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Atomic layer epitaxy method and apparatus

Assignee: NTT Inc
•
Filing: 1994-08-17
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Granted: 1996-01-16
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Expires: 2014-08-17
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Abstract

Abstract An atomic layer epitaxy method uses an organometal consisting of a metal and an alkyl group and having a self-limiting mechanism. At least one bond between the metal and the alkyl group of the organometal is dissociated, and organometal molecules consisting of the metal and the alkyl group, and a hydride or organometal molecules consisting of a different metal are alternately supplied on a substrate while at least one bond is left, thereby growing an atomic layer on the substrate. An atomic layer epitaxy apparatus is also disclosed.

Inventors

  • 👤 Haruki Yokoyama
  • 👤 Masanori Shinohara

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 02:29
CPC Classifications
C; C30; C30B; C30B25/00; C30B25/02; C30B25/14; C30B29/00; C30B29/10; C30B29/40; C30B29/42

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 166 words
An atomic layer epitaxy method for obtaining a high-purity atomic layer comprising the steps of: energizing at a first energization region an organometal consisting of a metal and an alkyl group and having a self-limiting mechanism; flowing said energized organometal in a pipe provided at said first region so that unbound metal, detached from the organometal in which all bonds between the metal and alkyl group are cut, is removed by deposition to an inner wall of said pipe thereby preventing the unbound metal from reducing the effect of the self-limiting mechanism, at least one bond between the metal and the alkyl group of the organometal is dissociated and only an energized source having at least one bond is remaining; and flowing said energized source to a second region in which a substrate is set, so that said energized source and a hydride or organometal molecules consisting of a different metal are alternatively supplied on a substrate thereby growing the high-purity atomic layer on said substrate.
Claim 2
Dependent Claim 166 words
An atomic layer epitaxy method for obtaining a high-purity atomic layer comprising the steps of: energizing at a first energization region an organometal consisting of a metal and an alkyl group and having a self-limiting mechanism; flowing said energized organometal in a pipe provided at said first region so that unbound metal, detached from the organometal in which all bonds between the metal and alkyl group are cut, is removed by deposition to an inner wall of said pipe thereby preventing the unbound metal from reducing the effect of the self-limiting mechanism, at least one bond between the metal and the alkyl group of the organometal is dissociated and only an energized source having at least one bond is remaining; and flowing said energized source to a second region in which a substrate is set, so that said energized source and a hydride or organometal molecules consisting of a different metal are alternatively supplied on a substrate thereby growing the high-purity atomic layer on said substrate.
Claim 3
Dependent Claim 40 words
A method according to claim 1, wherein the organometal is selected from Column III and II metals, and the hydride or organometal molecules consisting of a different metal contain at least one element selected from Column V and VI elements.
Claim 4
Dependent Claim 48 words
A method according to claim 1, wherein a treatment of dissociating at least one bond between the metal and the alkyl group of the organometal is performed in a hydrogen gas atmosphere, and a subsequent treatment is performed after a hydrogen atom is bonded to the dissociated bond.
Claim 5
Dependent Claim 12 words
A method according to claim 1, wherein the dissociation is thermal dissociation.
Claim 6
Dependent Claim 16 words
A method according to claim 1, wherein the dissociation is treated in an inert gas atmosphere.
Claim 7
Dependent Claim 94 words
An atomic layer epitaxy method wherein an organometal consisting of a metal of Column III-V or Column II-VI and an alkyl group and having a self-limiting mechanism is used, at least one bond between the metal of Column III or II and the alkyl group is thermally dissociated while at least one bond is left, atomic metal is removed and organometal molecules containing the metal of Column III or II, and a hydride or organometal molecules containing a Column V or VI element are alternately supplied on a substrate, thereby growing an atomic layer.
Claim 8
Dependent Claim 94 words
An atomic layer epitaxy method wherein an organometal consisting of a metal of Column III-V or Column II-VI and an alkyl group and having a self-limiting mechanism is used, at least one bond between the metal of Column III or II and the alkyl group is thermally dissociated while at least one bond is left, atomic metal is removed and organometal molecules containing the metal of Column III or II, and a hydride or organometal molecules containing a Column V or VI element are alternately supplied on a substrate, thereby growing an atomic layer.
Claim 9
Dependent Claim 94 words
An atomic layer epitaxy method wherein an organometal consisting of a metal of Column III or Column II and an alkyl group and having a self-limiting mechanism is used, at least one bond between the metal of Column III or II and the alkyl group is thermally dissociated while at least one bond is left, atomic metal is removed and organometal molecules containing the metal of Column III or II, and a hydride or organometal molecules containing a Column V or VI element are alternately supplied on a substrate, thereby growing an atomic layer.
Claim 10
Dependent Claim 94 words
An atomic layer epitaxy method wherein an organometal consisting of a metal of Column III or Column II and an alkyl group and having a self-limiting mechanism is used, at least one bond between the metal of Column III or II and the alkyl group is thermally dissociated while at least one bond is left, atomic metal is removed and organometal molecules containing the metal of Column III or II, and a hydride or organometal molecules containing a Column V or VI element are alternately supplied on a substrate, thereby growing an atomic layer.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-01-15 1999-07-17 2000-01-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-01-15 2003-07-17 2004-01-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-01-15 2007-07-17 2008-01-16 $7700.00 Window Closed / Lapsed

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