US5489552A — Multiple layer tungsten deposition process

Claim 1

Independent Claim 75 words

A method of forming a tungsten plug comprising: providing a nucleation layer; depositing at least three successive layers of tungsten on the nucleation layer within a contact hole, each layer being deposited at a rate of deposition different than the rate at which the previous layer was deposited, the layers being alternately deposited at a fast rate of deposition of greater than 40 Å/second and a slow rate of deposition of less than 40 Å/second.

Claim 2

Independent Claim 75 words

A method of forming a tungsten plug comprising: providing a nucleation layer; depositing at least three successive layers of tungsten on the nucleation layer within a contact hole, each layer being deposited at a rate of deposition different than the rate at which the previous layer was deposited, the layers being alternately deposited at a fast rate of deposition of greater than 40 Å/second and a slow rate of deposition of less than 40 Å/second.

Claim 3

Dependent Claim 25 words

A method as in claim 1 wherein each of the at least three successive layers of tungsten are deposited by hydrogen reduction of tungsten hexafluoride.

Claim 4

Dependent Claim 29 words

A method as in claim 2 wherein the deposition of each layer is separated by a period of no growth lasting from about 10 seconds to about 2 minutes.

Claim 5

Dependent Claim 16 words

A method as in claim 1 wherein at least five successive layers of tungsten are deposited.

Claim 6

Dependent Claim 16 words

A method as in claim 3 wherein at least five successive layers of tungsten are deposited.

Claim 7

Independent Claim 114 words

A method of forming an electronic device comprising: providing a substrate having a conductive layer, a insulator layer formed on the conductive layer and a contact hole formed in the insulator layer to expose a portion of the conductive layer; providing a nucleation layer; depositing at least three layers of tungsten on the nucleation layer within the contact hole to at least substantially fill the contact hole, the at least three layers of tungsten being deposited at a rate of deposition different than the rate at which the previous layer was deposited, whereby a tungsten plug capable of providing electrical connection between the conductive layer of the substrate and another conductive element is formed.

Claim 8

Independent Claim 114 words

A method of forming an electronic device comprising: providing a substrate having a conductive layer, a insulator layer formed on the conductive layer and a contact hole formed in the insulator layer to expose a portion of the conductive layer; providing a nucleation layer; depositing at least three layers of tungsten on the nucleation layer within the contact hole to at least substantially fill the contact hole, the at least three layers of tungsten being deposited at a rate of deposition different than the rate at which the previous layer was deposited, whereby a tungsten plug capable of providing electrical connection between the conductive layer of the substrate and another conductive element is formed.

Claim 9

Dependent Claim 19 words

A method as in claim 6 wherein at least five layers of tungsten are deposited within the contact hole.

Claim 10

Dependent Claim 24 words

A method as in claim 6 wherein the step of depositing each successive layer of tungsten comprises reducing WF 6 with H 2 .

Claim 11

Dependent Claim 37 words

A method as in claim 6 wherein the at least three layers of tungsten are alternately deposited at a fast rate of deposition greater than 40 Å/sec and a slow rate of deposition less than 40 Å/sec.

Claim 12

Independent Claim 93 words

A method of forming a tungsten plug within a contact hole formed in a substrate, the method comprising: (a) depositing a layer of tungsten by H 2 reduction of WF 6 at a rate of deposition greater than 40 Å/sec; (b) depositing a layer of tungsten by H 2 reduction of WF 6 at a rate of deposition less than 40 Å/sec; and (c) repeating steps (a) and (b) in an alternating manner a sufficient number of times to at least substantially fill the contact hole, whereby a layered tungsten plug is formed.

Claim 13

Independent Claim 93 words

A method of forming a tungsten plug within a contact hole formed in a substrate, the method comprising: (a) depositing a layer of tungsten by H 2 reduction of WF 6 at a rate of deposition greater than 40 Å/sec; (b) depositing a layer of tungsten by H 2 reduction of WF 6 at a rate of deposition less than 40 Å/sec; and (c) repeating steps (a) and (b) in an alternating manner a sufficient number of times to at least substantially fill the contact hole, whereby a layered tungsten plug is formed.

