of patterning the etch-stop layer.
Claim 4
Dependent Claim
34 words
The method of claim 2, further including an additional step, after the step of patterning, of forming an electrical connection to the microelectronic circuit element through the patterned etch-stop layer and through the wafer.
Claim 5
Dependent Claim
28 words
The method of claim 2, further including an additional step, after the step of patterning, of forming an electrical connection to the wafer through the patterned etch-stop layer.
Claim 6
Dependent Claim
23 words
The method of claim 1, wherein the etchable layer is silicon, the etch-stop layer is silicon dioxide, and the wafer is single-crystal silicon.
Claim 7
Dependent Claim
15 words
The method of claim 1, wherein the second substrate contains a second microelectronic circuit element.
Claim 8
Dependent Claim
40 words
The method of claim 6, wherein the step of attaching includes the step of making an electrical contact from the microelectronic circuit element on the wafer of the first substrate to the second microelectronic circuit element on the second substrate.
Claim 9
Dependent Claim
37 words
The method of claim 1, wherein the step of attaching includes the steps of placing a layer of epoxy between the second substrate and the wafer portion of the first substrate, and degassing and curing the epoxy.
Claim 10
Dependent Claim
38 words
The method of claim 1, further including an additional step, after the step of attaching and before the step of etching, of fixing the second substrate to an etching support that is resistant to attack by an etchant.
Claim 11
Dependent Claim
33 words
The method of claim 1, wherein the step of etching includes the step of contacting the etchable layer to a liquid etchant that attacks the etchable layer rapidly and the etch-stop layer slowly.
Claim 12
Independent Claim
139 words
A method of fabricating a microelectronic device, comprising the steps of: furnishing a first substrate having an etchable layer, an etch-stop layer overlying the etchable layer, and a wafer overlying the etch-stop layer; forming a microelectronic circuit element in the exposed side of the wafer of the first substrate opposite the side overlying the etch-stop layer; attaching the wafer of the first substrate to a second substrate, the second substrate having a second microelectronic circuit element therein; making an electrical contact from the microelectronic circuit element in the wafer of the first substrate to the second microelectronic circuit element on the second substrate; and etching away the etchable layer of the first substrate down to the etch-stop layer; and forming an electrical connection to the microelectronic circuit element in the wafer of the first substrate through the etch-stop layer.
Claim 13
Independent Claim
139 words
A method of fabricating a microelectronic device, comprising the steps of: furnishing a first substrate having an etchable layer, an etch-stop layer overlying the etchable layer, and a wafer overlying the etch-stop layer; forming a microelectronic circuit element in the exposed side of the wafer of the first substrate opposite the side overlying the etch-stop layer; attaching the wafer of the first substrate to a second substrate, the second substrate having a second microelectronic circuit element therein; making an electrical contact from the microelectronic circuit element in the wafer of the first substrate to the second microelectronic circuit element on the second substrate; and etching away the etchable layer of the first substrate down to the etch-stop layer; and forming an electrical connection to the microelectronic circuit element in the wafer of the first substrate through the etch-stop layer.
Claim 14
Dependent Claim
23 words
The method of claim 11, wherein the etchable layer is silicon, the etch-stop layer is silicon dioxide, and the wafer is single-crystal silicon.
Claim 15
Independent Claim
109 words
A method of fabricating a microelectronic device, comprising the steps of: furnishing a first substrate having a silicon etchable layer, a silicon dioxide etch-stop layer overlying the silicon layer, and a single-crystal silicon wafer overlying the etch-stop layer, the wafer having a front surface not contacting the silicon dioxide layer; forming a microelectronic circuit element in the front surface of the single-crystal silicon wafer; attaching the front surface of the single-crystal silicon wafer to a first side of a second substrate; and etching away the silicon etchable layer down to the silicon dioxide etch-stop layer using an etchant that attacks the silicon layer but not the silicon dioxide layer.
Claim 16
Independent Claim
109 words
A method of fabricating a microelectronic device, comprising the steps of: furnishing a first substrate having a silicon etchable layer, a silicon dioxide etch-stop layer overlying the silicon layer, and a single-crystal silicon wafer overlying the etch-stop layer, the wafer having a front surface not contacting the silicon dioxide layer; forming a microelectronic circuit element in the front surface of the single-crystal silicon wafer; attaching the front surface of the single-crystal silicon wafer to a first side of a second substrate; and etching away the silicon etchable layer down to the silicon dioxide etch-stop layer using an etchant that attacks the silicon layer but not the silicon dioxide layer.
Claim 17
Dependent Claim
19 words
The method of claim 13, further including an additional-step, after the step of etching, of patterning the etch-stop layer.
Claim 18
Dependent Claim
34 words
The method of claim 14, further including an additional step, after the step of patterning, of forming an electrical connection to the microelectronic circuit element through the patterned etch-stop layer and through the wafer.
Claim 19
Dependent Claim
28 words
The method of claim 14, further including an additional step, after the step of patterning, of forming an electrical connection to the wafer through the patterned etch-stop layer.
Claim 20
Dependent Claim
52 words
The method of claim 13, wherein the silicon etchable layer of the first substrate is about 500 micrometers in thickness, the silicon dioxide etch-stop layer of the first substrate is about 1 micrometer in thickness, and the wafer of the first substrate is from about 30 nanometers to about micrometers in thickness.
Claim 21
Dependent Claim
38 words
The method of claim 13, wherein the step of attaching includes the steps of placing a layer of epoxy between the second substrate and the front surface of the single-crystal silicon wafer, and degassing and curing the epoxy.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-01-07 | 2000-07-08 | 2001-01-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-01-07 | 2004-07-08 | 2005-01-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-01-07 | 2008-07-08 | 2009-01-07 | $7700.00 | Window Closed / Lapsed |