Claim 14

Dependent Claim 63 words

A method as in claim 10 wherein said step (a) comprises introducing H 2 into a chamber containing the substrate at a flow rate of about 6000 to about 7500 SCCM and introducing WF 6 into the chamber at a flow rate of about 300 to about 500 SCCM, the total pressure within the chamber being from about 10 to about 100 Torr.

Claim 15

Dependent Claim 63 words

A method as in claim 10 wherein said step (b) comprises introducing H 2 into a chamber containing the substrate at a flow rate of about 3000 to about 5000 SCCM and introducing WF 6 into the chamber at a flow rate of about 100 to about 300 SCCM, the total pressure within the chamber being from about 10 to about 100 Torr.

Claim 16

Dependent Claim 18 words

A method as in claim 10 wherein the layered tungsten plug includes at least five layers of tungsten.

Claim 17

Independent Claim 102 words

A method of forming a tungsten plug within a contact hole formed in a substrate, the method comprising: depositing a first layer of tungsten by H 2 reduction of WF 6 at a first rate of deposition; depositing a second layer of tungsten by H 2 reduction of WF 6 at a second rate of deposition, the second rate of deposition being slower than the first rate of deposition; and depositing a third layer of tungsten by H 2 reduction of WF 6 at a third rate of deposition, the third rate of deposition being faster than the second rate of deposition.

Claim 18

Independent Claim 102 words

A method of forming a tungsten plug within a contact hole formed in a substrate, the method comprising: depositing a first layer of tungsten by H 2 reduction of WF 6 at a first rate of deposition; depositing a second layer of tungsten by H 2 reduction of WF 6 at a second rate of deposition, the second rate of deposition being slower than the first rate of deposition; and depositing a third layer of tungsten by H 2 reduction of WF 6 at a third rate of deposition, the third rate of deposition being faster than the second rate of deposition.

Claim 19

Dependent Claim 73 words

A method as in claim 14 further comprising depositing a fourth layer of tungsten by H 2 reduction of WF 6 at a fourth rate of deposition, the fourth rate of deposition being slower than the third rate of deposition; and depositing a fifth layer of tungsten by H 2 reduction of WF 6 at a fifth rate of deposition, the fifth rate of deposition being faster than the fourth rate of deposition.

Claim 20

Dependent Claim 73 words

A method as in claim 15 further comprising depositing a sixth layer of tungsten by H 2 reduction of WF 6 at a sixth rate of deposition, the sixth rate of deposition being slower than the fifth rate of deposition; and depositing a seventh layer of tungsten by H 2 reduction of WF 6 at a sixth rate of deposition, the seventh rate of deposition being faster than the sixth rate of deposition.

Claim 21

Dependent Claim 21 words

A method as in claim 16 wherein the first, third, fifth and seventh rates of deposition are greater than 40 Å/sec.

Claim 22

Independent Claim 74 words

A method of forming an electronic device comprising: providing a substrate having a first layer, an insulator layer formed on the first layer and a contact hole formed in the insulator layer and exposing a portion of the first layer; depositing at least five layers of tungsten within the contact hole to at least substantially fill the contact hole, the at least five layers being deposited at alternating fast and slow rates of deposition.

Claim 23

Independent Claim 74 words

A method of forming an electronic device comprising: providing a substrate having a first layer, an insulator layer formed on the first layer and a contact hole formed in the insulator layer and exposing a portion of the first layer; depositing at least five layers of tungsten within the contact hole to at least substantially fill the contact hole, the at least five layers being deposited at alternating fast and slow rates of deposition.

Annuity Stage	Window Opens	Payment Deadline	Surcharge Period Until	Estimated Fee	Status
3.5 Years (Year 4)	1999-02-05	1999-08-07	2000-02-06	$2000.00	Window Closed / Lapsed
7.5 Years (Year 8)	2003-02-05	2003-08-07	2004-02-06	$3760.00	Window Closed / Lapsed
11.5 Years (Year 12)	2007-02-05	2007-08-07	2008-02-06	$7700.00	Window Closed / Lapsed

Multiple layer tungsten deposition process

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